BibTeX record conf/asicon/AokiSIOIKSMNWKH19

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@inproceedings{DBLP:conf/asicon/AokiSIOIKSMNWKH19,
  author       = {Riho Aoki and
                  Keno Sato and
                  Takashi Ishida and
                  Toshiyuki Okamoto and
                  Tamotsu Ichikawa and
                  Shogo Katayama and
                  Yuto Sasaki and
                  Kosuke Machida and
                  Takayuki Nakatani and
                  Jianlong Wang and
                  Anna Kuwana and
                  Kazumi Hatayama and
                  Haruo Kobayashi},
  title        = {Evaluation of Null Method for Operational Amplifier Short-Time Testing},
  booktitle    = {13th {IEEE} International Conference on ASIC, {ASICON} 2019, Chongqing,
                  China, October 29 - November 1, 2019},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/ASICON47005.2019.8983452},
  doi          = {10.1109/ASICON47005.2019.8983452},
  timestamp    = {Mon, 21 Mar 2022 15:41:16 +0100},
  biburl       = {https://dblp.org/rec/conf/asicon/AokiSIOIKSMNWKH19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}