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"Transient Noise Failures in SRAM Cells: Dynamic Noise Margin Metric."
Elena I. Vatajelu et al. (2011)
- Elena I. Vatajelu, Álvaro Gómez-Pau, Michel Renovell, Joan Figueras:
Transient Noise Failures in SRAM Cells: Dynamic Noise Margin Metric. Asian Test Symposium 2011: 413-418
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