Generative Adversarial Network-Based Fault Detection in Semiconductor Equipment with Class-Imbalanced Data - Jeong Eun Choi; Da Hoon Seol; Chan Young Kim; Sang Jeen Hong (Sensors, 2023)

Wafer Type Ion Energy Monitoring Sensor for Plasma Diagnosis - Chansu Han; Yoonsung Koo; Jaehwan Kim; Kwangwook Choi; Sang Jeen Hong (Sensors, 2023)

Fault Detection in the Semiconductor Etch Process Using the Seasonal Autoregressive Integrated Moving Average Modeling - Muhammad Zeeshan Arshad; Javeria Muhammad Nawaz; Sang Jeen Hong (J. Inf. Process. Syst., 2014)

Time Series Fault Prediction in Semiconductor Equipment Using Recurrent Neural Network - Javeria Muhammad Nawaz; Muhammad Zeeshan Arshad; Sang Jeen Hong (Advances in Neural Networks - ISNN 2013 - 10th International Symposium on Neural Networks, Dalian, China, July 4-6, 2013, Proceedings, Part II, 2013)

Endpoint Detection of SiO\(_2\) Plasma Etching Using Expanded Hidden Markov Model - Sung-Ik Jeon; Seung-Gyun Kim; Sang Jeen Hong; Seung Soo Han (Advances in Neural Networks - ISNN 2010, 7th International Symposium on Neural Networks, ISNN 2010, Shanghai, China, June 6-9, 2010, Proceedings, Part II, 2010)

A comparison and analysis of genetic algorithm and particle swarm optimization using neural network models for high efficiency solar cell fabrication processes - Hyun-Soo Kim; Sang Jeen Hong; Seung Soo Han (FUZZ-IEEE 2009, IEEE International Conference on Fuzzy Systems, Jeju Island, Korea, 20-24 August 2009, Proceedings, 2009)

Characterization and Optimization of the Contact Formation for High-Performance Silicon Solar Cells - SungJoon Lee; A. Pandey; DongSeop Kim; Ajeet Rohatgi; Gary S. May; Sang Jeen Hong; Seung Soo Han (Advances in Neural Networks - ISNN 2007, 4th International Symposium on Neural Networks, ISNN 2007, Nanjing, China, June 3-7, 2007, Proceedings, Part III, 2007)

Modeling and Characterization of Plasma Processes Using Modular Neural Network - Seung Soo Han; Dong Sun Seo; Sang Jeen Hong (Advances in Neural Networks - ISNN 2006, Third International Symposium on Neural Networks, Chengdu, China, May 28 - June 1, 2006, Proceedings, Part III, 2006)

Recognition of Plasma-Induced X-Ray Photoelectron Spectroscopy Fault Pattern Using Wavelet and Neural Network - Byungwhan Kim; Sooyoun Kim; Sang Jeen Hong (Advances in Neural Networks - ISNN 2006, Third International Symposium on Neural Networks, Chengdu, China, May 28 - June 1, 2006, Proceedings, Part III, 2006)

Sensitivity Analysis of Plasma Charge-up Monitoring Sensor - SungJoon Lee; Dea-Wha Soh; Sang Jeen Hong (J. Inform. and Commun. Convergence Engineering, 2005)

Characterization of Negative Photoresist Processing by Statistical Design of Experiment (DOE) - Sei-Young Mun; Gwang-Beom Kim; Dea-Wha Soh; Sang Jeen Hong (J. Inform. and Commun. Convergence Engineering, 2005)

Neural-Network-Based Sensor Fusion of Optical Emission and Mass Spectroscopy Data for Real-Time Fault Detection in Reactive Ion Etching - Sang Jeen Hong; Gary S. May (IEEE Trans. Ind. Electron., 2005)

Equalization of a Wireless ATM Channel with Simplified Complex Bilinear Recurrent Neural Network - Dong-Chul Park; Duc-Hoai Nguyen; Sang Jeen Hong; Yunsik Lee (Advances in Natural Computation, First International Conference, ICNC 2005, Changsha, China, August 27-29, 2005, Proceedings, Part I, 2005)