SPICE-Level Demonstration of Unsupervised Learning With Spintronic Synapses in Spiking Neural Networks. - Daddinounou, Salah; Gebregiorgis, Anteneh; Hamdioui, Said; Vatajelu, Elena-Ioana (IEEE Access, 2025)

Towards Accurate RISC-V Full System Simulation via Component-Level Calibration. - Pathak, Karan; Klein, Joshua Alexander Harrison; Ansaloni, Giovanni; Hamdioui, Said; Gaydadjiev, Georgi; Zapater, Marina; Atienza, David (ACM Trans. Embed. Comput. Syst., 2025)

BCIM: Efficient Implementation of Binary Neural Network Based on Computation in Memory. - Zahedi, Mahdi; Shahroodi, Taha; Escuin, Carlos; Gaydadjiev, Georgi; Wong, Stephan; Hamdioui, Said (IEEE Trans. Emerg. Top. Comput., 2025)

Device-Aware Test for Anomalous Charge Trapping in FeFETs. - Yuan, Sicong; Wang, Changhao; Fieback, Moritz; Xun, Hanzhi; Taouil, Mottaqiallah; Li, Xiuyan; Chen, Danyang; Wang, Lin; Bellarmino, Nicolò; Cantoro, Riccardo; Hamdioui, Said (2025)

Multi-Partner Project: Securing Future Edge-AI Processors in Practice (CONVOLVE). - Argo, Sven; Corporaal, Henk; Garza, Alejandro; Geilen, Marc; Gomony, Manil Dev; Güneysu, Tim; Marotzke, Adrian; Mir, Fouwad Jamil; Richter-Brockmann, Jan; Smith, Jeffrey; Taouil, Mottaqiallah; Hamdioui, Said (2025)

Multi-Partner Project: A Deep Learning Platform Targeting Embedded Hardware for Edge-AI Applications (NEUROKIT2E). - Bishnoi, Rajendra; Yaldagard, Mohammad Amin; Hamdioui, Said; Vadivel, Kanishkan; Sifalakis, Manolis; Rodriguez, Nicolas Daniel; Julián, Pedro; Ratschbacher, Lothar; Mallah, Maen; Patil, Yogesh Ramesh; Ali, Rashid; Chersi, Fabian (2025)

C3CIM: Constant Column Current Memristor-Based Computation-in-Memory Micro-Architecture. - Biyani, Yashvardhan; Bishnoi, Rajendra; Spyrou, Theofilos; Hamdioui, Said (2025)

Adaptive Multi-Threshold Encoding for Energy-Efficient ECG Classification Architecture Using Spiking Neural Network. - Diware, Sumit; Dong, Yingzhou; Yaldagard, Mohammad Amin; Hamdioui, Said; Bishnoi, Rajendra (2025)

European Test Symposium Teams: an Anniversary Snapshot. - Jenihhin, Maksim; Raik, Jaan; Jutman, Artur; Cherezova, Natalia; Ubar, Raimund; Miclea, Liviu; Enyedi, Szilárd; Stefan, I.; Stan, Ovidiu; Corches, Cosmina; Peng, Z.; Eles, Petru; et al. (2025)

Modeling and Analysis of Aging Impact on SRAM PUFs for Advanced FinFET Technology Nodes. - Masoumian, Shayesteh; Maes, Roel; Beringuier-Boher, Noemie; Yerriswamy, Karthik Keni; Schrijen, Geert Jan; Hamdioui, Said; Taouil, Mottaqiallah (2025)

Dependable Neuromorphic Computing-in-Memory Architectures. - Merchant, Farhad; Bende, Ankit; Fritscher, Markus; Kvatinsky, Shahar; Singh, Simranjeet; Rana, Vikas; Dittmann, Regina; Reddy, Keerthi Dorai Swamy; Wenger, Christian; Mir, Fouwad Jamil; Taouil, Mottaqiallah; Gomony, Manil Dev; et al. (2025)

Structural Testing of a RRAM-based AI Accelerator Core. - Serlis, Emmanouil Anastasios; Xun, Hanzhi; Taouil, Mottaqiallah; Hamdioui, Said; Fieback, Moritz (2025)

On the Trustworthiness of Spiking Neural Networks and Neuromorphic Systems. - Spyrou, Theofilos; Stratigopoulos, Haralampos-G.; Alouani, Ihsen; Hamdioui, Said; Gebregiorgis, Anteneh (2025)

In-Field Monitoring and Preventing Read Disturb Faults in RRAMs. - Xun, Hanzhi; Fieback, Moritz; Yuan, Sicong; Wang, Changhao; Hua, Erbing; Aziza, Hassen; Poehls, Leticia Bolzani; Cantoro, Riccardo; Bishnoi, Rajendra; Taouil, Mottaqiallah; Hamdioui, Said (2025)

A Convoluted Journey from CMOS to Spin Waves. - Anagnostou, Pantazis; Zegbroeck, Arne Van; Hamdioui, Said; Adelmann, Christoph; Ciubotaru, Florin; Cotofana, Sorin (2025)

Multi-Partner Project: Securing Future Edge-AI Processors in Practice (CONVOLVE). - Argo, Sven; Corporaal, Henk; Garza, Alejandro; Geilen, Marc; Gomony, Manil Dev; Güneysu, Tim; Marotzke, Adrian; Mir, Fouwad Jamil; Larmann, Christian; Richter-Brockmann, Jan; Smith, Jeffrey; Taouil, Mottaqiallah; et al. (IACR Cryptol. ePrint Arch., 2025)

Reliable and Energy-Efficient Diabetic Retinopathy Screening Using Memristor-Based Neural Networks. - Diware, Sumit; Chilakala, Koteswararao; Joshi, Rajiv V.; Hamdioui, Said; Bishnoi, Rajendra (IEEE Access, 2024)

The Security Evaluation of an Efficient Lightweight AES Accelerator. - Aljuffri, Abdullah; Huang, Ruoyu; Muntenaar, Laura; Gaydadjiev, Georgi; Ma, Kezheng; Hamdioui, Said; Taouil, Mottaqiallah (Cryptogr., 2024)

Survey on Architectural Attacks: A Unified Classification and Attack Model. - Ghasempouri, Tara; Raik, Jaan; Reinbrecht, Cezar; Hamdioui, Said; Taouil, Mottaqiallah (ACM Comput. Surv., 2024)

A DfT Strategy for Guaranteeing ReRAM's Quality after Manufacturing. - Copetti, Thiago Santos; Fieback, Moritz; Gemmeke, Tobias; Hamdioui, Said; Poehls, Letícia Maria Veiras Bolzani (J. Electron. Test., 2024)

Two Cascaded Spin Wave Majority Gates Operation Under Continuous and Pulse Modes. - Mahmoud, Abdulqader Nael; Ciubotaru, Florin; Vanderveken, Frederic; Adelmann, Christoph; Cotofana, Sorin; Hamdioui, Said (IEEE Trans. Circuits Syst. II Express Briefs, 2024)

Dynamic Detection and Mitigation of Read-disturb for Accurate Memristor-based Neural Networks. - Diware, Sumit; Yaldagard, Mohammad Amin; Gebregiorgis, Anteneh; Joshi, Rajiv V.; Hamdioui, Said; Bishnoi, Rajendra (2024)

A Lightweight Architecture for Real-Time Neuronal-Spike Classification. - Siddiqi, Muhammad Ali; Vrijenhoek, David; Landsmeer, Lennart P. L.; Kleij, Job van der; Gebregiorgis, Anteneh; Romano, Vincenzo; Bishnoi, Rajendra; Hamdioui, Said; Strydis, Christos (2024)

Energy-efficient SNN Architecture using 3nm FinFET Multiport SRAM-based CIM with Online Learning. - Huijbregts, Lucas; Liu, Hsiao-Hsuan; Detterer, Paul; Hamdioui, Said; Yousefzadeh, Amirreza; Bishnoi, Rajendra (2024)

Invited: Achieving PetaOps/W Edge-AI Processing. - Gomony, Manil Dev; Ahn, Bas; Luiken, Rick; Biyani, Yashvardhan; Gebregiorgis, Anteneh; Laborieux, Axel; Zenke, Friedemann; Hamdioui, Said; Corporaal, Henk (2024)

High-Performance Data Mapping for BNNs on PCM-Based Integrated Photonics. - Shahroodi, Taha; Cardoso, Raphael; Wong, Stephan; Bosio, Alberto; O'Connor, Ian; Hamdioui, Said (2024)

Device-Aware Diagnosis for Yield Learning in RRAMs. - Xun, Hanzhi; Fieback, Moritz; Yuan, Sicong; Aziza, Hassen; Taouil, Mottaqiallah; Hamdioui, Said (2024)

Multi-level forming-free HfO2-based ReRAM for energy-efficient computing. - Hua, Erbing; Abunahla, Heba; Gaydadjiev, Georgi; Hamdioui, Said; Ishihara, Ryoichi (2024)

Fault Tolerant Design for Memristor-based AI Accelerators. - Spyrou, Theofilos; Zografou, Artemis; Hamdioui, Said; Gebregiorgis, Anteneh (2024)

Counteracting Rowhammer by Data Alternation. - Lung, Stefan A.; Gaydadjiev, Georgi; Hamdioui, Said; Taouil, Mottaqiallah (2024)

Extracting Weights of CIM-Based Neural Networks Through Power Analysis of Adder-Trees. - Mir, Fouwad Jamil; Aljuffri, Abdullah; Hamdioui, Said; Taouil, Mottaqiallah (2024)

Online Detection of Unique Faults in RRAMs. - Xun, Hanzhi; Fieback, Moritz; Yaldagard, Mohammad Amin; Yuan, Sicong; Aziza, Hassen; Taouil, Mottaqiallah; Hamdioui, Said (2024)

Design-for-Test for Intermittent Faults in STT-MRAMs. - Yuan, Sicong; Yaldagard, Mohammad Amin; Xun, Hanzhi; Fieback, Moritz; Marinissen, Erik Jan; Kim, Woojin; Rao, Siddharth; Couet, Sebastien; Taouil, Mottaqiallah; Hamdioui, Said (2024)

Real-Time Supervised Spiking Neural Network for Cerebellar Purkinje Cells Spike Detection and Classification. - Raisiardali, Alireza; Siddiqi, Muhammad Ali; Strydis, Christos; Hamdioui, Said; Muratore, Dante Gabriel; Bishnoi, Rajendra (2024)

Defects, Fault Modeling, and Test Development Framework for FeFETs. - Wang, Changhao; Yuan, Sicong; Xun, Hanzhi; Li, Chaobo; Taouil, Mottaqiallah; Fieback, Moritz; Chen, Danyang; Li, Xiuyan; Wang, Lin; Cantoro, Riccardo; Yin, Chujun; Hamdioui, Said (2024)

Testing STT-MRAMs: Do We Need Magnets in our Automated Test Equipment? - Yuan, Sicong; Xun, Hanzhi; Kim, Woojin; Rao, Siddharth; Marinissen, Erik Jan; Couet, Sebastien; Fieback, Moritz; Taouil, Mottaqiallah; Hamdioui, Said (2024)

Robust Design-for-Testability Scheme for Conventional and Unique Defects in RRAMs. - Xun, Hanzhi; Fieback, Moritz; Yaldagard, Mohammad Amin; Yuan, Sicong; Hua, Erbing; Aziza, Hassen; Taouil, Mottaqiallah; Hamdioui, Said (2024)

Analysis of Conductance Variability in RRAM for Accurate Neuromorphic Computing. - Aziza, Hassen; Postel-Pellerin, Jérémy; Fieback, Moritz; Hamdioui, Said; Xun, Hanzhi; Taouil, Mottaqiallah; Coulié, Karine; Rahajandraibe, Wenceslas (2024)

Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs. - Copetti, Thiago; Chordia, A.; Fieback, Moritz; Taouil, Mottaqiallah; Hamdioui, Said; Bolzani, Letícia Maria Veiras (2024)

AFSRAM-CIM: Adder Free SRAM-Based Digital Computation-in-Memory for BNN. - Arrassi, Asmae El; Yaldagard, Mohammad Amin; Tao, Xingjian; Shahroodi, Taha; Mir, Fouwad Jamil; Biyani, Yashvardhan; Gomony, Manil Dev; Gebregiorgis, Anteneh; Joshi, Rajiv V.; Hamdioui, Said (2024)

Multi-Level FeFET-Based CAM Address Decoder. - Makryniotis, Thomas; Gaydadjiev, Georgi; Hamdioui, Said; Taouil, Mottaqiallah (2024)

Spin Wave Threshold Gate. - Zegbroeck, Arne Van; Anagnostou, Pantazis; Hamdioui, Said; Adelmann, Christoph; Ciubotaru, Florin; Cotofana, Sorin (CoRR, 2024)

High-Performance Data Mapping for BNNs on PCM-based Integrated Photonics. - Shahroodi, Taha; Cardoso, Raphael; Wong, Stephan; Bosio, Alberto; O'Connor, Ian; Hamdioui, Said (CoRR, 2024)

Memristor-Based Lightweight Encryption. - Siddiqi, Muhammad Ali; Hernández, Jan Andrés Galvan; Gebregiorgis, Anteneh; Bishnoi, Rajendra; Strydis, Christos; Hamdioui, Said; Taouil, Mottaqiallah (CoRR, 2024)

EON-1: A Brain-Inspired Processor for Near-Sensor Extreme Edge Online Feature Extraction. - Dobrita, Alexandra F.; Yousefzadeh, Amirreza; Thorpe, Simon; Vadivel, Kanishkan; Detterer, Paul; Tang, Guangzhi; Schaik, Gert-Jan van; Konijnenburg, Mario; Gebregiorgis, Anteneh; Hamdioui, Said; Sifalakis, Manolis (CoRR, 2024)

Energy-efficient SNN Architecture using 3nm FinFET Multiport SRAM-based CIM with Online Learning. - Huijbregts, Lucas; Liu, Hsiao-Hsuan; Detterer, Paul; Hamdioui, Said; Yousefzadeh, Amirreza; Bishnoi, Rajendra (CoRR, 2024)

SpikeFI: A Fault Injection Framework for Spiking Neural Networks. - Spyrou, Theofilos; Hamdioui, Said; Stratigopoulos, Haralampos-G. (CoRR, 2024)

Efficient Signed Arithmetic Multiplication on Memristor-Based Crossbar. - Zahedi, Mahdi; Shahroodi, Taha; Wong, Stephan; Hamdioui, Said (IEEE Access, 2023)

Using STLs for Effective In-Field Test of GPUs. - Condia, Josie E. Rodriguez; Silva, Felipe Augusto da; Bagbaga, Ahmet Çagri; Guerrero-Balaguera, Juan-David; Hamdioui, Said; Sauer, Christian; Reorda, Matteo Sonza (IEEE Des. Test, 2023)

A Survey on Machine Learning in Hardware Security. - Köylü, Troya Çagil; Reinbrecht, Cezar Rodolfo Wedig; Gebregiorgis, Anteneh; Hamdioui, Said; Taouil, Mottaqiallah (ACM J. Emerg. Technol. Comput. Syst., 2023)

Severity-Based Hierarchical ECG Classification Using Neural Networks. - Diware, Sumit; Dash, Sudeshna; Gebregiorgis, Anteneh; Joshi, Rajiv V.; Strydis, Christos; Hamdioui, Said; Bishnoi, Rajendra (IEEE Trans. Biomed. Circuits Syst., 2023)

Accurate and Energy-Efficient Bit-Slicing for RRAM-Based Neural Networks. - Diware, Sumit; Singh, Abhairaj; Gebregiorgis, Anteneh; Joshi, Rajiv V.; Hamdioui, Said; Bishnoi, Rajendra (IEEE Trans. Emerg. Top. Comput. Intell., 2023)

Mapping-aware Biased Training for Accurate Memristor-based Neural Networks. - Diware, Sumit; Gebregiorgis, Anteneh; Joshi, Rajiv V.; Hamdioui, Said; Bishnoi, Rajendra (2023)

A 115.1 TOPS/W, 12.1 TOPS/mm2 Computation-in-Memory using Ring-Oscillator based ADC for Edge AI. - Singh, Abhairaj; Bishnoi, Rajendra; Kaichouhi, Ali; Diware, Sumit; Joshi, Rajiv V.; Hamdioui, Said (2023)

Read-disturb Detection Methodology for RRAM-based Computation-in-Memory Architecture. - Yaldagard, Mohammad Amin; Diware, Sumit; Joshi, Rajiv V.; Hamdioui, Said; Bishnoi, Rajendra (2023)

SieveMem: A Computation-in-Memory Architecture for Fast and Accurate Pre-Alignment. - Shahroodi, Taha; Miao, Michael; Zahedi, Mahdi; Wong, Stephan; Hamdioui, Said (2023)

Device Aware Diagnosis for Unique Defects in STT-MRAMs. - Aouichi, Ahmed; Yuan, Sicong; Fieback, Moritz; Rao, Siddharth; Kim, Woojin; Marinissen, Erik Jan; Couet, Sebastien; Taouil, Mottaqiallah; Hamdioui, Said (2023)

Characterization and Test of Intermittent Over RESET in RRAMs. - Xun, Hanzhi; Fieback, Moritz; Yuan, Sicong; Aziza, Hassen; Heidekamp, Mathijs; Copetti, Thiago; Poehls, Letícia Maria Veiras Bolzani; Taouil, Mottaqiallah; Hamdioui, Said (2023)

PetaOps/W edge-AI $μ$ Processors: Myth or reality? - Gomony, Manil Dev; Putter, Floran de; Gebregiorgis, Anteneh; Paulin, Gianna; Mei, Linyan; Jain, Vikram; Hamdioui, Said; Sanchez, Victor; Grosser, Tobias; Geilen, Marc; Verhelst, Marian; Zenke, Friedemann; et al. (2023)

Lightspeed Binary Neural Networks using Optical Phase-Change Materials. - Shahroodi, Taha; Cardoso, Raphael; Zahedi, Mahdi; Wong, Stephan; Bosio, Alberto; O'Connor, Ian; Hamdioui, Said (2023)

Device-Aware Test for Back-Hopping Defects in STT-MRAMs. - Yuan, Sicong; Taouil, Mottaqiallah; Fieback, Moritz; Xun, Hanzhi; Marinissen, Erik Jan; Kar, Gouri Sankar; Rao, Sidharth; Couet, Sebastien; Hamdioui, Said (2023)

SparseMEM: Energy-efficient Design for In-memory Sparse-based Graph Processing. - Zahedi, Mahdi; Custers, Geert; Shahroodi, Taha; Gaydadjiev, Georgi; Wong, Stephan; Hamdioui, Said (2023)

A Pre-Silicon Power Leakage Assessment Based on Generative Adversarial Networks. - Aljuffri, Abdullah; Saxena, Mudit; Reinbrecht, Cezar; Hamdioui, Said; Taouil, Mottaqiallah (2023)

Memristor-Based Lightweight Encryption. - Siddiqi, Muhammad Ali; Hernández, Jan Andrés Galvan; Gebreziorgis, Anteneh; Bishnoi, Rajendra; Strydis, Christos; Hamdioui, Said; Taouil, Mottaqiallah (2023)

Online Fault Detection and Diagnosis in RRAM. - Fieback, Moritz; Bradaric, Filip; Taouil, Mottaqiallah; Hamdioui, Said (2023)

Dependability of Future Edge-AI Processors: Pandora's Box. - Gomony, Manil Dev; Gebregiorgis, Anteneh; Fieback, Moritz; Geilen, Marc; Stuijk, Sander; Richter-Brockmann, Jan; Bishnoi, Rajendra; Argo, Sven; Andradas, Lara Arche; Güneysu, Tim; Taouil, Mottaqiallah; Corporaal, Henk; et al. (2023)

Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs. - Xun, Hanzhi; Fieback, Moritz; Yuan, Sicong; Zhang, Ziwei; Taouil, Mottaqiallah; Hamdioui, Said (2023)

Energy-efficient Computation-In-Memory Architecture using Emerging Technologies. - Bishnoi, Rajendra; Diware, Sumit; Gebregiorgis, Anteneh; Thomann, Simon; Mannaa, Sara; Deveautour, Bastien; Marchand, Cédric; Bosio, Alberto; Deleruyelle, Damien; O'Connor, Ian; Amrouch, Hussam; Hamdioui, Said (2023)

Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs. - Yuan, Sicong; Zhang, Ziwei; Fieback, Moritz; Xun, Hanzhi; Marinissen, Erik Jan; Kar, Gouri Sankar; Rao, Sidharth; Couet, Sebastien; Taouil, Mottaqiallah; Hamdioui, Said (2023)

Device-Aware Test for Ion Depletion Defects in RRAMs. - Xun, Hanzhi; Yuan, Sicong; Fieback, Moritz; Aziza, Hassen; Taouil, Mottaqiallah; Hamdioui, Said (2023)

Swordfish: A Framework for Evaluating Deep Neural Network-based Basecalling using Computation-In-Memory with Non-Ideal Memristors. - Shahroodi, Taha; Singh, Gagandeep; Zahedi, Mahdi; Mao, Haiyu; Lindegger, Joël; Firtina, Can; Wong, Stephan; Mutlu, Onur; Hamdioui, Said (2023)

Spin Wave Threshold Logic Gates. - Zegbroeck, Arne Van; Anagnostou, Pantazis; Hamdioui, Said; Adelmann, Christoph; Ciubotaru, Florin; Cotofana, Sorin (2023)

RattlesnakeJake: A Fast and Accurate Pre-alignment Filter Suitable for Computation-in-Memory. - Shahroodi, Taha; Miao, Michael; Zahedi, Mahdi; Wong, Stephan; Hamdioui, Said (2023)

Devices and Architectures for Efficient Computing In-Memory (CIM) Design. - Bengel, Christopher; Gebregiorgis, Anteneh; Menzel, Stephan; Waser, Rainer; Gaydadjiev, Georgi; Hamdioui, Said (2023)

A Case for Genome Analysis Where Genomes Reside. - Shahroodi, Taha; Wong, Stephan; Hamdioui, Said (2023)

Securing an Efficient Lightweight AES Accelerator. - Huang, Ruoyu; Aljuffri, Abdullah; Hamdioui, Said; Ma, Kezheng; Taouil, Mottaqiallah (2023)

On the Reliability of RRAM-Based Neural Networks. - Aziza, Hassen; Zambelli, Cristian; Hamdioui, Said; Diware, Sumit; Bishnoi, Rajendra; Gebregiorgis, Anteneh (2023)

Modeling and Analysis of SRAM PUF Bias Patterns in 14nm and 7nm FinFET Technology Nodes. - Masoumian, Shayesteh; Maes, Roel; Wang, Rui; Yerriswamy, Karthik Keni; Schrijen, Geert Jan; Hamdioui, Said; Taouil, Mottaqiallah (2023)

Swordfish: A Framework for Evaluating Deep Neural Network-based Basecalling using Computation-In-Memory with Non-Ideal Memristors. - Shahroodi, Taha; Singh, Gagandeep; Zahedi, Mahdi; Mao, Haiyu; Lindegger, Joël; Firtina, Can; Wong, Stephan; Mutlu, Onur; Hamdioui, Said (CoRR, 2023)

