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"Analyzing the Impact of Fault Tolerant BIST for VLSI Design."

Saurabh Jain, W. Robert Daasch, David Armbrust (2008)

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DOI: 10.1109/DFT.2008.55

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/dft/JainDA08
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  persistent URL:
  - https://dblp.org/rec/conf/dft/JainDA08
Saurabh Jain, W. Robert Daasch, David Armbrust:
Analyzing the Impact of Fault Tolerant BIST for VLSI Design. DFT 2008: 152-160

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