"A Fully Standard-Cell Based On-Chip BTI and HCI Monitor with 6.2x BTI ..."

Mitsuhiko Igarashi et al. (2018)

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DOI: 10.1109/ASSCC.2018.8579303

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Yasumasa Tsukamoto, Koji Shibutani, Koji Nii:
A Fully Standard-Cell Based On-Chip BTI and HCI Monitor with 6.2x BTI sensitivity and 3.6x HCI sensitivity at 7 nm Fin-FET Process. A-SSCC 2018: 195-196

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