A Methodology for Process Design Kit Re-Centering Using TCAD and Experimental Data for Cryogenic Temperatures. - Dutta, Tapas; Adamu-Lema, Fikru; Bensouiah, Djamel; Asenov, Asen (CoRR, 2025)

Fully Convolutional Generative Machine Learning Method for Accelerating Non-Equilibrium Greens Function Simulations. - Aleksandrov, Preslav; Rezaei, Ali; Xeni, Nikolas; Dutta, Tapas; Asenov, Asen; Georgiev, Vihar P. (CoRR, 2023)

Carbon Nanotube SRAM in 5-nm Technology Node Design, Optimization, and Performance Evaluation - Part I: CNFET Transistor Optimization. - Chen, Rongmei; Chen, Lin; Liang, Jie; Cheng, Yuanqing; Elloumi, Souhir; Lee, Jaehyun; Xu, Kangwei; Georgiev, Vihar P.; Ni, Kai; Debacker, Peter; Asenov, Asen; Todri-Sanial, Aida (IEEE Trans. Very Large Scale Integr. Syst., 2022)

Carbon Nanotube SRAM in 5-nm Technology Node Design, Optimization, and Performance Evaluation - Part II: CNT Interconnect Optimization. - Chen, Rongmei; Chen, Lin; Liang, Jie; Cheng, Yuanqing; Elloumi, Souhir; Lee, Jaehyun; Xu, Kangwei; Georgiev, Vihar P.; Ni, Kai; Debacker, Peter; Asenov, Asen; Todri-Sanial, Aida (IEEE Trans. Very Large Scale Integr. Syst., 2022)

TCAD Simulation of Novel Semiconductor Devices. - Dutta, Tapas; Medina-Bailon, Cristina; Rezaei, Ali; Nagy, Daniel; Adamu-Lema, Fikru; Xeni, Nikolas; Abourrig, Yassine; Kumar, Naveen; Georgiev, Vihar P.; Asenov, Asen (2021)

Advanced Simulation of RRAM Memory Cells. - Sadi, Toufik; Badami, Oves; Georgiev, Vihar P.; Ding, Jie; Asenov, Asen (2019)

Techniques for Statistical Enhancement in a 2D Multi-subband Ensemble Monte Carlo Nanodevice Simulator. - Medina-Bailon, Cristina; Sampedro, Carlos; Padilla, José Luis; Donetti, Luca; Georgiev, Vihar P.; Gámiz, Francisco; Asenov, Asen (2019)

Kinetic Monte Carlo Analysis of the Operation and Reliability of Oxide Based RRAMs. - Sadi, Toufik; Badami, Oves; Georgiev, Vihar P.; Asenov, Asen (2019)

The First International Competition in Machine Reconnaissance Blind Chess. - Gardner, Ryan W.; Lowman, Corey; Richardson, Casey; Llorens, Ashley J.; Markowitz, Jared; Drenkow, Nathan; Newman, Andrew; Clark, Gregory; Perrotta, Gino; Perrotta, Robert; Highley, Timothy; Shcherbina, Vlad; et al. (2019)

Stochastic analysis of surface roughness models in quantum wires. - Nedjalkov, Mihail; Ellinghaus, Paul; Weinbub, Josef; Sadi, Toufik; Asenov, Asen; Dimov, Ivan; Selberherr, Siegfried (Comput. Phys. Commun., 2018)

Progress on carbon nanotube BEOL interconnects. - Uhlig, Benjamin; Liang, Jie; Lee, Jaehyun; Ramos, Raphael; Dhavamani, Abitha; Nagy, Nicole; Dijon, Jean; Okuno, Hanako; Kalita, Dipankar; Georgiev, Vihar P.; Asenov, Asen; Amoroso, Salvatore M.; et al. (2018)

Automatic Segmentation of Lumbar Spine MRI Using Ensemble of 2D Algorithms. - Georgiev, Nedelcho; Asenov, Asen (2018)