An In-Memory Architecture for High-Performance Long-Read Pre-Alignment Filtering. - Shahroodi, Taha; Miao, Michael; Lindegger, Joël; Wong, Stephan; Mutlu, Onur; Hamdioui, Said (CoRR, 2023)

A Lightweight Architecture for Real-Time Neuronal-Spike Classification. - Siddiqi, Muhammad Ali; Vrijenhoek, David; Landsmeer, Lennart P. L.; Kleij, Job van der; Gebregiorgis, Anteneh; Romano, Vincenzo; Bishnoi, Rajendra; Hamdioui, Said; Strydis, Christos (CoRR, 2023)

Improving the Security of the IEEE 802.15.6 Standard for Medical BANs. - Siddiqi, Muhammad Ali; Hahn, Georg; Hamdioui, Said; Serdijn, Wouter A.; Strydis, Christos (IEEE Access, 2022)

Rapid Design-Space Exploration for Low-Power Manycores Under Process Variation Utilizing Machine Learning. - Majzoub, Sohaib; Saleh, Resve A.; Taouil, Mottaqiallah; Hamdioui, Said; Bamakhrama, Mohamed (IEEE Access, 2022)

Demeter: A Fast and Energy-Efficient Food Profiler Using Hyperdimensional Computing in Memory. - Shahroodi, Taha; Zahedi, Mahdi; Firtina, Can; Alser, Mohammed; Wong, Stephan; Mutlu, Onur; Hamdioui, Said (IEEE Access, 2022)

Guest Editorial: Computation-In-Memory (CIM): from Device to Applications. - Hamdioui, Said; Vatajelu, Elena I.; Bosio, Alberto (ACM J. Emerg. Technol. Comput. Syst., 2022)

A Voltage-Controlled, Oscillation-Based ADC Design for Computation-in-Memory Architectures Using Emerging ReRAMs. - Mayahinia, Mahta; Singh, Abhairaj; Bengel, Christopher; Wiefels, Stefan; Lebdeh, Muath Abu; Menzel, Stephan; Wouters, Dirk J.; Gebregiorgis, Anteneh; Bishnoi, Rajendra; Joshi, Rajiv V.; Hamdioui, Said (ACM J. Emerg. Technol. Comput. Syst., 2022)

MNEMOSENE: Tile Architecture and Simulator for Memristor-based Computation-in-memory. - Zahedi, Mahdi; Lebdeh, Muath Abu; Bengel, Christopher; Wouters, Dirk J.; Menzel, Stephan; Gallo, Manuel Le; Sebastian, Abu; Wong, Stephan; Hamdioui, Said (ACM J. Emerg. Technol. Comput. Syst., 2022)

Defects, Fault Modeling, and Test Development Framework for RRAMs. - Fieback, Moritz; Medeiros, Guilherme Cardoso; Wu, Lizhou; Aziza, Hassen; Bishnoi, Rajendra; Taouil, Mottaqiallah; Hamdioui, Said (ACM J. Emerg. Technol. Comput. Syst., 2022)

A Survey on Memory-centric Computer Architectures. - Gebregiorgis, Anteneh; Nguyen, Hoang Anh Du; Yu, Jintao; Bishnoi, Rajendra; Taouil, Mottaqiallah; Catthoor, Francky; Hamdioui, Said (ACM J. Emerg. Technol. Comput. Syst., 2022)

Instruction flow-based detectors against fault injection attacks. - Köylü, Troya Çagil; Reinbrecht, Cezar Rodolfo Wedig; Brandalero, Marcelo; Hamdioui, Said; Taouil, Mottaqiallah (Microprocess. Microsystems, 2022)

Reliability aspects of binary vector-matrix-multiplications using ReRAM devices. - Bengel, Christopher; Mohr, Johannes; Wiefels, Stefan; Singh, Abhairaj; Gebregiorgis, Anteneh; Bishnoi, Rajendra; Hamdioui, Said; Waser, Rainer; Wouters, Dirk J.; Menzel, Stephan (Neuromorph. Comput. Eng., 2022)

Energy-efficient In-Memory Address Calculation. - Yousefzadeh, Amirreza; Stuijt, Jan; Hijdra, Martijn; Liu, Hsiao-Hsuan; Gebregiorgis, Anteneh; Singh, Abhairaj; Hamdioui, Said; Catthoor, Francky (ACM Trans. Archit. Code Optim., 2022)

Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs. - Wu, Lizhou; Rao, Siddharth; Taouil, Mottaqiallah; Marinissen, Erik Jan; Kar, Gouri Sankar; Hamdioui, Said (IEEE Trans. Computers, 2022)

APmap: An Open-Source Compiler for Automata Processors. - Yu, Jintao; Lebdeh, Muath Abu; Nguyen, Hoang Anh Du; Taouil, Mottaqiallah; Hamdioui, Said (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)

MFA-MTJ Model: Magnetic-Field-Aware Compact Model of pMTJ for Robust STT-MRAM Design. - Wu, Lizhou; Rao, Siddharth; Taouil, Mottaqiallah; Marinissen, Erik Jan; Kar, Gouri Sankar; Hamdioui, Said (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)

Non-Binary Spin Wave Based Circuit Design. - Mahmoud, Abdulqader Nael; Vanderveken, Frederic; Ciubotaru, Florin; Adelmann, Christoph; Hamdioui, Said; Cotofana, Sorin (IEEE Trans. Circuits Syst. I Regul. Pap., 2022)

Spin Wave Based Approximate Computing. - Mahmoud, Abdulqader Nael; Vanderveken, Frederic; Ciubotaru, Florin; Adelmann, Christoph; Hamdioui, Said; Cotofana, Sorin (IEEE Trans. Emerg. Top. Comput., 2022)

CIM-based Robust Logic Accelerator using 28 nm STT-MRAM Characterization Chip Tape-out. - Singh, Abhairaj; Zahedi, Mahdi; Shahroodi, Taha; Gupta, Mohit; Gebregiorgis, Anteneh; Komalan, Manu; Joshi, Rajiv V.; Catthoor, Francky; Bishnoi, Rajendra; Hamdioui, Said (2022)

Using Hopfield Networks to Correct Instruction Faults. - Köylü, Troya Çagil; Fieback, Moritz; Hamdioui, Said; Taouil, Mottaqiallah (2022)

Reliability Analysis of FinFET-Based SRAM PUFs for 16nm, 14nm, and 7nm Technology Nodes. - Masoumian, Shayesteh; Selimis, Georgios N.; Wang, Rui; Schrijen, Geert Jan; Hamdioui, Said; Taouil, Mottaqiallah (2022)

Referencing-in-Array Scheme for RRAM-based CIM Architecture. - Singh, Abhairaj; Bishnoi, Rajendra; Joshi, Rajiv V.; Hamdioui, Said (2022)

Exploiting PUF Variation to Detect Fault Injection Attacks. - Köylü, Troya Çagil; Garaffa, Luíza C.; Reinbrecht, Cezar; Zahedi, Mahdi; Hamdioui, Said; Taouil, Mottaqiallah (2022)

PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory. - Fieback, Moritz; Münch, Christopher; Gebregiorgis, Anteneh; Medeiros, Guilherme Cardoso; Taouil, Mottaqiallah; Hamdioui, Said; Tahoori, Mehdi B. (2022)

RRAM Crossbar-Based Fault-Tolerant Binary Neural Networks (BNNs). - Gebregiorgis, Anteneh; Zografou, Artemis; Hamdioui, Said (2022)

Smart Redundancy Schemes for ANNs Against Fault Attacks. - Köylü, Troya Çagil; Hamdioui, Said; Taouil, Mottaqiallah (2022)

Hierarchical Memory Diagnosis. - Medeiros, Guilherme Cardoso; Fieback, Moritz; Gebregiorgis, Anteneh; Taouil, Mottaqiallah; Bolzani, Letícia Maria Veiras; Hamdioui, Said (2022)

Would Magnonic Circuits Outperform CMOS Counterparts? - Mahmoud, Abdulqader Nael; Laurenciu, Nicoleta Cucu; Vanderveken, Frederic; Ciubotaru, Florin; Adelmann, Christoph; Cotofana, Sorin; Hamdioui, Said (2022)

KrakenOnMem: a memristor-augmented HW/SW framework for taxonomic profiling. - Shahroodi, Taha; Zahedi, Mahdi; Singh, Abhairaj; Wong, Stephan; Hamdioui, Said (2022)

Recent Trends and Perspectives on Defect-Oriented Testing. - Bernardi, Paolo; Cantoro, Riccardo; Coyette, Anthony; Dobbeleare, W.; Fieback, Moritz; Floridia, Andrea; Gielenk, G.; Gomez, Jhon; Grosso, Michelangelo; Guerriero, Andrea; Guglielminetti, Iacopo; Hamdioui, Said; et al. (2022)

Accelerating RRAM Testing with a Low-cost Computation-in-Memory based DFT. - Singh, Abhairaj; Fieback, Moritz; Bishnoi, Rajendra; Bradaric, Filip; Gebregiorgis, Anteneh; Joshi, Rajiv V.; Hamdioui, Said (2022)

Structured Test Development Approach for Computation-in-Memory Architectures. - Fieback, Moritz; Taouil, Mottaqiallah; Hamdioui, Said (2022)

Exploring an On-Chip Sensor to Detect Unique Faults in RRAMs. - Copetti, Thiago Santos; Nilovic, M.; Fieback, Moritz; Gemmeke, Tobias; Hamdioui, Said; Poehls, Letícia Maria Bolzani (2022)

On BTI Aging Rejuvenation in Memory Address Decoders. - Gürsoy, Cemil Cem; Kraak, Daniel; Ahmed, Foisal; Taouil, Mottaqiallah; Jenihhin, Maksim; Hamdioui, Said (2022)

Energy-Efficient SNN Implementation Using RRAM-Based Computation In-Memory (CIM). - Arrassi, Asmae El; Gebregiorgis, Anteneh; Haddadi, Anass El; Hamdioui, Said (2022)

Dealing with Non-Idealities in Memristor Based Computation-In-Memory Designs. - Gebregiorgis, Anteneh; Singh, Abhairaj; Diware, Sumit; Bishnoi, Rajendra; Hamdioui, Said (2022)

System Design for Computation-in-Memory: From Primitive to Complex Functions. - Zahedi, Mahdi; Shahroodi, Taha; Custers, Geert; Singh, Abhairaj; Wong, Stephan; Hamdioui, Said (2022)

Special Session: STT-MRAMs: Technology, Design and Test. - Gebregiorgis, Anteneh; Wu, Lizhou; Münch, Christopher; Rao, Siddharth; Tahoori, Mehdi B.; Hamdioui, Said (2022)

Assessing the Security of the IEEE 802.15.6 Standard for Medical BANs. - Hahn, Georg; Siddiqi, Muhammad Ali; Hamdioui, Said; Serdijn, Wouter A.; Strydis, Christos (CoRR, 2022)

Demeter: A Fast and Energy-Efficient Food Profiler using Hyperdimensional Computing in Memory. - Shahroodi, Taha; Zahedi, Mahdi; Firtina, Can; Alser, Mohammed; Wong, Stephan; Mutlu, Onur; Hamdioui, Said (CoRR, 2022)

Survey on Architectural Attacks: A Unified Classification and Attack Model. - Ghasempouri, Tara; Raik, Jaan; Reinbrecht, Cezar; Hamdioui, Said; Taouil, Mottaqiallah (CoRR, 2022)

BCIM: Efficient Implementation of Binary Neural Network Based on Computation in Memory. - Zahedi, Mahdi; Shahroodi, Taha; Wong, Stephan; Hamdioui, Said (CoRR, 2022)

