Electrical aging behavioral modeling for reliability analyses of ionizing dose effects on an n-MOS simple current mirror. - Bestory, Corinne; Marc, François; Duzellier, S.; Levi, Hervé (Microelectron. Reliab., 2009)

An Overview of the Applications of a Pulsed Laser System for SEU Testing. - Pouget, Vincent; Fouillat, Pascal; Lewis, Dean; Lapuyade, Hervé; Sarger, L.; Roche, F. M.; Duzellier, S.; Ecoffet, R. (2000)