Impact of the Trap Attributes on the Gate Leakage Mechanisms in a 2D MS-EMC Nanodevice Simulator. - Medina-Bailon, Cristina; Sadi, Toufik; Sampedro, Carlos; Padilla, José Luis; Donetti, Luca; Georgiev, Vihar P.; Gámiz, Francisco; Asenov, Asen (2018)

Microscopic KMC Modeling of Oxide RRAMs. - Sadi, Toufik; Asenov, Asen (2018)

Software Server for Automatic Generation of Audio Lectures (uListenSrv). - Petrov, Milen; Asenov, Asen; Aleksieva-Petrova, Adelina (Int. J. Adv. Corp. Learn., 2017)

TCAD based Design-Technology Co-Optimisations in advanced technology nodes. - Asenov, Asen; Sayed, Karim El; Borges, Ricardo; Asenov, Plamen; Millar, Campbell; Ma, Terry (2017)

Editorial. - Asenov, Asen; Schlichtmann, Ulf; Tan, Cher Ming; Wong, Hei; Zhou, Xing (Microelectron. Reliab., 2016)

Multivariate Modeling of Variability Supporting Non-Gaussian and Correlated Parameters. - Lange, André; Sohrmann, Christoph; Jancke, Roland; Haase, Joachim; Cheng, Binjie; Asenov, Asen; Schlichtmann, Ulf (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016)

Nanowire transistor solutions for 5nm and beyond. - Asenov, A.; Wang, Yangang; Cheng, Binjie; Wang, Xingsheng; Asenov, Plamen; Al-Ameri, Talib; Georgiev, Vihar P. (2016)

Multi-scale electrothermal simulation and modelling of resistive random access memory devices. - Sadi, Toufik; Wang, Liping; Asenov, Asen (2016)

Mastering CMOS variability is the key to success. - Asenov, Asen (IET Comput. Digit. Tech., 2015)

Comparison of Si < 100 > and < 110 > crystal orientation nanowire transistor reliability using Poisson-Schrödinger and classical simulations. - Gerrer, Louis; Georgiev, Vihar P.; Amoroso, Salvatore M.; Towie, Ewan; Asenov, A. (Microelectron. Reliab., 2015)

Experimental evidences and simulations of trap generation along a percolation path. - Gerrer, Louis; Hussin, Razaidi; Amoroso, Salvatore M.; Franco, Jacopo; Weckx, Pieter; Simicic, Marko; Horiguchi, N.; Kaczer, Ben; Grasser, Tibor; Asenov, Asen (2015)

Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow. - Hussin, Razaidi; Gerrer, Louis; Ding, Jie; Wang, Liping; Amoroso, Salvatore M.; Cheng, Binjie; Reid, Dave; Weckx, Pieter; Simicic, Marko; Franco, Jacopo; Vanderheyden, Annelies; Vanhaeren, Danielle; et al. (2015)

Unified approach for simulation of statistical reliability in nanoscale CMOS transistors from devices to circuits. - Asenov, A.; Ding, Jie; Reid, Dave; Asenov, Plamen; Amoroso, Salvatore M.; Adamu-Lema, Fikru; Gerrer, Louis (2015)

Circuit design perspectives for Ge FinFET at 10nm and beyond. - Sinha, Saurabh; Shifren, Lucian; Chandra, Vikas; Cline, Brian; Yeric, Greg; Aitken, Robert C.; Cheng, Bingjie; Brown, Andrew R.; Riddet, Craig; Alexandar, C.; Millar, Campbell; Asenov, Asen (2015)

Modelling RTN and BTI in nanoscale MOSFETs from device to circuit: A review. - Gerrer, Louis; Ding, Jie; Amoroso, Salvatore M.; Adamu-Lema, Fikru; Hussin, Razaidi; Reid, Dave; Millar, Campbell; Asenov, A. (Microelectron. Reliab., 2014)

Special section reliability and variability of devices for circuits and systems. - Asenov, Asen; Schlichtmann, Ulf; Tan, Cher Ming; Wong, Hei; Zhou, Xing (Microelectron. Reliab., 2014)

