"Exploring Active Learning for Semiconductor Defect Segmentation."

Lile Cai et al. (2022)

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DOI: 10.1109/ICIP46576.2022.9897842

access: closed

type: Conference or Workshop Paper

metadata version: 2023-07-06

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Lile Cai, Ramanpreet Singh Pahwa, Xun Xu, Jie Wang, Richard Chang, Lining Zhang, Chuan-Sheng Foo:
Exploring Active Learning for Semiconductor Defect Segmentation. ICIP 2022: 1796-1800

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