BibTeX record conf/bcicts/RaghunathanYBJL20

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@inproceedings{DBLP:conf/bcicts/RaghunathanYBJL20,
  author       = {Uppili S. Raghunathan and
                  Pui Yee and
                  Dave Brochu and
                  Vibhor Jain and
                  Harrison P. Lee and
                  John D. Cressler and
                  Dimitris P. Ioannou},
  title        = {Physics of Hot Carrier Degradation Under Saturation Mode Operation
                  in SiGe HBTs},
  booktitle    = {{IEEE} BiCMOS and Compound Semiconductor Integrated Circuits and Technology
                  Symposium, {BCICTS} 2020, Monterey, CA, USA, November 16-19, 2020},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/BCICTS48439.2020.9392958},
  doi          = {10.1109/BCICTS48439.2020.9392958},
  timestamp    = {Fri, 16 Apr 2021 11:30:37 +0200},
  biburl       = {https://dblp.org/rec/conf/bcicts/RaghunathanYBJL20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}