CONVOLVE: Smart and seamless design of smart edge processors. - Gomony, Manil Dev; Putter, Floran de; Gebregiorgis, Anteneh; Paulin, Gianna; Mei, Linyan; Jain, Vikram; Hamdioui, Said; Sanchez, Victor; Grosser, Tobias; Geilen, Marc; Verhelst, Marian; Zenke, Frank K.; et al. (CoRR, 2022)

On BTI Aging Rejuvenation in Memory Address Decoders. - Gürsoy, Cemil Cem; Kraak, Daniel; Ahmed, Foisal; Taouil, Mottaqiallah; Jenihhin, Maksim; Hamdioui, Said (CoRR, 2022)

Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects. - Copetti, Thiago; Medeiros, Guilherme Cardoso; Taouil, Mottaqiallah; Hamdioui, Said; Poehls, Letícia Maria Bolzani; Balen, Tiago Roberto (J. Electron. Test., 2021)

Review of Manufacturing Process Defects and Their Effects on Memristive Devices. - Bolzani, Letícia Maria Veiras; Fieback, Moritz; Hoffmann-Eifert, Susanne; Copetti, Thiago; Brum, E.; Menzel, Stephan; Hamdioui, Said; Gemmeke, Tobias (J. Electron. Test., 2021)

Spin Wave Normalization Toward All Magnonic Circuits. - Mahmoud, Abdulqader Nael; Vanderveken, Frederic; Adelmann, Christoph; Ciubotaru, Florin; Cotofana, Sorin; Hamdioui, Said (IEEE Trans. Circuits Syst. I Regul. Pap., 2021)

SRIF: Scalable and Reliable Integrate and Fire Circuit ADC for Memristor-Based CIM Architectures. - Singh, Abhairaj; Lebdeh, Muath Abu; Gebregiorgis, Anteneh; Bishnoi, Rajendra; Joshi, Rajiv V.; Hamdioui, Said (IEEE Trans. Circuits Syst. I Regul. Pap., 2021)

Defect and Fault Modeling Framework for STT-MRAM Testing. - Wu, Lizhou; Rao, Siddharth; Taouil, Mottaqiallah; Medeiros, Guilherme Cardoso; Fieback, Moritz; Marinissen, Erik Jan; Kar, Gouri Sankar; Hamdioui, Said (IEEE Trans. Emerg. Top. Comput., 2021)

Hard-to-Detect Fault Analysis in FinFET SRAMs. - Medeiros, Guilherme Cardoso; Fieback, Moritz; Wu, Lizhou; Taouil, Mottaqiallah; Poehls, Letícia Maria Bolzani; Hamdioui, Said (IEEE Trans. Very Large Scale Integr. Syst., 2021)

Applying Thermal Side-Channel Attacks on Asymmetric Cryptography. - Aljuffri, Abdullah; Zwalua, Marc; Reinbrecht, Cezar Rodolfo Wedig; Hamdioui, Said; Taouil, Mottaqiallah (IEEE Trans. Very Large Scale Integr. Syst., 2021)

Unbalanced Bit-slicing Scheme for Accurate Memristor-based Neural Network Architecture. - Diware, Sumit; Gebregiorgis, Anteneh; Joshi, Rajiv V.; Hamdioui, Said; Bishnoi, Rajendra (2021)

GRINCH: A Cache Attack against GIFT Lightweight Cipher. - Reinbrecht, Cezar; Aljuffri, Abdullah; Hamdioui, Said; Taouil, Mottaqiallah; Sepúlveda, Johanna (2021)

Fan-out of 2 Triangle Shape Spin Wave Logic Gates. - Mahmoud, Abdulqader Nael; Adelmann, Christoph; Vanderveken, Frederic; Cotofana, Sorin; Ciubotaru, Florin; Hamdioui, Said (2021)

Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM. - Wu, Lizhou; Rao, Siddharth; Taouil, Mottaqiallah; Marinissen, Erik Jan; Kar, Gouri Sankar; Hamdioui, Said (2021)

Density Enhancement of RRAMs using a RESET Write Termination for MLC Operation. - Aziza, Hassen; Hamdioui, Said; Fieback, Moritz; Taouil, Mottaqiallah; Moreau, Mathieu (2021)

Perspectives on Emerging Computation-in-Memory Paradigms. - Rai, Shubham; Liu, Mengyun; Gebregiorgis, Anteneh; Bhattacharjee, Debjyoti; Chakrabarty, Krishnendu; Hamdioui, Said; Chattopadhyay, Anupam; Trommer, Jens; Kumar, Akash (2021)

Modeling Soft-Error Reliability Under Variability. - Balakrishnan, Aneesh; Medeiros, Guilherme Cardoso; Gürsoy, Cemil Cem; Hamdioui, Said; Jenihhin, Maksim; Alexandrescu, Dan (2021)

Protecting IoT Devices through a Hardware-driven Memory Verification. - Köylü, Troya Çagil; Okkerman, Hans; Reinbrecht, Cezar Rodolfo Wedig; Hamdioui, Said; Taouil, Mottaqiallah (2021)

Revealing the Secrets of Spiking Neural Networks: The Case of Izhikevich Neuron. - Garaffa, Luíza C.; Aljuffri, Abdullah; Reinbrecht, Cezar; Hamdioui, Said; Taouil, Mottaqiallah; Sepúlveda, Johanna (2021)

Impact of Data Pre-Processing Techniques on Deep Learning Based Power Attacks. - Aljuffri, Abdullah; Reinbrecht, Cezar; Hamdioui, Said; Taouil, Mottaqiallah (2021)

Improving the Detection of Undefined State Faults in FinFET SRAMs. - Medeiros, G. Cardoso; Fieback, Moritz; Copetti, Thiago Santos; Gebregiorgis, Anteneh; Taouil, Mottaqiallah; Poehls, Leticia B.; Hamdioui, Said (2021)

Power Side Channel Attacks: Where Are We Standing? - Taouil, Mottaqiallah; Aljuffri, Abdullah; Hamdioui, Said (2021)

Emerging Computing Devices: Challenges and Opportunities for Test and Reliability*. - Bosio, Alberto; O'Connor, Ian; Traiola, Marcello; Echavarria, Jorge; Teich, Jürgen; Hanif, Muhammad Abdullah; Shafique, Muhammad; Hamdioui, Said; Deveautour, Bastien; Girard, Patrick; Virazel, Arnaud; Bertels, Koen (2021)

Intermittent Undefined State Fault in RRAMs. - Fieback, Moritz; Medeiros, Guilherme Cardoso; Gebregiorgis, Anteneh; Aziza, Hassen; Taouil, Mottaqiallah; Hamdioui, Said (2021)

Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs. - Medeiros, G. Cardoso; Fieback, Moritz; Gebregiorgis, Anteneh; Taouil, Mottaqiallah; Poehls, Leticia Bolzani; Hamdioui, Said (2021)

Spin Wave Based 4-2 Compressor. - Mahmoud, Abdulqader Nael; Vanderveken, Frederic; Ciubotaru, Florin; Adelmann, Christoph; Cotofana, Sorin; Hamdioui, Said (2021)

Flip Flop Weighting: A technique for estimation of safety metrics in Automotive Designs. - Silva, Felipe Augusto da; Bagbaba, Ahmet Cagri; Hamdioui, Said; Sauer, Christian (2021)

Spin Wave Based Full Adder. - Mahmoud, Abdulqader Nael; Vanderveken, Frederic; Ciubotaru, Florin; Adelmann, Christoph; Cotofana, Sorin; Hamdioui, Said (2021)

Low-Power Memristor-Based Computing for Edge-AI Applications. - Singh, Abhairaj; Diware, Sumit; Gebregiorgis, Anteneh; Bishnoi, Rajendra; Catthoor, Francky; Joshi, Rajiv V.; Hamdioui, Said (2021)

Achieving Wave Pipelining in Spin Wave Technology. - Mahmoud, Abdulqader Nael; Vanderveken, Frederic; Adelmann, Christoph; Ciubotaru, Florin; Hamdioui, Said; Cotofana, Sorin (2021)

Tile Architecture and Hardware Implementation for Computation-in-Memory. - Zahedi, Mahdi; Duijnen, Remon van; Wong, Stephan; Hamdioui, Said (2021)

LightRoAD: Lightweight Rowhammer Attack Detector. - Taouil, Mottaqiallah; Reinbrecht, Cezar; Hamdioui, Said; Sepúlveda, Johanna (2021)

Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions. - Wu, Lizhou; Rao, Siddharth; Taouil, Mottaqiallah; Marinissen, Erik Jan; Kar, Gouri Sankar; Hamdioui, Said (2021)

An automated formal-based approach for reducing undetected faults in ISO 26262 hardware compliant designs. - Silva, Felipe Augusto da; Bagbaba, Ahmet Cagri; Hamdioui, Said; Sauer, Christian (2021)

Evaluating the Impact of Process Variation on RRAMs. - Brum, E.; Fieback, Moritz; Copetti, Thiago Santos; Jiayi, H.; Hamdioui, Said; Vargas, Fabian; Bolzani, Letícia Maria Veiras (2021)

Deterministic and Statistical Strategies to Protect ANNs against Fault Injection Attacks. - Köylü, Troya Çagil; Reinbrecht, Cezar Rodolfo Wedig; Hamdioui, Said; Taouil, Mottaqiallah (2021)

Towards Reliable In-Memory Computing: From Emerging Devices to Post-von-Neumann Architectures. - Amrouch, Hussam; Du, Nan; Gebregiorgis, Anteneh; Hamdioui, Said; Polian, Ilia (2021)

Multi-Bit Blinding: A Countermeasure for RSA Against Side Channel Attacks. - Aljuffri, Abdullah; Reinbrecht, Cezar; Hamdioui, Said; Taouil, Mottaqiallah (2021)

An Energy-Efficient Current-Controlled Write and Read Scheme for Resistive RAMs (RRAMs). - Aziza, Hassen; Moreau, Mathieu; Fieback, Moritz; Taouil, Mottaqiallah; Hamdioui, Said (IEEE Access, 2020)

In-Memory Database Query. - Giannopoulos, Iason; Singh, Abhairaj; Gallo, Manuel Le; Jonnalagadda, Vara Prasad; Hamdioui, Said; Sebastian, Abu (Adv. Intell. Syst., 2020)

A Classification of Memory-Centric Computing. - Nguyen, Hoang Anh Du; Yu, Jintao; Lebdeh, Muath Abu; Taouil, Mottaqiallah; Hamdioui, Said; Catthoor, Francky (ACM J. Emerg. Technol. Comput. Syst., 2020)

Skeleton-Based Synthesis Flow for Computation-in-Memory Architectures. - Yu, Jintao; Nane, Razvan; Ashraf, Imran; Taouil, Mottaqiallah; Hamdioui, Said; Corporaal, Henk; Bertels, Koen (IEEE Trans. Emerg. Top. Comput., 2020)

The Power of Computation-in-Memory Based on Memristive Devices. - Yu, Jintao; Lebdeh, Muath Abu; Nguyen, Hoang Anh Du; Taouil, Mottaqiallah; Hamdioui, Said (2020)

RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems. - Jenihhin, Maksim; Hamdioui, Said; Reorda, Matteo Sonza; Krstic, Milos; Langendörfer, Peter; Sauer, Christian; Klotz, Anton; Hübner, Michael; Nolte, Jörg; Vierhaus, Heinrich Theodor; Selimis, Georgios N.; Alexandrescu, Dan; et al. (2020)

n-bit Data Parallel Spin Wave Logic Gate. - Mahmoud, Abdulqader Nael; Vanderveken, Frederic; Ciubotaru, Florin; Adelmann, Christoph; Cotofana, Sorin; Hamdioui, Said (2020)