RTN distribution comparison for bulk, FDSOI and FinFETs devices. - Gerrer, Louis; Amoroso, Salvatore M.; Hussin, Razaidi; Asenov, Asen (Microelectron. Reliab., 2014)

Accurate simulations of the interplay between process and statistical variability for nanoscale FinFET-based SRAM cell stability. - Wang, Xingsheng; Cheng, Binjie; Brown, Andrew R.; Millar, Campbell; Asenov, Asen (2014)

FDSOI molecular flash cell with reduced variability for low power flash applications. - Georgiev, Vihar P.; Amoroso, Salvatore M.; Vila-Nadal, Laia; Busche, Cristoph; Cronin, Leroy; Asenov, Asen (2014)

Factoring variability in the Design/Technology Co Optimisation (DTCO) in advanced CMOS. - Asenov, Asen (2014)

Multi-scale Computational Framework for Evaluating of the Performance of Molecular Based Flash Cells. - Georgiev, Vihar P.; Asenov, Asen (2014)

Statistical Variability and Reliability and the Impact on Corresponding 6T-SRAM Cell Design for a 14-nm Node SOI FinFET Technology. - Wang, Xingsheng; Cheng, Binjie; Kuang, Jente B.; Brown, Andrew R.; Millar, Campbell; Asenov, Asen (IEEE Des. Test, 2013)

Impact of statistical parameter set selection on the statistical compact model accuracy: BSIM4 and PSP case study. - Moezi, Negin; Dideban, Daryoosh; Cheng, Binjie; Roy, Scott; Asenov, Asen (Microelectron. J., 2013)

Analytical Models for Three-Dimensional Ion Implantation Profiles in FinFETs. - Wang, Liping; Brown, Andrew R.; Cheng, Binjie; Asenov, Asen (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013)

Predicting future technology performance. - Asenov, Asen; Alexander, Craig; Riddet, Craig; Towie, Ewan (2013)

Investigation of SRAM using BTI-aware statistical compact models. - Ding, Jie; Reid, Dave; Millar, Campbell; Asenov, Asen (2013)

Multi-scale computational framework for the evaluation of variability in the programing window of a flash cell with molecular storage. - Georgiev, Vihar P.; Markov, Stanislav; Vila-Nadal, Laia; Busche, Cristoph; Cronin, Leroy; Asenov, Asen (2013)

Impact of statistical variability and charge trapping on 14 nm SOI FinFET SRAM cell stability. - Wang, Xingsheng; Cheng, Binjie; Brown, Andrew R.; Millar, Campbell; Kuang, Jente B.; Nassif, Sani R.; Asenov, Asen (2013)

Evaluating the accuracy of SRAM margin simulation through large scale Monte-Carlo simulations with accurate compact models. - Asenov, Plamen; New, David; Reid, Dave; Millar, Campbell; Roy, Scott; Asenov, Asen (2013)

SRAM device and cell co-design considerations in a 14nm SOI FinFET technology. - Cheng, Binjie; Wang, Xingsheng; Brown, Andrew R.; Kuang, Jente B.; Reid, Dave; Millar, Campbell; Nassif, Sani R.; Asenov, Asen (2013)

Accurate capturing of the statistical aspect of NBTI/PBTI variability into statistical compact models. - Bukhori, Muhammad Faiz; Kamsani, Noor Ain; Asenov, Asen; Nayan, Nazrul Anuar (Microelectron. J., 2012)

ICMAT 2011 - Reliability and variability of semiconductor devices and ICs. - Asenov, Asen; Schlichtmann, Ulf; Tan, Cher Ming; Wong, Hei; Zhou, Xing (Microelectron. Reliab., 2012)

Impact of random dopant fluctuations on trap-assisted tunnelling in nanoscale MOSFETs. - Gerrer, Louis; Markov, Stanislav; Amoroso, Salvatore M.; Adamu-Lema, Fikru; Asenov, Asen (Microelectron. Reliab., 2012)

