"Automatic Test Generation for Analog Circuits Using Compact Test Transfer ..."

Biranchinath Sahu, Abhijit Chatterjee (2001)

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DOI: 10.1109/ATS.2001.990317

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Biranchinath Sahu, Abhijit Chatterjee:
Automatic Test Generation for Analog Circuits Using Compact Test Transfer Function Models. Asian Test Symposium 2001: 405-410

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