"A Voltage-Mode Testing Method to Detect IDDQ Defects in Digital Circuits."

Josep Rius, Luis Elvira Villagra, Maurice Meijer (2009)

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DOI: 10.1109/ETS.2009.34

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Josep Rius, Luis Elvira Villagra, Maurice Meijer:
A Voltage-Mode Testing Method to Detect IDDQ Defects in Digital Circuits. ETS 2009: 135-140

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