Comprehensive statistical comparison of RTN and BTI in deeply scaled MOSFETs by means of 3D 'atomistic' simulation. - Amoroso, Salvatore M.; Gerrer, Louis; Markov, Stanislav; Adamu-Lema, Fikru; Asenov, Asen (2012)

Statistical variability in 14-nm node SOI FinFETs and its impact on corresponding 6T-SRAM cell design. - Wang, Xingsheng; Cheng, Binjie; Brown, Andrew R.; Millar, Campbell; Asenov, Asen (2012)

An advanced statistical compact model strategy for SRAM simulation at reduced VDD. - Asenov, Plamen; Reid, Dave; Roy, Scott; Millar, Campbell; Asenov, Asen (2012)

Analysis of FinFET technology on memories. - Amat, Esteve; Asenov, A.; Canal, Ramon; Cheng, Binjie; Cruz, J.-Ll.; Jaksic, Zoran; Miranda, Miguel; Rubio, Antonio; Zuber, Paul (2012)

A framework to study time-dependent variability in circuits at sub-35nm technology nodes. - Tang, Tong Boon; Murray, Alan F.; Cheng, Binjie; Asenov, Asen (2012)

The evolution of standard cell libraries for future technology nodes. - Walker, James Alfred; Hilder, James A.; Reid, Dave; Asenov, Asen; Roy, Scott; Millar, Campbell; Tyrrell, Andy M. (Genet. Program. Evolvable Mach., 2011)

Implementation of the Density Gradient Quantum Corrections for 3-D Simulations of Multigate Nanoscaled Transistors. - García-Loureiro, Antonio J.; Seoane, Natalia; Aldegunde, Manuel; Ferreiro, Raúl Valín; Asenov, Asen; Martinez, Antonio; Kalna, Karol (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011)

Statistical aspects of NBTI/PBTI and impact on SRAM yield. - Asenov, Asen; Brown, Andrew R.; Cheng, Binjie (2011)

Modelling circuit performance variations due to statistical variability: Monte Carlo static timing analysis. - Merrett, Michael; Asenov, Plamen; Wang, Yangang; Zwolinski, Mark; Reid, Dave; Millar, Campbell; Roy, Scott; Liu, Zhenyu; Furber, Stephen B.; Asenov, Asen (2011)

New reliability mechanisms in memory design for sub-22nm technologies. - Aymerich, Nivard; Asenov, A.; Brown, Andrew R.; Canal, Ramon; Cheng, Binjie; Figueras, Joan; González, Antonio; Herrero, Enric; Markov, S.; Miranda, Miguel; Pouyan, Peyman; Ramírez, Tanausú; et al. (2011)

TRAMS Project: Variability and Reliability of SRAM Memories in sub-22 nm Bulk-CMOS Technologies. - Canal, Ramon; Rubio, Antonio; Asenov, A.; Brown, A.; Miranda, Miguel; Zuber, Paul; González, Antonio; Vera, Xavier (2011)

Statistical-Variability Compact-Modeling Strategies for BSIM4 and PSP. - Cheng, Binjie; Dideban, Daryoosh; Moezi, Negin; Millar, Campbell; Roy, Gareth; Wang, Xingsheng; Roy, Scott; Asenov, Asen (IEEE Des. Test Comput., 2010)

Impact of interface state trap density on the performance characteristics of different III-V MOSFET architectures. - Benbakhti, Brahim; Ayubi-Moak, J. S.; Kalna, Karol; Lin, D.; Hellings, Geert; Brammertz, Guy; Meyer, Kristin De; Thayne, Iain; Asenov, Asen (Microelectron. Reliab., 2010)

Modeling and simulation of transistor and circuit variability and reliability. - Asenov, Asen; Cheng, Binjie; Dideban, Daryoosh; Kovac, Urban; Moezi, Negin; Millar, Campbell; Roy, Gareth; Brown, Andrew R.; Roy, Scott (2010)

Capturing intrinsic parameter fluctuations using the PSP compact model. - Cheng, Binjie; Dideban, Daryoosh; Moezi, Negin; Millar, Campbell; Roy, Gareth; Wang, Xingsheng; Roy, Scott; Asenov, Asen (2010)

Statistical NBTI-effect prediction for ULSI circuits. - Tang, Tong Boon; Murray, Alan F.; Cheng, Binjie; Asenov, Asen (2010)

Advanced Monte Carlo Techniques in the Simulation of CMOS Devices and Circuits. - Asenov, Asen (2010)

Impact of Random Dopant Induced Statistical Variability on Inverter Switching Trajectories and Timing Variability. - Kamsani, Noor Ain; Cheng, Binjie; Roy, Scott; Asenov, Asen (2009)

Enabling Cutting-Edge Semiconductor Simulation through Grid Technology. - Asenov, Asen; Reid, Dave; Millar, Campbell; Roy, Scott; Roy, Gareth; Sinnott, Richard O.; Stewart, Gordon; Stewart, Graeme Robert (2009)

Statistical aspects of reliability in bulk MOSFETs with multiple defect states and random discrete dopants. - Bukhori, Muhammad Faiz; Roy, Scott; Asenov, Asen (Microelectron. Reliab., 2008)

Statistical simulation of random dopant induced threshold voltage fluctuations for 35 nm channel length MOSFET. - Kovac, Urban; Reid, Dave; Millar, Campbell; Roy, Gareth; Roy, Scott; Asenov, Asen (Microelectron. Reliab., 2008)

Secure, Performance-Oriented Data Management for nanoCMOS Electronics. - Sinnott, Richard O.; Bayliss, Christopher; Davenhall, C.; Harbulot, Bruno; Jones, Mike; Millar, Campbell; Roy, Gareth; Roy, Scott; Stewart, Gordon; Watt, John P.; Asenov, Asen (2008)

Integrating Security Solutions to Support nanoCMOS Electronics Research. - Sinnott, Richard O.; Bayliss, Christopher; Doherty, Thomas; Martin, David B.; Millar, Campbell; Stewart, Gordon; Watt, John P.; Asenov, Asen; Roy, Gareth; Roy, Scott; Davenhall, C.; Harbulot, Bruno; et al. (2008)

Supercomputing at Work in the nanoCMOS Electronics Domain. - Sinnott, Richard O.; Millar, Campbell; Asenov, Asen (ERCIM News, 2008)

Towards a Grid-Enabled Simulation Framework for Nano-CMOS Electronics. - Han, Liangxiu; Asenov, Asen; Berry, Dave; Millar, Campbell; Roy, Gareth; Roy, Scott; Sinnott, Richard O.; Stewart, Gordon (2007)

The scalability of 8T-SRAM cells under the influence of intrinsic parameter fluctuations. - Cheng, Binjie; Roy, Scott; Asenov, A. (2007)

Statistical Device Variability and its Impact on Yield and Performance. - Asenov, Asen (2007)

A High-Performance Parallel Device Simulator for High Electron Mobility Transistors. - Seoane, Natalia; García-Loureiro, Antonio J.; Kalna, Karol; Asenov, Asen (2005)

Impact of device geometry and doping strategy on linearity and RF performance in Si/SiGe MODFETs. - Yang, L.; Asenov, Asen; Watling, Jeremy R.; Boriçi, M.; Barker, John R.; Roy, Scott; Elgaid, K.; Thayne, Iain; Hackbarth, T. (Microelectron. Reliab., 2004)

The impact of random doping effects on CMOS SRAM cell. - Cheng, Binjie; Roy, Scott; Asenov, Asen (2004)

Nonequilibrium and ballistic transport, and backscattering in decanano HEMTs: a Monte Carlo simulation study. - Kalna, Karol; Asenov, Asen (Math. Comput. Simul., 2003)

IWCE-7 Committees. - Barker, John R.; Asenov, Asen (VLSI Design, 2001)

Quantum Corrections to the 'Atomistic' MOSFET Simulations. - Asenov, Asen; Slavcheva, Gabriela; Kaya, Savas; Balasubramaniam, R. (VLSI Design, 2001)

Non-Equilibrium Hole Transport in Deep Sub-Micron Well-Tempered Si p-MOSFETs. - Watling, Jeremy R.; Zhao, Yan P.; Asenov, Asen; Barker, John R. (VLSI Design, 2001)

Scaling of pHEMTs to Decanano Dimensions. - Kalna, Karol; Asenov, Asen; Elgaid, K.; Thayne, Iain (VLSI Design, 2001)

Soft Sphere Model for Electron Correlation and Scattering in the Atomistic Modelling of Semiconductor Devices. - Watling, Jeremy R.; Barker, John R.; Asenov, Asen (VLSI Design, 2001)

Hierarchical approach to "atomistic" 3-D MOSFET simulation. - Asenov, Asen; Brown, Andrew R.; Davies, John H.; Saini, Subhash (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1999)

Topologically Rectangular Grids in the Parallel Simulation of Semiconductor Devices. - Asenov, Asen; Brown, Andrew R.; Roy, Scott; Barker, John R. (VLSI Design, 1998)

Quadrilateral Finite Element Monte Carlo Simulation of Complex Shape Compound FETs. - Babiker, S.; Asenov, Asen; Barker, John R.; Beaumont, S. P. (VLSI Design, 1998)

A New Approach based on Brownian Motion for the Simulation of Ultra-Small Semiconductor Devices. - Arokianathan, Clinton R.; Asenov, Asen; Davies, John H. (VLSI Design, 1998)

3D Parallel Finite Element Simulation of In-Cell Breakdown in Lateral-Channel IGBTs. - Brown, Andrew R.; Asenov, Asen; Barker, John R. (VLSI Design, 1998)

Complete RF Analysis of Compound FETs Based on Transient Monte Carlo Simulation. - Babiker, S.; Asenov, Asen; Cameron, Norman; Beaumont, S. P.; Barker, John R. (VLSI Design, 1998)

Monte Carlo Calibrated Drift-Diffusion Simulation of Short Channel HFETs. - Asenov, Asen; Babiker, S.; Beaumont, S. P.; Barker, John R. (VLSI Design, 1998)

RF Performance of Si/SiGe MODFETs: A Simulation Study. - Roy, Sumit; Asenov, Asen; Babiker, S.; Barker, John R.; Beaumont, S. P. (VLSI Design, 1998)

Ab-initio Coulomb Scattering in Atomistic Device Simulation. - Arokianathan, Clinton R.; Davies, John H.; Asenov, Asen (VLSI Design, 1998)

Scalable parallel 3D finite element nonlinear Poisson solver. - Asenov, Asen; Barker, John R.; Brown, Andrew R.; Lee, G. L. (Simul. Pract. Theory, 1996)

Optimum partitioning of topologically rectangular grids. - Roy, Scott; Asenov, Asen; Barker, John R. (1996)

Speed-Up of Scalable Iterative Linear Solvers Implemented on an Array of Transputers. - Asenov, Asen; Reid, Dave; Barker, John R. (Parallel Comput., 1995)

A Virtual IC Factory in an Undergraduate Semiconductor Device Fabrication Laboratory. - Asenov, A.; Stanley, C. R. (1995)

Speed-Up of Scalable Iterative Linear Solvers Implemented on an Array of Transputers. - Asenov, Asen; Reid, Dave; Barker, John R. (Parallel Comput., 1994)

Scalable Parallel 3D Finite Element Nonlinear Poisson Solver. - Asenov, Asen; Barker, John R.; Brown, Andrew R.; Lee, G. L. (1994)

Parallel Simulation of Semiconductor Devices. - Barker, John R.; Asenov, Asen; Brown, Andrew R.; Cluckie, J.; Babiker, S.; Arokianathan, Clinton R. (1994)