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Sammy Kayali

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2000 – 2009

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2005
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Yuan Chen, Qing Wang, Sammy Kayali:
A statistical approach to characterizing the reliability of systems utilizing HBT devices. Microelectron. Reliab. 45(12): 1869-1874 (2005)
2000
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Sammy Kayali:
Reliability Considerations for Advanced Microelectronics. PRDC 2000: 99-102

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