"Leakage power reduction for deeply-scaled FinFET circuits operating in ..."

Ji Li et al. (2015)

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type: Conference or Workshop Paper

metadata version: 2021-08-09

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Ji Li, Qing Xie, Yanzhi Wang, Shahin Nazarian, Massoud Pedram:
Leakage power reduction for deeply-scaled FinFET circuits operating in multiple voltage regimes using fine-grained gate-length biasing technique. DATE 2015: 1579-1582

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