BibTeX record conf/date/ZhangWHXZX17

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@inproceedings{DBLP:conf/date/ZhangWHXZX17,
  author       = {Meng Zhang and
                  Fei Wu and
                  He Huang and
                  Qian Xia and
                  Jian Zhou and
                  Changsheng Xie},
  editor       = {David Atienza and
                  Giorgio Di Natale},
  title        = {FPGA-based failure mode testing and analysis for {MLC} {NAND} flash
                  memory},
  booktitle    = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
                  {DATE} 2017, Lausanne, Switzerland, March 27-31, 2017},
  pages        = {434--439},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.23919/DATE.2017.7927029},
  doi          = {10.23919/DATE.2017.7927029},
  timestamp    = {Mon, 30 Sep 2024 15:20:52 +0200},
  biburl       = {https://dblp.org/rec/conf/date/ZhangWHXZX17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}