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2020 – today
- 2023
[j24]Maylis Lavayssière
, Alexandre Lefrançois, Bernard Crabos, Marc Genetier, Maxime Daudy, Sacha Comte, Alan Dufourmentel, Bruno Salsac, Frédéric Sol, Pascal Verdier, Patrick Pons:
Toward Improvements in Pressure Measurements for Near Free-Field Blast Experiments. Sensors 23(12): 5635 (2023)- [j23]Antony Coustou, Alexandre Lefrançois, Patrick Pons, Yohan Barbarin:
Capacitive Effect and Electromagnetic Coupling on Manganin Gauge Limiting the Bandwidth for Pressure Measurements under Shock Conditions. Sensors 23(14): 6583 (2023) - 2022
- [j22]Mathieu Chalnot, Patrick Pons, Hervé Aubert:
Frequency Bandwidth of Pressure Sensors Dedicated to Blast Experiments. Sensors 22(10): 3790 (2022) - [j21]Kevin Sanchez, Bilel Achour, Antony Coustou, Aurélie Lecestre, Samuel Charlot, Maylis Lavayssière, Alexandre Lefrançois, Hervé Aubert, Patrick Pons:
Transient Response of Miniature Piezoresistive Pressure Sensor Dedicated to Blast Wave Monitoring. Sensors 22(24): 9571 (2022) - 2021
- [j20]Julien Philippe, Muriel Ferry, Samuel Charlot, Sandrine Assié, Aurélie Lecestre, Guillaume Libaude, André Ferrand, Patrick Pons, Hervé Aubert:
Microelectromechanical Transducer to Monitor High-Doses of Nuclear Irradiation. Sensors 21(17): 5912 (2021)
2010 – 2019
- 2019
- [j19]Julien Philippe, Maria Valeria De Paolis, Dominique Henry, Alexandre Rumeau, Antony Coustou, Patrick Pons, Hervé Aubert:
In-Situ Wireless Pressure Measurement Using Zero-Power Packaged Microwave Sensors. Sensors 19(6): 1263 (2019) - [c10]Dominique Henry, Hervé Aubert, Patrick Pons:
Radar Imaging Approach for Zero-Power Millimeter-Wave Wireless Sensors. RFID-TA 2019: 89-94 - 2018
- [c9]Nizar Habbachi, Ali Boukabache, Hatem Boussetta, Patrick Pons, Mohamed Adel Kallala, Kamel Besbes:
Design and Simulation of a 10 GHz VCO Using an RF MEMS Solenoid Inductor. SSD 2018: 420-424 - [c8]Nizar Habbachi, Ali Boukabache, Hatem Boussetta, Patrick Pons, Mohamed Adel Kallala, Kamel Besbes:
Modeling of Microfluidically Tuned Capacitor for RF Applications. SSD 2018: 816-820 - 2016
- [c7]Emilie Debourg, Julien Philippe, Hervé Aubert, Patrick Pons, Izabela Augustyniak, Pawel Knapkiewicz, Jan A. Dziuban, Michal Matusiak, Michal Olszacki:
Wireless hydrogen pressure dosimeter for nuclear high dose monitoring. IEEE SENSORS 2016: 1-3 - [c6]Jérémie Fourmann, Antony Coustou, Hervé Aubert, Patrick Pons, Jérôme Luc, Alexandre Lefrançois, Maylis Lavayssière, Antoine Osmont:
Wireless pressure measurement in air blast using PVDF sensors. IEEE SENSORS 2016: 1-3 - 2013
- [j18]Hervé Aubert, Franck Chebila, Mehdi Jatlaoui, Trang T. Thai, Hamida Hallil, Anya Traille, Sofiene Bouaziz, Ayoub Rifaï, Patrick Pons, Philippe Ménini, Manos M. Tentzeris:
Wireless sensing and identification based on radar cross section variability measurement of passive electromagnetic sensors. Ann. des Télécommunications 68(7-8): 425-435 (2013) - 2012
- [c5]Hervé Aubert, Franck Chebila, Mehdi Jatlaoui, Trang T. Thai, Hamida Hallil, Anya Traille, Sofiene Bouaziz, Ayoub Rifaï, Patrick Pons, Philippe Ménini, Manos M. Tentzeris:
Wireless sensing and identification of passive electromagnetic sensors based on millimetre-wave FMCW RADAR. RFID-TA 2012: 398-403 - 2011
- [j17]Usama Zaghloul, George J. Papaioannou, Bharat Bhushan, Fabio Coccetti, Patrick Pons, Robert Plana:
On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies. Microelectron. Reliab. 51(9-11): 1810-1818 (2011) - [j16]Usama Zaghloul, George J. Papaioannou, Bharat Bhushan, Fabio Coccetti, Patrick Pons, Robert Plana:
Erratum to "On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies" [MR 51/9-11 (2011) 1810-1818]. Microelectron. Reliab. 51(12): 2416 (2011) - 2010
- [j15]Usama Zaghloul, Matroni Koutsoureli, H. Wang, Fabio Coccetti, George J. Papaioannou, Patrick Pons, Robert Plana:
Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques. Microelectron. Reliab. 50(9-11): 1615-1620 (2010) - [j14]Hicham Youssef, André Ferrand, Pierre-François Calmon, Patrick Pons, Robert Plana:
Methods to improve reliability of bulge test technique to extract mechanical properties of thin films. Microelectron. Reliab. 50(9-11): 1888-1893 (2010) - [i1]Aubin Lecointre, Daniela Dragomirescu, David Dubuc, Katia Grenier, Patrick Pons, Hervé Aubert, A. Muller, Pascal Berthou, Thierry Gayraud, Robert Plana:
Miniaturized wireless sensor network. CoRR abs/1002.0507 (2010)
2000 – 2009
- 2009
- [j13]Usama Zaghloul, George J. Papaioannou, Fabio Coccetti, Patrick Pons, Robert Plana:
Dielectric charging in silicon nitride films for MEMS capacitive switches: Effect of film thickness and deposition conditions. Microelectron. Reliab. 49(9-11): 1309-1314 (2009) - 2008
- [j12]A. Belarni, Mohamed Lamhamdi, Patrick Pons, Laurent Boudou, Jean Guastavino, Y. Segui, George J. Papaioannou, Robert Plana:
Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches. Microelectron. Reliab. 48(8-9): 1232-1236 (2008) - [j11]Jinyu Jason Ruan, E. Papandreou, Mohamed Lamhamdi, Matroni Koutsoureli, Fabio Coccetti, Patrick Pons, George J. Papaioannou, Robert Plana:
Alpha particle radiation effects in RF MEMS capacitive switches. Microelectron. Reliab. 48(8-9): 1241-1244 (2008) - [j10]Mohamed Lamhamdi, Patrick Pons, Usama Zaghloul, Laurent Boudou, Fabio Coccetti, Jean Guastavino, Y. Segui, George J. Papaioannou, Robert Plana:
Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation. Microelectron. Reliab. 48(8-9): 1248-1252 (2008) - 2007
- [j9]E. Papandreou, Mohamed Lamhamdi, C. M. Skoulikidou, Patrick Pons, George J. Papaioannou, Robert Plana:
Structure dependent charging process in RF MEMS capacitive switches. Microelectron. Reliab. 47(9-11): 1812-1817 (2007) - 2006
- [j8]M. A. Exarchos, E. Papandreou, Patrick Pons, Mohamed Lamhamdi, George J. Papaioannou, Robert Plana:
Charging of radiation induced defects in RF MEMS dielectric films. Microelectron. Reliab. 46(9-11): 1695-1699 (2006) - [j7]Mohamed Lamhamdi, Jean Guastavino, Laurent Boudou, Y. Segui, Patrick Pons, Laurent Bouscayrol, Robert Plana:
Charging-Effects in RF capacitive switches influence of insulating layers composition. Microelectron. Reliab. 46(9-11): 1700-1704 (2006) - 2005
- [j6]K. Yacine, F. Flourens, David Bourrier, Ludovic Salvagnac, P. Calmont, Xavier Lafontan, Q.-H. Duong, Lionel Buchaillot, D. Peyrou, Patrick Pons:
Biaxial initial stress characterization of bilayer gold RF-switches. Microelectron. Reliab. 45(9-11): 1776-1781 (2005) - [j5]M. A. Exarchos, V. Theonas, Patrick Pons, George J. Papaioannou, S. Mellé, David Dubuc, Fabio Coccetti, Robert Plana:
Investigation of charging mechanisms in metal-insulator-metal structures. Microelectron. Reliab. 45(9-11): 1782-1785 (2005) - [j4]Q.-H. Duong, Lionel Buchaillot, Dominique Collard, Petra Schmitt, Xavier Lafontan, Patrick Pons, F. Flourens, Francis Pressecq:
Thermal and electrostatic reliability characterization in RF MEMS switches. Microelectron. Reliab. 45(9-11): 1790-1793 (2005) - 2004
- [j3]David Dubuc, M. Saddaoui, S. Mellé, F. Flourens, L. Rabbia, Benoit Ducarouge, Katja Grenier, Patrick Pons, Ali Boukabache, Laurent Bary:
Smart MEMS concept for high secure RF and millimeterwave communications. Microelectron. Reliab. 44(6): 899-907 (2004) - 2003
- [j2]Petra Schmitt, Francis Pressecq, Xavier Lafontan, Q.-H. Duong, Patrick Pons, Jean Marc Nicot, Coumar Oudéa, Daniel Estève, Jean-Yves Fourniols, Henri Camon:
Application of MEMS behavioral simulation to Physics of Failure (PoF) modeling. Microelectron. Reliab. 43(9-11): 1957-1962 (2003) - [c4]Zohir Dibi, Ali Boukabache, Patrick Pons:
Effect of the membrane flatness defect on the offset voltage of a silicon piezoresistive pressure sensor. ICECS 2003: 902-905 - 2000
- [c3]Zohir Dibi, Ali Boukabache, Patrick Pons:
Effect of the silicon membrane flatness defect on the piezoresistive pressure sensor response. ICECS 2000: 853-856
1990 – 1999
- 1999
- [j1]Philippe Ménini, Gabriel Blasquez, Patrick Pons, Xavier Chauffleur, Philippe Dondon, Christian Zardini:
Performances and potentialities of a very simple self-compensated pressure sensor demonstrator. IEEE Trans. Instrum. Meas. 48(6): 1125-1130 (1999) - [c2]Ali Boukabache, Gabriel Blasquez, Patrick Pons, Zohir Dibi:
Study of the thermal drift of the offset voltage of silicon pressure sensor. ICECS 1999: 1051-1054 - [c1]Philippe Ménini, Gabriel Blasquez, Patrick Pons, Cyril Douziech, Patrick Favaro, Philippe Dondon:
Optimization of a BiCMOS integrated transducer for self-compensated capacitive pressure sensor. ICECS 1999: 1059-1063
Coauthor Index
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