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"Improving Test Quality of Scan-Based BIST by Scan Chain Partitioning."
Dong Xiang et al. (2003)
- Dong Xiang, Ming-Jing Chen, Jia-Guang Sun, Hideo Fujiwara:
Improving Test Quality of Scan-Based BIST by Scan Chain Partitioning. Asian Test Symposium 2003: 12-17
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