"Feature extraction of probe mark image and automatic detection of probing ..."

Jeong-Hoon Lee, Jee-Hyong Lee (2014)

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DOI: 10.1117/12.2181518

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-01

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Jeong-Hoon Lee, Jee-Hyong Lee:
Feature extraction of probe mark image and automatic detection of probing pad defects in semiconductor using CSVM. ICMV 2014: 94450H

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