"Assisted test design for non-intrusive machine learning indirect test of ..."

Florent Cilici et al. (2018)

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DOI: 10.1109/ETS.2018.8400689

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-28

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Florent Cilici, Manuel J. Barragán, Salvador Mir, Estelle Lauga-Larroze, Sylvain Bourdel:
Assisted test design for non-intrusive machine learning indirect test of millimeter-wave circuits. ETS 2018: 1-6

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