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BibTeX record conf/asicon/AokiSIOIKSMNWKH19
@inproceedings{DBLP:conf/asicon/AokiSIOIKSMNWKH19, author = {Riho Aoki and Keno Sato and Takashi Ishida and Toshiyuki Okamoto and Tamotsu Ichikawa and Shogo Katayama and Yuto Sasaki and Kosuke Machida and Takayuki Nakatani and Jianlong Wang and Anna Kuwana and Kazumi Hatayama and Haruo Kobayashi}, title = {Evaluation of Null Method for Operational Amplifier Short-Time Testing}, booktitle = {13th {IEEE} International Conference on ASIC, {ASICON} 2019, Chongqing, China, October 29 - November 1, 2019}, pages = {1--4}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ASICON47005.2019.8983452}, doi = {10.1109/ASICON47005.2019.8983452}, timestamp = {Mon, 21 Mar 2022 15:41:16 +0100}, biburl = {https://dblp.org/rec/conf/asicon/AokiSIOIKSMNWKH19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }

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