"Assessing Distortion Within the IEC Framework in the Presence of High ..."

Adam J. Collin et al. (2018)

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DOI: 10.1109/AMPS.2018.8494869

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type: Conference or Workshop Paper

metadata version: 2021-07-25

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Adam J. Collin, Roberto Langella, Alfredo Testa, Sasa Z. Djokic, Jiri Drapela:
Assessing Distortion Within the IEC Framework in the Presence of High Frequency Components: Some Considerations on Signal Processing. AMPS 2018: 1-6

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