A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs. - Medeiros, Guilherme Cardoso; Gürsoy, Cemil Cem; Wu, Lizhou; Fieback, Moritz; Jenihhin, Maksim; Taouil, Mottaqiallah; Hamdioui, Said (2020)

Impact of Magnetic Coupling and Density on STT-MRAM Performance. - Wu, Lizhou; Rao, Siddharth; Taouil, Mottaqiallah; Marinissen, Erik Jan; Kar, Gouri Sankar; Hamdioui, Said (2020)

Mitigation of Sense Amplifier Degradation Using Skewed Design. - Kraak, Daniel; Taouil, Mottaqiallah; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky (2020)

A Security Verification Template to Assess Cache Architecture Vulnerabilities. - Ghasempouri, Tara; Raik, Jaan; Paul, Kolin; Reinbrecht, Cezar; Hamdioui, Said; Taouil, Mottaqiallah (2020)

On the Analysis of Real-time Operating System Reliability in Embedded Systems. - Mamone, Dario; Bosio, Alberto; Savino, Alessandro; Hamdioui, Said; Rebaudengo, Maurizio (2020)

Exploiting Approximate Computing for implementing Low Cost Fault Tolerance Mechanisms. - Bosio, Alberto; O'Connor, Ian; Rodrigues, Gennaro Severino; Lima, Fernanda Lima; Hamdioui, Said (2020)

eSRAM Reliability: Why is it still not optimally solved? - Kraak, Daniël; Taouil, Mottaqiallah; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky (2020)

Testing Scouting Logic-Based Computation-in-Memory Architectures. - Fieback, Moritz; Nagarajan, Surya; Bishnoi, Rajendra; Tahoori, Mehdi B.; Taouil, Mottaqiallah; Hamdioui, Said (2020)

G-PUF: An Intrinsic PUF Based on GPU Error Signatures. - Forlin, Bruno Endres; Husemann, Ronaldo; Carro, Luigi; Reinbrecht, Cezar; Hamdioui, Said; Taouil, Mottaqiallah (2020)

Modeling Static Noise Margin for FinFET based SRAM PUFs. - Masoumian, Shayesteh; Selimis, Georgios N.; Maes, Roel; Schrijen, Geert Jan; Hamdioui, Said; Taouil, Mottaqiallah (2020)

LiD-CAT: A Lightweight Detector for Cache ATtacks. - Reinbrecht, Cezar; Hamdioui, Said; Taouil, Mottaqiallah; Niazmand, Behrad; Ghasempouri, Tara; Raik, Jaan; Sepúlveda, Johanna (2020)

Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs. - Silva, Felipe Augusto da; Bagbaba, Ahmet Cagri; Sartoni, Sandro; Cantoro, Riccardo; Reorda, Matteo Sonza; Hamdioui, Said; Sauer, Christian (2020)

Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level. - Wu, Lizhou; Fieback, Moritz; Taouil, Mottaqiallah; Hamdioui, Said (2020)

4-output Programmable Spin Wave Logic Gate. - Mahmoud, Abdulqader Nael; Vanderveken, Frederic; Adelmann, Christoph; Ciubotaru, Florin; Hamdioui, Said; Cotofana, Sorin (2020)

Yield Estimation of a Memristive Sensor Array. - Gupta, Vishal; Khandelwal, Saurabh; Panunzi, Giulio; Martinelli, Eugenio; Hamdioui, Said; Jabir, Abusaleh M.; Ottavi, Marco (2020)

RNN-Based Detection of Fault Attacks on RSA. - Köylü, Troya Çagil; Reinbrecht, Cezar Rodolfo Wedig; Hamdioui, Said; Taouil, Mottaqiallah (2020)

2-Output Spin Wave Programmable Logic Gate. - Mahmoud, Abdulqader Nael; Vanderveken, Frederic; Adelmann, Christoph; Ciubotaru, Florin; Cotofana, Sorin; Hamdioui, Said (2020)

Efficient Organization of Digital Periphery to Support Integer Datatype for Memristor-Based CIM. - Zahedi, Mahdi; Mayahinia, Mahta; Lebdeh, Muath Abu; Wong, Stephan; Hamdioui, Said (2020)

Guard-NoC: A Protection Against Side-Channel Attacks for MPSoCs. - Reinbrecht, Cezar; Aljuffri, Abdullah; Hamdioui, Said; Taouil, Mottaqiallah; Forlin, Bruno Endres; Sepúlveda, Johanna (2020)

Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs. - Wu, Lizhou; Rao, Siddharth; Taouil, Mottaqiallah; Marinissen, Erik Jan; Kar, Gouri Sankar; Hamdioui, Said (2020)

Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects. - Copetti, Thiago; Medeiros, Guilherme Cardoso; Taouil, Mottaqiallah; Hamdioui, Said; Poehls, Leticia Bolzani; Balen, Tiago R. (2020)

S-NET: A Confusion Based Countermeasure Against Power Attacks for SBOX. - Aljuffri, Abdullah; Venkatachalam, Pradeep; Reinbrecht, Cezar; Hamdioui, Said; Taouil, Mottaqiallah (2020)

Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis. - Bishnoi, Rajendra; Wu, Lizhou; Fieback, Moritz; Münch, Christopher; Nair, Sarath Mohanachandran; Tahoori, Mehdi Baradaran; Wang, Ying; Li, Huawei; Hamdioui, Said (2020)

Special Session: AutoSoC - A Suite of Open-Source Automotive SoC Benchmarks. - Silva, Felipe Augusto da; Bagbaba, Ahmet Cagri; Ruospo, Annachiara; Mariani, Riccardo; Kanawati, Ghani; Sánchez, Ernesto; Reorda, Matteo Sonza; Jenihhin, Maksim; Hamdioui, Said; Sauer, Christian (2020)

Survey on STT-MRAM Testing: Failure Mechanisms, Fault Models, and Tests. - Wu, Lizhou; Taouil, Mottaqiallah; Rao, Siddharth; Marinissen, Erik Jan; Hamdioui, Said (CoRR, 2020)

Public-Key Based Authentication Architecture for IoT Devices Using PUF. - Akhundov, Haji; Sluis, Erik van der; Hamdioui, Said; Taouil, Mottaqiallah (CoRR, 2020)

Impact of Magnetic Coupling and Density on STT-MRAM Performance. - Wu, Lizhou; Rao, Siddharth; Taouil, Mottaqiallah; Marinissen, Erik Jan; Kar, Gouri Sankar; Hamdioui, Said (CoRR, 2020)

Energy Optimization for Large-Scale 3D Manycores in the Dark-Silicon Era. - Majzoub, Sohaib; Saleh, Resve A.; Ashraf, Imran; Taouil, Mottaqiallah; Hamdioui, Said (IEEE Access, 2019)

Configurable Operational Amplifier Architectures Based on Oxide Resistive RAMs. - Aziza, Hassen; Dufaza, Christian; Pérez, Annie; Hamdioui, Said (J. Circuits Syst. Comput., 2019)

System-Level Sub-20 nm Planar and FinFET CMOS Delay Modelling for Supply and Threshold Voltage Scaling Under Process Variation. - Majzoub, Sohaib; Taouil, Mottaqiallah; Hamdioui, Said (J. Low Power Electron., 2019)

Challenges and Solutions in Emerging Memory Testing. - Vatajelu, Elena-Ioana; Prinetto, Paolo; Taouil, Mottaqiallah; Hamdioui, Said (IEEE Trans. Emerg. Top. Comput., 2019)

Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM. - Kraak, Daniel; Taouil, Mottaqiallah; Agbo, Innocent; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky (IEEE Trans. Very Large Scale Integr. Syst., 2019)

Combining Fault Analysis Technologies for ISO26262 Functional Safety Verification. - Silva, Felipe Augusto da; Bagbaba, Ahmet Cagri; Hamdioui, Said; Sauer, Christian (2019)

Methodology for Application-Dependent Degradation Analysis of Memory Timing. - Kraak, Daniel; Agbo, Innocent; Taouil, Mottaqiallah; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky (2019)

Applications of Computation-In-Memory Architectures based on Memristive Devices. - Hamdioui, Said; Nguyen, Hoang Anh Du; Taouil, Mottaqiallah; Sebastian, Abu; Gallo, Manuel Le; Pande, Sandeep; Schaafsma, Siebren; Catthoor, Francky; Das, Shidhartha; García-Redondo, Fernando; Karunaratne, Geethan; Rahimi, Abbas; et al. (2019)

Time-division Multiplexing Automata Processor. - Yu, Jintao; Nguyen, Hoang Anh Du; Lebdeh, Muath Abu; Taouil, Mottaqiallah; Hamdioui, Said (2019)

Rebooting Computing: The Challenges for Test and Reliability. - Bosio, Alberto; O'Connor, Ian; Rodrigues, Gennaro Severino; Kastensmidt, Fernanda Lima; Vatajelu, Elena I.; Natale, Giorgio Di; Anghel, Lorena; Nagarajan, Surya; Fieback, Moritz; Hamdioui, Said (2019)

Hardware-Based Aging Mitigation Scheme for Memory Address Decoder. - Kraak, Daniel; Agbo, Innocent; Taouil, Mottaqiallah; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky (2019)

DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs. - Medeiros, Guilherme Cardoso; Taouil, Mottaqiallah; Fieback, Moritz; Poehls, Leticia Bolzani; Hamdioui, Said (2019)

Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing. - Wu, Lizhou; Rao, Siddharth; Medeiros, Guilherme Cardoso; Taouil, Mottaqiallah; Marinissen, Erik Jan; Yasin, Farrukh; Couet, Sebastien; Hamdioui, Said; Kar, Gouri Sankar (2019)

Untestable faults identification in GPGPUs for safety-critical applications. - Condia, Josie E. Rodriguez; Silva, Felipe Augusto da; Hamdioui, Said; Sauer, Christian; Reorda, Matteo Sonza (2019)

Efficient Methodology for ISO26262 Functional Safety Verification. - Silva, Felipe Augusto da; Bagbaba, Ahmet Cagri; Hamdioui, Said; Sauer, Christian (2019)

Memristive Device Based Circuits for Computation-in-Memory Architectures. - Lebdeh, Muath Abu; Reinsalu, Uljana; Nguyen, Hoang Anh Du; Wong, Stephan; Hamdioui, Said (2019)

Memristive Device Modeling and Circuit Design Exploration for Computation-in-Memory. - Siemon, Anne; Wouters, Dirk J.; Hamdioui, Said; Menzel, Stephan (2019)

Reliability Modeling and Mitigation for Embedded Memories. - Agbo, Innocent Okwudili; Taouil, Mottaqiallah; Hamdioui, Said (2019)

IEEE European Test Symposium (ETS). - Eggersglüß, Stephan; Hamdioui, Said; Jutman, Artur; Michael, Maria K.; Raik, Jaan; Reorda, Matteo Sonza; Tahoori, Mehdi Baradaran; Vatajelu, Elena-Ioana (2019)

Device-Aware Test: A New Test Approach Towards DPPB Level. - Fieback, Moritz; Wu, Lizhou; Medeiros, Guilherme Cardoso; Aziza, Hassen; Rao, Siddharth; Marinissen, Erik Jan; Taouil, Mottaqiallah; Hamdioui, Said (2019)

Testing Computation-in-Memory Architectures Based on Emerging Memories. - Hamdioui, Said; Fieback, Moritz; Nagarajan, Surya; Taouil, Mottaqiallah (2019)

