"Selective Test Response Collection for Low-Power Scan Testing with ..."

Dong Xiang, Zhen Chen (2011)

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DOI: 10.1109/ATS.2011.74

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Dong Xiang, Zhen Chen:
Selective Test Response Collection for Low-Power Scan Testing with Well-Compressed Test Data. Asian Test Symposium 2011: 40-45

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