BibTeX record conf/etfa/Isasi-AndrieuGB17

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@inproceedings{DBLP:conf/etfa/Isasi-AndrieuGB17,
  author       = {Alberto Isasi{-}Andrieu and
                  Est{\'{\i}}baliz Garrote{-}Contreras and
                  Pedro M. Iriondo Bengoa and
                  David Aldama{-}Gant and
                  Adrian Galdran},
  title        = {Deflectometry setup definition for automatic chrome surface inspection},
  booktitle    = {22nd {IEEE} International Conference on Emerging Technologies and
                  Factory Automation, {ETFA} 2017, Limassol, Cyprus, September 12-15,
                  2017},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ETFA.2017.8247756},
  doi          = {10.1109/ETFA.2017.8247756},
  timestamp    = {Thu, 14 Oct 2021 09:51:23 +0200},
  biburl       = {https://dblp.org/rec/conf/etfa/Isasi-AndrieuGB17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}