BibTeX record conf/aied/IshiiU15

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@inproceedings{DBLP:conf/aied/IshiiU15,
  author       = {Takatoshi Ishii and
                  Maomi Ueno},
  editor       = {Cristina Conati and
                  Neil T. Heffernan and
                  Antonija Mitrovic and
                  M. Felisa Verdejo},
  title        = {Clique Algorithm to Minimize Item Exposure for Uniform Test Forms
                  Assembly},
  booktitle    = {Artificial Intelligence in Education - 17th International Conference,
                  {AIED} 2015, Madrid, Spain, June 22-26, 2015. Proceedings},
  series       = {Lecture Notes in Computer Science},
  volume       = {9112},
  pages        = {638--641},
  publisher    = {Springer},
  year         = {2015},
  url          = {https://doi.org/10.1007/978-3-319-19773-9\_80},
  doi          = {10.1007/978-3-319-19773-9\_80},
  timestamp    = {Thu, 23 Jun 2022 19:58:27 +0200},
  biburl       = {https://dblp.org/rec/conf/aied/IshiiU15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}