"An Integrated Hot-Carrier Degradation Simulator for VLSI Reliability Analysis."

Yusuf Leblebici, Sung-Mo Kang (1990)

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DOI: 10.1109/ICCAD.1990.129936

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Yusuf Leblebici, Sung-Mo Kang:
An Integrated Hot-Carrier Degradation Simulator for VLSI Reliability Analysis. ICCAD 1990: 400-403

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