A Methodology to Address RF Aging of 40nm CMOS PA Cells Under 5G mmW Modulation Profiles - A. Divay; Cédric Dehos; Ismael Charlet; Fred Gaillard; B. Duriez; Xavier Garros; J. Antonijevic; Joycelyn Hai; Nathalie Revil; Jeremie Forest; Vincent Knopik; Florian Cacho; et al. (IEEE International Reliability Physics Symposium, IRPS 2024, Grapevine, TX, USA, April 14-18, 2024, 2024)

40-nm RFSOI technology exhibiting 90fs RON exttimes COFF and fT/fMAX of 250 GHz/350 GHz targeting sub-6 GHz and mmW 5G applications - S. Crémer; N. Pelloux; F. Gianesello; Y. Mourier; G. Haury; Tulio Chaves de Albuquerque; Frederic Monsieur; H. Audouin; C. A. Legrand; C. Diouf; J. Azevedo Goncalves; C. Belem Goncalves; et al. (53rd IEEE European Solid-State Device Research Conference, ESSDERC 2023, Lisbon, Portugal, September 11-14, 2023, 2023)

MIM capacitance variation under electrical stress - C. Besset; S. Bruyère; S. Blonkowski; S. Crémer; E. Vincent (Microelectron. Reliab., 2003)