BibTeX records: V. V. Afanasev

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@article{DBLP:journals/mj/LahaBDSBASFO09,
  author       = {Apurba Laha and
                  E. Bugiel and
                  Rytis Dargis and
                  Dominik Schwendt and
                  M. Badylevich and
                  V. V. Afanasev and
                  A. Stesmans and
                  Andreas Fissel and
                  H. J{\"{o}}rg Osten},
  title        = {Integration of low dimensional crystalline Si into functional epitaxial
                  oxides},
  journal      = {Microelectron. J.},
  volume       = {40},
  number       = {3},
  pages        = {633--637},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.mejo.2008.06.064},
  doi          = {10.1016/J.MEJO.2008.06.064},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mj/LahaBDSBASFO09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/FedorenkoTASZC05,
  author       = {Y. G. Fedorenko and
                  L. Truong and
                  V. V. Afanasev and
                  A. Stesmans and
                  Z. Zhang and
                  Stephen A. Campbell},
  title        = {Impact of nitrogen incorporation on interface states in (100)Si/HfO\({}_{\mbox{2}}\)},
  journal      = {Microelectron. Reliab.},
  volume       = {45},
  number       = {5-6},
  pages        = {802--805},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.microrel.2004.11.044},
  doi          = {10.1016/J.MICROREL.2004.11.044},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/FedorenkoTASZC05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/TruongFAS05,
  author       = {L. Truong and
                  Y. G. Fedorenko and
                  V. V. Afanasev and
                  A. Stesmans},
  title        = {Admittance spectroscopy of traps at the interfaces of (100)Si with
                  Al\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\), ZrO\({}_{\mbox{2}}\), and HfO\({}_{\mbox{2}}\)},
  journal      = {Microelectron. Reliab.},
  volume       = {45},
  number       = {5-6},
  pages        = {823--826},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.microrel.2004.11.039},
  doi          = {10.1016/J.MICROREL.2004.11.039},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/TruongFAS05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}