"Optimal Accelerated Test Regions for Time- Dependent Dielectric Breakdown ..."

Kexin Yang et al. (2018)

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DOI: 10.1109/DCIS.2018.8681497

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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Kexin Yang, Rui Zhang, Taizhi Liu, Dae Hyun Kim, Linda Milor:
Optimal Accelerated Test Regions for Time- Dependent Dielectric Breakdown Lifetime Parameters Estimation in FinFET Technology. DCIS 2018: 1-6

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