Software-Based Mitigation for Memory Address Decoder Aging. - Kraak, Daniel H. P.; Gürsoy, Cemil Cem; Agbo, Innocent O.; Taouil, Mottaqiallah; Jenihhin, Maksim; Raik, Jaan; Hamdioui, Said (2019)

A computation-in-memory accelerator based on resistive devices. - Nguyen, Hoang Anh Du; Yu, Jintao; Lebdeh, Muath Abu; Taouil, Mottaqiallah; Hamdioui, Said (2019)

Enhanced Scouting Logic: A Robust Memristive Logic Design Scheme. - Yu, Jintao; Nguyen, Hoang Anh Du; Lebdeh, Muath Abu; Taouil, Mottaqiallah; Hamdioui, Said (2019)

CIM-SIM: Computation In Memory SIMuIator. - BanaGozar, Ali; Vadivel, Kanishkan; Stuijk, Sander; Corporaal, Henk; Wong, Stephan; Lebdeh, Muath Abu; Yu, Jintao; Hamdioui, Said (2019)

Memristive Devices for Computation-In-Memory. - Yu, Jintao; Nguyen, Hoang Anh Du; Xie, Lei; Taouil, Mottaqiallah; Hamdioui, Said (CoRR, 2019)

RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems. - Jenihhin, Maksim; Hamdioui, Said; Reorda, Matteo Sonza; Krstic, Milos; Langendörfer, Peter; Sauer, Christian; Klotz, Anton; Hübner, Michael; Nolte, Jörg; Vierhaus, Heinrich Theodor; Selimis, Georgios N.; Alexandrescu, Dan; et al. (CoRR, 2019)

State of the art and challenges for test and reliability of emerging nonvolatile resistive memories. - Vatajelu, Elena-Ioana; Pouyan, Peyman; Hamdioui, Said (Int. J. Circuit Theory Appl., 2018)

Impact and mitigation of SRAM read path aging. - Agbo, Innocent; Taouil, Mottaqiallah; Kraak, Daniel; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky; Dehaene, Wim (Microelectron. Reliab., 2018)

A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs. - Medeiros, G. Cardoso; Bolzani, Letícia Maria Veiras; Taouil, Mottaqiallah; Vargas, Fabian; Hamdioui, Said (Microelectron. Reliab., 2018)

A Mapping Methodology of Boolean Logic Circuits on Memristor Crossbar. - Xie, Lei; Nguyen, Hoang Anh Du; Taouil, Mottaqiallah; Hamdioui, Said; Bertels, Koen (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018)

Guest Editorial Memristive-Device-Based Computing. - Hamdioui, Said; Gaillardon, Pierre-Emmanuel; Fey, Dietmar; Rosing, Tajana Simunic (IEEE Trans. Very Large Scale Integr. Syst., 2018)

Degradation analysis of high performance 14nm FinFET SRAM. - Kraak, Daniel; Agbo, Innocent; Taouil, Mottaqiallah; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky (2018)

Memristive devices for computation-in-memory. - Yu, Jintao; Nguyen, Hoang Anh Du; Xie, Lei; Taouil, Mottaqiallah; Hamdioui, Said (2018)

Device aging: A reliability and security concern. - Kraak, Daniel; Taouil, Mottaqiallah; Hamdioui, Said; Weckx, Pieter; Catthoor, Francky; Chatterjee, Abhijit; Singh, Adit D.; Wunderlich, Hans-Joachim; Karimi, Naghmeh (2018)

Testing Resistive Memories: Where are We and What is Missing? - Fieback, Moritz; Taouil, Mottaqiallah; Hamdioui, Said (2018)

Electrical Modeling of STT-MRAM Defects. - Wu, Lizhou; Taouil, Mottaqiallah; Rao, Siddharth; Marinissen, Erik Jan; Hamdioui, Said (2018)

Ionizing radiation modeling in DRAM transistors. - Fieback, Moritz; Taouil, Mottaqiallah; Hamdioui, Said; Rovatti, Marco (2018)

Resistive Random Access Memory Variability and Its Mitigation Schemes. - Pouyan, Peyman; Amat, Esteve; Hamdioui, Said; Rubio, Antonio (J. Low Power Electron., 2017)

Editorial. - Chakrabarty, Krishnendu; Alioto, Massimo; Baas, Bevan M.; Boon, Chirn Chye; Chang, Meng-Fan; Chang, Naehyuck; Chang, Yao-Wen; Chang, Chip-Hong; Chang, Shih-Chieh; Chen, Poki; Chowdhury, Masud H.; Corsonello, Pasquale; et al. (IEEE Trans. Very Large Scale Integr. Syst., 2017)

Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier. - Agbo, Innocent; Taouil, Mottaqiallah; Kraak, Daniel; Hamdioui, Said; Kukner, Halil; Weckx, Pieter; Raghavan, Praveen; Catthoor, Francky (IEEE Trans. Very Large Scale Integr. Syst., 2017)

On the Implementation of Computation-in-Memory Parallel Adder. - Nguyen, Hoang Anh Du; Xie, Lei; Taouil, Mottaqiallah; Nane, Razvan; Hamdioui, Said; Bertels, Koen (IEEE Trans. Very Large Scale Integr. Syst., 2017)

Impact and Mitigation of Sense Amplifier Aging Degradation Using Realistic Workloads. - Kraak, Daniel; Taouil, Mottaqiallah; Agbo, Innocent; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky (IEEE Trans. Very Large Scale Integr. Syst., 2017)

Test and Reliability of Emerging Non-volatile Memories. - Hamdioui, Said; Pouyan, Peyman; Li, Huawei; Wang, Ying; Raychowdhury, Arijit; Yoon, Insik (2017)

Memristor for computing: Myth or reality? - Hamdioui, Said; Kvatinsky, Shahar; Cauwenberghs, Gert; Xie, Lei; Wald, Nimrod; Joshi, Siddharth; Elsayed, Hesham Mostafa; Corporaal, Henk; Bertels, Koen (2017)

Mitigation of sense amplifier degradation using input switching. - Kraak, Daniel; Agbo, Innocent; Taouil, Mottaqiallah; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky; Dehaene, Wim (2017)

On the robustness of memristor based logic gates. - Xie, Lei; Nguyen, Hoang Anh Du; Yu, Jintao; Taouil, Mottaqiallah; Hamdioui, Said (2017)

Region based containers - A new paradigm for the analysis of fault tolerant networks. - Joshi, Prashant D.; Sen, Arunabha; Hsu, D. Frank; Hamdioui, Said; Bertels, Koen (2017)

Memristive devices: Technology, design automation and computing frontiers. - Barbareschi, Mario; Bosio, Alberto; Nguyen, Hoang Anh Du; Hamdioui, Said; Traiola, Marcello; Vatajelu, Elena-Ioana (2017)

Interconnect networks for resistive computing architectures. - Nguyen, Hoang Anh Du; Xie, Lei; Yu, Jintao; Taouil, Mottaqiallah; Hamdioui, Said (2017)

Standards-based tools and services for building lifelong learning pathways. - Sgouropoulou, Cleo; Voyiatzis, Ioannis; Koutoumanos, Anastasios; Hamdioui, Said; Pouyan, Peyman; Comte, M.; Prinetto, Paolo; Farulla, Giuseppe Airo; Ellervee, Peeter; Kloos, Carlos Delgado; García, Raquel M. Crespo (2017)

Tight Bounds in Message Delays Despite Faults in a Class of Line Digraph Networks. - Joshi, Prashant D.; Hsu, D. Frank; Sen, Arunabha; Hamdioui, Said; Bertels, Koen (2017)

Scouting Logic: A Novel Memristor-Based Logic Design for Resistive Computing. - Xie, Lei; Nguyen, Hoang Anh Du; Yu, Jintao; Kaichouhi, Ali; Taouil, Mottaqiallah; AlFailakawi, Mohammad; Hamdioui, Said (2017)

Memristive devices for computing: Beyond CMOS and beyond von Neumann. - Nguyen, Hoang Anh Du; Yu, Jintao; Xie, Lei; Taouil, Mottaqiallah; Hamdioui, Said; Fey, Dietmar (2017)

Editorial Note on Memristor Models, Circuits and Architectures. - Sirakoulis, Georgios Ch.; Hamdioui, Said (Int. J. Unconv. Comput., 2016)

SIERRA - Simulation environment for memory redundancy algorithms. - Scionti, Alberto; Mazumdar, Somnath; Carlo, Stefano Di; Hamdioui, Said (Simul. Model. Pract. Theory, 2016)

Alternative Architectures Toward Reliable Memristive Crossbar Memories. - Vourkas, Ioannis; Stathis, Dimitrios; Sirakoulis, Georgios Ch.; Hamdioui, Said (IEEE Trans. Very Large Scale Integr. Syst., 2016)

Comparative BTI analysis for various sense amplifier designs. - Agbo, Innocent; Taouil, Mottaqiallah; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Raghavan, Praveen; Catthoor, Francky (2016)

Boolean logic gate exploration for memristor crossbar. - Xie, Lei; Nguyen, Hoang Anh Du; Taouil, Mottaqiallah; Hamdioui, Said; Bertels, Koen (2016)

Read path degradation analysis in SRAM. - Agbo, Innocent; Taouil, Mottaqiallah; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky; Dehaene, Wim (2016)

ETS 2016 foreword. - Hamdioui, Said; Natale, Giorgio Di; Kruseman, Bram; Michael, Maria K.; Stratigopoulos, Haralampos-G. D. (2016)

Non-volatile look-up table based FPGA implementations. - Xie, Lei; Nguyen, Hoang Anh Du; Taouil, Mottaqiallah; Hamdioui, Said; Bertels, Koen; AlFailakawi, Mohammad (2016)

Parallel matrix multiplication on memristor-based computation-in-memory architecture. - Haron, Adib; Yu, Jintao; Nane, Razvan; Taouil, Mottaqiallah; Hamdioui, Said; Bertels, Koen (2016)

Instruction cache aging mitigation through Instruction Set Encoding. - Gebregiorgis, Anteneh; Oboril, Fabian; Tahoori, Mehdi Baradaran; Hamdioui, Said (2016)

Quantification of Sense Amplifier Offset Voltage Degradation due to Zero-and Run-Time Variability. - Agbo, Innocent; Taouil, Mottaqiallah; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Raghavan, Praveen; Catthoor, Francky; Dehaene, Wim (2016)

Synthesizing HDL to memristor technology: A generic framework. - Nguyen, Hoang Anh Du; Xie, Lei; Taouil, Mottaqiallah; Hamdioui, Said; Bertels, Koen (2016)

Skeleton-based design and simulation flow for Computation-in-Memory architectures. - Yu, Jintao; Nane, Razvan; Haron, Adib; Hamdioui, Said; Corporaal, Henk; Bertels, Koen (2016)

RRAM variability and its mitigation schemes. - Pouyan, Peyman; Amat, Esteve; Hamdioui, Said; Rubio, Antonio (2016)

Dependable Multicore Architectures at Nanoscale: The View From Europe. - Ottavi, Marco; Pontarelli, Salvatore; Gizopoulos, Dimitris; Bolchini, Cristiana; Michael, Maria K.; Anghel, Lorena; Tahoori, Mehdi Baradaran; Paschalis, Antonis M.; Reviriego, Pedro; Bringmann, Oliver; Izosimov, Viacheslav; Manhaeve, Hans A. R.; et al. (IEEE Des. Test, 2015)

A DfT Architecture and Tool Flow for 3-D SICs With Test Data Compression, Embedded Cores, and Multiple Towers. - Papameletis, Christos; Keller, Brion L.; Chickermane, Vivek; Hamdioui, Said; Marinissen, Erik Jan (IEEE Des. Test, 2015)

Testing Open Defects in Memristor-Based Memories. - Hamdioui, Said; Taouil, Mottaqiallah; Haron, Nor Zaidi (IEEE Trans. Computers, 2015)

Intelligent Voltage Ramp-Up Time Adaptation for Temperature Noise Reduction on Memory-Based PUF Systems. - Cortez, Mafalda; Hamdioui, Said; Kaichouhi, Ali; Leest, Vincent van der; Maes, Roel; Schrijen, Geert Jan (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015)

Post-Bond Interconnect Test and Diagnosis for 3-D Memory Stacked on Logic. - Taouil, Mottaqiallah; Masadeh, Mahmoud; Hamdioui, Said; Marinissen, Erik Jan (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015)

Yield Improvement for 3D Wafer-to-Wafer Stacked ICs Using Wafer Matching. - Taouil, Mottaqiallah; Hamdioui, Said; Marinissen, Erik Jan (ACM Trans. Design Autom. Electr. Syst., 2015)

Aging mitigation in memory arrays using self-controlled bit-flipping technique. - Gebregiorgis, Anteneh; Ebrahimi, Mojtaba; Kiamehr, Saman; Oboril, Fabian; Hamdioui, Said; Tahoori, Mehdi Baradaran (2015)

Memristor based computation-in-memory architecture for data-intensive applications. - Hamdioui, Said; Xie, Lei; Nguyen, Hoang Anh Du; Taouil, Mottaqiallah; Bertels, Koen; Corporaal, Henk; Jiao, Hailong; Catthoor, Francky; Wouters, Dirk J.; Linn, Eike; Lunteren, Jan van (2015)

Comparative analysis of RD and Atomistic trap-based BTI models on SRAM Sense Amplifier. - Agbo, Innocent; Taouil, Mottaqiallah; Hamdioui, Said; Cosemans, Stefan; Weckx, Pieter; Raghavan, Praveen; Catthoor, Francky (2015)

Electronics and computing in nano-era: The good, the bad and the challenging. - Hamdioui, Said (2015)

On resistive open defect detection in DRAMs: The charge accumulation effect. - Sfikas, Yiorgos; Tsiatouhas, Yiorgos; Taouil, Mottaqiallah; Hamdioui, Said (2015)

Fast boolean logic mapped on memristor crossbar. - Xie, Lei; Nguyen, Hoang Anh Du; Taouil, Mottaqiallah; Bertels, Koen; Hamdioui, Said (2015)

Keynote 2: "Computing for big-data: Beyond CMOS and beyond Von-Neumann". - Hamdioui, Said (2015)

BTI analysis of SRAM write driver. - Agbo, Innocent; Taouil, Mottaqiallah; Hamdioui, Said; Weckx, Pieter; Cosemans, Stefan; Catthoor, Francky (2015)

SW-based transparent in-field memory testing. - Bernardi, Paolo; Brasca, Lyl M. Ciganda; Reorda, Matteo Sonza; Hamdioui, Said (2015)

Design dependent SRAM PUF robustness analysis. - Cortez, Mafalda; Hamdioui, Said; Ishihara, Ryoichi (2015)

Computation-in-memory based parallel adder. - Nguyen, Hoang Anh Du; Xie, Lei; Taouil, Mottaqiallah; Nane, Razvan; Hamdioui, Said; Bertels, Koen (2015)

Interconnect networks for memristor crossbar. - Xie, Lei; Nguyen, Hoang Anh Du; Taouil, Mottaqiallah; Hamdioui, Said; Bertels, Koen (2015)

Computation in Memory for Data-Intensive Applications: Beyond CMOS and beyond Von- Neumann. - Hamdioui, Said (2015)

Integral impact of BTI and voltage temperature variation on SRAM sense amplifier. - Agbo, Innocent; Taouil, Mottaqiallah; Hamdioui, Said; Kukner, Halil; Weckx, Pieter; Raghavan, Praveen; Catthoor, Francky (2015)

Testing Methods for PUF-Based Secure Key Storage Circuits. - Cortez, Mafalda; Roelofs, Gijs; Hamdioui, Said; Natale, Giorgio Di (J. Electron. Test., 2014)

Layout-Based Refined NPSF Model for DRAM Characterization and Testing. - Sfikas, Yiorgos; Tsiatouhas, Yiorgos; Hamdioui, Said (IEEE Trans. Very Large Scale Integr. Syst., 2014)

Region Disjoint Paths in a Class of Optimal Line Graph Networks. - Joshi, Prashant D.; Sen, Arunabha; Hamdioui, Said; Bertels, Koen (2014)

Testing PUF-based secure key storage circuits. - Cortez, Mafalda; Roelofs, Gijs; Hamdioui, Said; Natale, Giorgio Di (2014)

Hacking and protecting IC hardware. - Hamdioui, Said; Danger, Jean-Luc; Natale, Giorgio Di; Smailbegovic, Fethulah; Battum, Gerard van; Tehranipoor, Mark (2014)

Bias Temperature Instability analysis of FinFET based SRAM cells. - Khan, Seyab; Agbo, Innocent; Hamdioui, Said; Kukner, Halil; Kaczer, Ben; Raghavan, Praveen; Catthoor, Francky (2014)

Interconnect test for 3D stacked memory-on-logic. - Taouil, Mottaqiallah; Masadeh, Mahmoud; Hamdioui, Said; Marinissen, Erik Jan (2014)

Security methods in fault tolerant modified line graph based networks. - Joshi, Prashant D.; Hamdioui, Said (2014)

Shortest path reduction in a class of uniform fault tolerant networks. - Joshi, Prashant D.; Hamdioui, Said (2014)

3D/ 2.5D stacked IC cost modeling and test flow selection. - Hamdioui, Said (2014)

Memristor based memories: Technology, design and test. - Hamdioui, Said; Aziza, Hassan; Sirakoulis, Georgios Ch. (2014)

Line graph based fast rerouting and reconfiguration for handling transient and permanent node failures. - Joshi, Prashant D.; Hamdioui, Said (2014)

Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface. - Marinissen, Erik Jan; Wachter, Bart De; Smith, Ken; Kiesewetter, Jorg; Taouil, Mottaqiallah; Hamdioui, Said (2014)

Quality versus cost analysis for 3D Stacked ICs. - Taouil, Mottaqiallah; Hamdioui, Said; Marinissen, Erik Jan (2014)

Guest Editorial - Special Issue on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN). - Gizopoulos, Dimitris; Hamdioui, Said; Manhaeve, Hans A. R. (J. Electron. Test., 2013)

Using 3D-COSTAR for 2.5D test cost optimization. - Taouil, Mottaqiallah; Hamdioui, Said; Marinissen, Erik Jan; Bhawmik, Sudipta (2013)

An Efficient Method for the Test of Embedded Memory Cores during the Operational Phase. - Bernardi, Paolo; Ciganda, Lyl M.; Reorda, Matteo Sonza; Hamdioui, Said (2013)

Reliability challenges of real-time systems in forthcoming technology nodes. - Hamdioui, Said; Nicolaidis, Michael; Gizopoulos, Dimitris; Grasset, Arnaud; Groeseneken, Guido; Bonnot, Philippe (2013)

Is TSV-based 3D integration suitable for inter-die memory repair? - Lefter, Mihai; Voicu, George Razvan; Taouil, Mottaqiallah; Enachescu, Marius; Hamdioui, Said; Cotofana, Sorin Dan (2013)

Impact of mid-bond testing in 3D stacked ICs. - Taouil, Mottaqiallah; Hamdioui, Said; Marinissen, Erik Jan; Bhawmik, Sudipta (2013)

Panel session what is the electronics industry doing to win the battle against the expected scary failure rates in future technology nodes? - Hamdioui, Said; Appello, Davide; Grasset, Arnaud; Gu, Xinli; Kruseman, Bram; Mariani, Riccardo; Obermeir, Hermann; Venkataraman, Srikanth (2013)

Bias temperature instability analysis in SRAM decoder. - Khan, Seyab; Hamdioui, Said; Kukner, Halil; Raghavan, Praveen; Catthoor, Francky (2013)

Automated DfT insertion and test generation for 3D-SICs with embedded cores and multiple towers. - Papameletis, Christos; Keller, Brion L.; Chickermane, Vivek; Marinissen, Erik Jan; Hamdioui, Said (2013)

Adapting voltage ramp-up time for temperature noise reduction on memory-based PUFs. - Cortez, Mafalda; Hamdioui, Said; Leest, Vincent van der; Maes, Roel; Schrijen, Geert Jan (2013)

BTI impact on SRAM sense amplifier. - Agbo, Innocent; Khan, Seyab; Hamdioui, Said (2013)

Impact of partial resistive defects and Bias Temperature Instability on SRAM decoder reliablity. - Khan, Seyab; Taouil, Mottaqiallah; Hamdioui, Said; Kukner, Halil; Raghavan, Praveen; Catthoor, Francky (2013)

Reducing random-dopant fluctuation impact on core-speed and power variability in many-core platforms. - Majzoub, Sohaib; Al-Ars, Zaid; Hamdioui, Said (2013)

Exploring test opportunities for memory and interconnects in 3D ICs. - Taouil, Mottaqiallah; Lefter, Mihai; Hamdioui, Said (2013)

Test Impact on the Overall Die-to-Wafer 3D Stacked IC Cost. - Taouil, Mottaqiallah; Hamdioui, Said; Beenakker, Kees; Marinissen, Erik Jan (J. Electron. Test., 2012)

Yield Improvement for 3D Wafer-to-Wafer Stacked Memories. - Taouil, Mottaqiallah; Hamdioui, Said (J. Electron. Test., 2012)

DfT schemes for resistive open defects in RRAMs. - Haron, Nor Zaidi; Hamdioui, Said (2012)

TSV based 3D stacked ICs: Opportunities and challenges. - Hamdioui, Said (2012)

BTI impact on logical gates in nano-scale CMOS technology. - Khan, Seyab; Hamdioui, Said; Kukner, Halil; Raghavan, Praveen; Catthoor, Francky (2012)

Modeling SRAM start-up behavior for Physical Unclonable Functions. - Cortez, Mafalda; Dargar, Apurva; Hamdioui, Said; Schrijen, Geert Jan (2012)

Incorporating parameter variations in BTI impact on nano-scale logical gates analysis. - Khan, Seyab; Hamdioui, Said; Kukner, Halil; Raghavan, Praveen; Catthoor, Francky (2012)

On optimizing test cost for Wafer-to-Wafer 3D-stacked ICs. - Taouil, Mottaqiallah; Hamdioui, Said (2012)

ALU based address generation for RAMs. - Voyiatzis, Ioannis; Efstathiou, Costas; Hamdioui, Said; Sgouropoulou, Cleo (2012)

VLSI Test technology: Why is the field not sexy enough? - Hamdioui, Said; Aitken, Rob (2012)

Testing Embedded Memories: A Survey. - Hamdioui, Said (2012)

Redundant Residue Number System Code for Fault-Tolerant Hybrid Memories. - Haron, Nor Zaidi; Hamdioui, Said (ACM J. Emerg. Technol. Comput. Syst., 2011)

A New Test Paradigm for Semiconductor Memories in the Nano-Era. - Hamdioui, Said; Krishnaswami, Venkataraman; Irobi, Ijeoma Sandra; Al-Ars, Zaid (2011)

On Defect Oriented Testing for Hybrid CMOS/Memristor Memory. - Haron, Nor Zaidi; Hamdioui, Said (2011)

Testing for Parasitic Memory Effect in SRAMs. - Irobi, Sandra; Al-Ars, Zaid; Hamdioui, Said; Thibeault, Claude (2011)

Yield Improvement and Test Cost Optimization for 3D Stacked ICs. - Hamdioui, Said; Taouil, Mottaqiallah (2011)

Cost-efficient fault-tolerant decoder for hybrid nanoelectronic memories. - Haron, Nor Zaidi; Hamdioui, Said (2011)

Influence of parasitic memory effect on single-cell faults in SRAMs. - Irobi, Sandra; Al-Ars, Zaid; Hamdioui, Said; Renovell, Michel (2011)

Stacking order impact on overall 3D die-to-wafer Stacked-IC cost. - Taouil, Mottaqiallah; Hamdioui, Said (2011)

NBTI Monitoring and Design for Reliability in Nanoscale Circuits. - Khan, Seyab; Haron, Nor Zaidi; Hamdioui, Said; Catthoor, Francky (2011)

Reducing Test Power for Embedded Memories. - Awad, Ahmed; Abu-Issa, Abdallatif S.; Hamdioui, Said (2011)

A Schematic-Based Extraction Methodology for Dislocation Defects in Analog/Mixed-Signal Devices. - Rai, Nivesh; Hashempour, Hamidreza; Xing, Yizi; Kruseman, Bram; Hamdioui, Said (2011)

Layer Redundancy Based Yield Improvement for 3D Wafer-to-Wafer Stacked Memories. - Taouil, Mottaqiallah; Hamdioui, Said (2011)

Memory Test Optimization for Parasitic Bit Line Coupling in SRAMs. - Irobi, Sandra; Al-Ars, Zaid; Hamdioui, Said (2011)

On modeling and optimizing cost in 3D Stacked-ICs. - Taouil, Mottaqiallah; Hamdioui, Said; Marinissen, Erik Jan (2011)

ReverseAge: An online NBTI combating technique using time borrowing. - Khan, Seyab; Hamdioui, Said (2011)

Modeling and mitigating NBTI in nanoscale circuits. - Khan, Seyab; Hamdioui, Said (2011)

Generic, orthogonal and low-cost March Element based memory BIST. - Goor, Ad J. van de; Hamdioui, Said; Kukner, Halil (2011)

Test Cost Analysis for 3D Die-to-Wafer Stacking. - Taouil, Mottaqiallah; Hamdioui, Said; Beenakker, Kees; Marinissen, Erik Jan (2010)

Memory testing with a RISC microcontroller. - Goor, Ad J. van de; Gaydadjiev, Georgi; Hamdioui, Said (2010)

NBTI modeling in the framework of temperature variation. - Seyab; Hamdioui, Said (2010)

Advanced embedded memory testing: Reducing the defect per million level at lower test cost. - Hamdioui, Said; Goor, Ad J. van de (2010)

Using a CISC microcontroller to test embedded memories. - Goor, Ad J. van de; Hamdioui, Said; Gaydadjiev, Georgi (2010)

Low-cost, customized and flexible SRAM MBIST engine. - Goor, Ad J. van de; Jung, Christian; Hamdioui, Said; Gaydadjiev, Georgi (2010)

High-Performance Cluster-Fault Tolerance Scheme for Hybrid Nanoelectronic Memories. - Haron, Nor Zaidi; Hamdioui, Said (2010)

ECC design for fault-tolerant crossbar memories: A case study. - Haron, Nor Zaidi; Hamdioui, Said; Ahyadi, Zaiyan (2010)

MBIST architecture framework based on orthogonal constructs. - Goor, Ad J. van de; Hamdioui, Said (2010)

Temperature dependence of NBTI induced delay. - Khan, Seyab; Hamdioui, Said (2010)

On maximizing the compound yield for 3D Wafer-to-Wafer stacked ICs. - Taouil, Mottaqiallah; Hamdioui, Said; Verbree, Jouke; Marinissen, Erik Jan (2010)

Detecting memory faults in the presence of bit line coupling in SRAM devices. - Irobi, Sandra; Al-Ars, Zaid; Hamdioui, Said (2010)

Bit line coupling memory tests for single-cell fails in SRAMs. - Irobi, Sandra; Al-Ars, Zaid; Hamdioui, Said (2010)

Instruction-Level Fault Tolerance Configurability. - Borodin, Demid; Juurlink, Ben H. H.; Hamdioui, Said; Vassiliadis, Stamatis (J. Signal Process. Syst., 2009)

Testing Embedded Memories in the Nano-Era: Will the Existing Approaches Survive?. - Hamdioui, Said (2009)

New Algorithms for Address Decoder Delay Faults and Bit Line Imbalance Faults. - Goor, Ad J. van de; Hamdioui, Said; Gaydadjiev, Georgi Nedeltchev; Al-Ars, Zaid (2009)

Fault Diagnosis Using Test Primitives in Random Access Memories. - Al-Ars, Zaid; Hamdioui, Said (2009)

Using RRNS Codes for Cluster Faults Tolerance in Hybrid Memories. - Haron, Nor Zaidi; Hamdioui, Said (2009)

Residue-based code for reliable hybrid memories. - Haron, Nor Zaidi; Hamdioui, Said (2009)

Emerging non-CMOS nanoelectronic devices - What are they?. - Haron, Nor Zaidi; Hamdioui, Said; Cotofana, Sorin (2009)

Test Set Development for Cache Memory in Modern Microprocessors. - Al-Ars, Zaid; Hamdioui, Said; Gaydadjiev, Georgi; Vassiliadis, Stamatis (IEEE Trans. Very Large Scale Integr. Syst., 2008)

Defect Oriented Testing of the Strap Problem Under Process Variations in DRAMs. - Al-Ars, Zaid; Hamdioui, Said; Goor, Ad J. van de; Mueller, Georg (2008)

Manifestation of Precharge Faults in High Speed DRAM Devices. - Al-Ars, Zaid; Hamdioui, Said; Gaydadjiev, Georgi (2007)

PPM Reduction on Embedded Memories in System on Chip. - Hamdioui, Said; Al-Ars, Zaid; Jiménez, Javier; Calero, Jose (2007)

Optimizing Test Length for Soft Faults in DRAM Devices. - Al-Ars, Zaid; Hamdioui, Said; Gaydadjiev, Georgi (2007)

Opens and Delay Faults in CMOS RAM Address Decoders. - Hamdioui, Said; Al-Ars, Zaid; Goor, Ad J. van de (IEEE Trans. Computers, 2006)

Influence of Bit-Line Coupling and Twisting on the Faulty Behavior of DRAMs. - Al-Ars, Zaid; Hamdioui, Said; Goor, Ad J. van de; Al-Harbi, Sultan M. (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006)

Space of DRAM fault models and corresponding testing. - Al-Ars, Zaid; Hamdioui, Said; Goor, Ad J. van de (2006)

DRAM-Specific Space of Memory Tests. - Al-Ars, Zaid; Hamdioui, Said; Goor, Ad J. van de; Gaydadjiev, Georgi; Vollrath, Jörg E. (2006)

New data-background sequences and their industrial evaluation for word-oriented random-access memories. - Hamdioui, Said; Reyes, John Eleazar Q. Delos (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2005)

Investigations of Faulty DRAM Behavior Using Electrical Simulation Versus an Analytical Approach. - Al-Ars, Zaid; Hamdioui, Said; Vollrath, Jörg E. (2005)

Framework for Fault Analysis and Test Generation in DRAMs. - Al-Ars, Zaid; Hamdioui, Said; Mueller, Georg; Goor, Ad J. van de (2005)

Impact of stresses on the fault coverage of memory tests. - Hamdioui, Said; Al-Ars, Zaid; Goor, Ad J. van de; Wadsworth, Rob (2005)

Memory Fault Modeling Trends: A Case Study. - Hamdioui, Said; Wadsworth, Rob; Reyes, John Delos; Goor, Ad J. van de (J. Electron. Test., 2004)

Linked faults in random access memories: concept, fault models, test algorithms, and industrial results. - Hamdioui, Said; Al-Ars, Zaid; Goor, Ad J. van de; Rodgers, Mike (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2004)

Evaluation of Intra-Word Faults in Word-Oriented RAMs. - Hamdioui, Said; Reyes, John Delos; Al-Ars, Zaid (2004)

Tests for address decoder delay faults in RAMs due to inter-gate opens. - Goor, Ad J. van de; Hamdioui, Said; Al-Ars, Zaid (2004)

Detecting Faults in the Peripheral Circuits and an Evaluation of SRAM Tests. - Goor, Ad J. van de; Hamdioui, Said; Wadsworth, Rob (2004)

The Effectiveness of the Scan Test and Its New Variants. - Goor, Ad J. van de; Hamdioui, Said; Al-Ars, Zaid (2004)

The State-of-Art and Future Trends in Testing Embedded Memories. - Hamdioui, Said; Gaydadjiev, Georgi; Goor, Ad J. van de (2004)

Effects of Bit Line Coupling on the Faulty Behavior of DRAMs. - Al-Ars, Zaid; Hamdioui, Said; Goor, Ad J. van de (2004)

Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests. - Hamdioui, Said; Al-Ars, Zaid; Goor, Ad J. van de; Rodgers, Mike (J. Electron. Test., 2003)

March SL: A Test For All Static Linked Memory Faults. - Hamdioui, Said; Al-Ars, Zaid; Goor, Ad J. van de; Rodgers, Mike (2003)

Importance of dynamic faults for new SRAM technologies. - Hamdioui, Said; Wadsworth, Rob; Reyes, John Delos; Goor, Ad J. van de (2003)

A Fault Primitive Based Analysis of Linked Faults in RAMs. - Al-Ars, Zaid; Hamdioui, Said; Goor, Ad J. van de (2003)

Detecting Intra-Word Faults in Word-Oriented Memories. - Hamdioui, Said; Goor, Ad J. van de; Rodgers, Mike (2003)

Efficient Tests for Realistic Faults in Dual-Port SRAMs. - Hamdioui, Said; Goor, Ad J. van de (IEEE Trans. Computers, 2002)

Thorough testing of any multiport memory with linear tests. - Hamdioui, Said; Goor, Ad J. van de (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2002)

March SS: A Test for All Static Simple RAM Faults. - Hamdioui, Said; Goor, Ad J. van de; Rodgers, Mike (2002)

Testing Static and Dynamic Faults in Random Access Memories. - Hamdioui, Said; Al-Ars, Zaid; Goor, Ad J. van de (2002)

Detecting Unique Faults in Multi-port SRAMs. - Hamdioui, Said; Goor, Ad J. van de; Eastwick, David; Rodgers, Mike (2001)

Realistic Fault Models and Test Procedures for Multi-Port SRAMs. - Hamdioui, Said; Goor, Ad J. van de; Eastwick, David; Rodgers, Mike (2001)

Testing Address Decoder Faults in Two-Port Memories: Fault Models, Tests, Consequences of Port Restrictions, and Test Strategy. - Hamdioui, Said; Goor, Ad J. van de (J. Electron. Test., 2000)

An experimental analysis of spot defects in SRAMs: realistic fault models and tests. - Hamdioui, Said; Goor, Ad J. van de (2000)

March Tests for Realistic Faults in Two-Port Memories. - Hamdioui, Said; Goor, Ad J. van de; Rodgers, Mike; Eastwick, David (2000)

March Tests for Word-Oriented Two-Port Memories. - Hamdioui, Said; Goor, Ad J. van de (1999)

Port interference faults in two-port memories. - Hamdioui, Said; Goor, Ad J. van de (1999)

Consequences of Port Restriction on Testing Address Decoders in Two-Port Memories. - Hamdioui, Said; Goor, Ad J. van de (1998)

Consequences of port restrictions on testing two-port memories. - Hamdioui, Said; Goor, Ad J. van de (1998)

Fault Models and Tests for Two-Port Memories. - Goor, Ad J. van de; Hamdioui, Said (1998)