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2010 – 2019
- 2014
[c29]Taejoong Song, Woojin Rim, Jonghoon Jung, Giyong Yang
, Jaeho Park, Sunghyun Park, Kang-Hyun Baek, Sanghoon Baek, Sang-Kyu Oh, Jinsuk Jung, Sungbong Kim, Gyu-Hong Kim, Jintae Kim, Young-Keun Lee, Kee Sup Kim, Sang-Pil Sim, Jong Shik Yoon, Kyu-Myung Choi:
13.2 A 14nm FinFET 128Mb 6T SRAM with VMIN-enhancement techniques for low-power applications. ISSCC 2014: 232-233- 2013
- [c28]Young Moon Kim, Jun Seomun, Hyung-Ock Kim, Kyung Tae Do, Jung Yun Choi, Kee Sup Kim, Matthias Sauer, Bernd Becker, Subhasish Mitra:
Detection of early-life failures in high-K metal-gate transistors and ultra low-K inter-metal dielectrics. CICC 2013: 1-4 - [c27]Matthias Sauer, Young Moon Kim, Jun Seomun, Hyung-Ock Kim, Kyung Tae Do, Jung Yun Choi, Kee Sup Kim, Subhasish Mitra, Bernd Becker:
Early-life-failure detection using SAT-based ATPG. ITC 2013: 1-10 - 2012
- [c26]Suk-Soo Pyo, Jun-Sung Kim, Jung-Han Kim, Hyun-Taek Jung, Taejoong Song, Cheol-Ha Lee, Gyun-Hong Kim, Young-Keun Lee, Kee Sup Kim:
A 0.65V embedded SDRAM with smart boosting and power management in a 45nm CMOS technology. CICC 2012: 1-4 - [c25]Chungki Oh, Hyung-Ock Kim, Jun Seomun, Wook Kim, Jaehan Jeon, Kyung Tae Do, Hyo-Sig Won, Kee Sup Kim:
Thermal-aware body bias modulation for high performance mobile core. ISOCC 2012: 147-150 - 2011
- [c24]Kee Sup Kim:
Holistic low power solutions for the new world. ISLPED 2011: 65-66 - [c23]Kee Sup Kim, Rob Roy:
Apprentice - VTS edition: Season 4. VTS 2011: 113 - 2010
- [c22]Kee Sup Kim:
Panel 4A: Apprentice - VTS edition: Season 3. VTS 2010: 129 - [c21]Kee Sup Kim:
Panel 12C: Apprentice - VTS edition judging session. VTS 2010: 355
2000 – 2009
- 2009
- [c20]A. Hakan Baba, Kee Sup Kim:
Framework for massively parallel testing at wafer and package test. ICCD 2009: 328-334 - [c19]Kee Sup Kim:
Panel: Apprentice - VTS Edition: Season 2. VTS 2009: 119 - 2008
- [j7]Kee Sup Kim, Ming Zhang:
Hierarchical Test Compression for SoC Designs. IEEE Des. Test Comput. 25(2): 142-148 (2008) - 2007
- [c18]Ming Zhang, T. M. Mak, James W. Tschanz, Kee Sup Kim, Norbert Seifert, Davia Lu:
Design for Resilience to Soft Errors and Variations. IOLTS 2007: 23-28 - 2006
- [j6]Subhasish Mitra, Kee Sup Kim:
XPAND: An Efficient Test Stimulus Compression Technique. IEEE Trans. Computers 55(2): 163-173 (2006) - [j5]Ming Zhang, Subhasish Mitra, T. M. Mak, Norbert Seifert, Nicholas J. Wang, Quan Shi, Kee Sup Kim, Naresh R. Shanbhag, Sanjay J. Patel:
Sequential Element Design With Built-In Soft Error Resilience. IEEE Trans. Very Large Scale Integr. Syst. 14(12): 1368-1378 (2006) - [c17]Bruce Cory, Rohit Kapur, Mick Tegethoff, Mark Kassab, Brion L. Keller, Kee Sup Kim, Dwayne Burek, Steven F. Oakland, Benoit Nadeau-Dostie:
OCI: Open Compression Interface. ITC 2006: 1-4 - [c16]Subhasish Mitra, Ming Zhang, Saad Waqas, Norbert Seifert, Balkaran S. Gill, Kee Sup Kim:
Combinational Logic Soft Error Correction. ITC 2006: 1-9 - [c15]Subhasish Mitra, Ming Zhang, Norbert Seifert, T. M. Mak, Kee Sup Kim:
Soft Error Resilient System Design through Error Correction. VLSI-SoC (Selected Papers) 2006: 143-156 - [c14]Subhasish Mitra, Ming Zhang, Norbert Seifert, T. M. Mak, Kee Sup Kim:
Soft Error Resilient System Design through Error Correction. VLSI-SoC 2006: 332-337 - [c13]Kee Sup Kim, Mohammad Tehranipoor:
Session Abstract. VTS 2006: 292-293 - 2005
- [j4]Subhasish Mitra, Norbert Seifert, Ming Zhang, Quan Shi, Kee Sup Kim:
Subhasish Mitra, Norbert Seifert, Ming Zhang, Quan Shi, Kee Sup Kim. Computer 38(2): 43-52 (2005) - [c12]David J. Leavins, Kee Sup Kim, Subhasish Mitra, Eddie J. Rodriguez:
Robust platform design in advanced VLSI technologies. CICC 2005: 23-30 - [c11]Nic Mokhoff, Yervant Zorian, Kamalesh N. Ruparel, Hao Nham, Francesco Pessolano, Kee Sup Kim:
How to determine the necessity for emerging solutions. DAC 2005: 274-275 - [c10]Kee Sup Kim:
XMAX: a practical and efficient compression architecture. ITC 2005: 2 - [c9]Subhasish Mitra, Ming Zhang, T. M. Mak, Norbert Seifert, Victor Zia, Kee Sup Kim:
Logic soft errors: a major barrier to robust platform design. ITC 2005: 10 - 2004
- [j3]Subhasish Mitra, Kee Sup Kim:
X-compact: an efficient response compaction technique. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(3): 421-432 (2004) - 2003
- [j2]Kee Sup Kim, Subhasish Mitra, Paul G. Ryan:
Delay Defect Characteristics and Testing Strategies. IEEE Des. Test Comput. 20(5): 8-16 (2003) - [c8]Subhasish Mitra, Kee Sup Kim:
XMAX: X-Tolerant Architecture for MAXimal Test Compression. ICCD 2003: 326-330 - [c7]David M. Wu, Mike Lin, Subhasish Mitra, Kee Sup Kim, Anil Sabbavarapu, Talal Jaber, Pete Johnson, Dale March, Greg Parrish:
H-DFT: A Hybrid DFT Architecture For Low-Cost High Quality Structural Testing. ITC 2003: 1229-1238 - 2002
- [c6]Subhasish Mitra, Kee Sup Kim:
X-Compact: An Efficient Response Compaction Technique for Test Cost Reduction. ITC 2002: 311-320 - 2001
- [c5]Kee Sup Kim, Rathish Jayabharathi, Craig Carstens:
SpeedGrade: An RTL Path Delay Fault Simulator. Asian Test Symposium 2001: 239-243 - [c4]Kee Sup Kim, Rathish Jayabharathi, Craig Carstens, