BibTeX records: S. Crémer

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@inproceedings{DBLP:conf/irps/DivayDCGDGAHRFKCRFCC24,
  author       = {A. Divay and
                  C{\'{e}}dric Dehos and
                  Ismael Charlet and
                  Fred Gaillard and
                  B. Duriez and
                  Xavier Garros and
                  J. Antonijevic and
                  Joycelyn Hai and
                  Nathalie Revil and
                  Jeremie Forest and
                  Vincent Knopik and
                  Florian Cacho and
                  David Roy and
                  X. Federspiel and
                  S. Cr{\'{e}}mer and
                  Pascal Chevalier},
  title        = {A Methodology to Address {RF} Aging of 40nm {CMOS} {PA} Cells Under
                  5G mmW Modulation Profiles},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2024, Grapevine,
                  TX, USA, April 14-18, 2024},
  pages        = {4},
  publisher    = {{IEEE}},
  year         = {2024},
  url          = {https://doi.org/10.1109/IRPS48228.2024.10529462},
  doi          = {10.1109/IRPS48228.2024.10529462},
  timestamp    = {Wed, 29 May 2024 21:52:31 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/DivayDCGDGAHRFKCRFCC24.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/essderc/CremerPGMHAMALDGGDVBSGJHRSDGBPC23,
  author       = {S. Cr{\'{e}}mer and
                  N. Pelloux and
                  F. Gianesello and
                  Y. Mourier and
                  G. Haury and
                  Tulio Chaves de Albuquerque and
                  Frederic Monsieur and
                  H. Audouin and
                  C. A. Legrand and
                  C. Diouf and
                  J. Azevedo Goncalves and
                  C. Belem Goncalves and
                  C. Durand and
                  N. Vulliet and
                  L. Berthier and
                  Emeline Souchier and
                  P. Garcia and
                  S. Jan and
                  M. Hello and
                  M. L. Rellier and
                  Patrick Scheer and
                  B. Duriez and
                  Xavier Garros and
                  T. Bordignon and
                  F. Paillardet and
                  Pascal Chevalier},
  title        = {40-nm {RFSOI} technology exhibiting 90fs {RON} {\texttimes} {COFF}
                  and fT/fMAX of 250 GHz/350 GHz targeting sub-6 GHz and mmW 5G applications},
  booktitle    = {53rd {IEEE} European Solid-State Device Research Conference, {ESSDERC}
                  2023, Lisbon, Portugal, September 11-14, 2023},
  pages        = {101--104},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/ESSDERC59256.2023.10268566},
  doi          = {10.1109/ESSDERC59256.2023.10268566},
  timestamp    = {Mon, 09 Oct 2023 15:43:28 +0200},
  biburl       = {https://dblp.org/rec/conf/essderc/CremerPGMHAMALDGGDVBSGJHRSDGBPC23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/BessetBBCV03,
  author       = {C. Besset and
                  S. Bruy{\`{e}}re and
                  S. Blonkowski and
                  S. Cr{\'{e}}mer and
                  E. Vincent},
  title        = {{MIM} capacitance variation under electrical stress},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {8},
  pages        = {1237--1240},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(03)00177-X},
  doi          = {10.1016/S0026-2714(03)00177-X},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BessetBBCV03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}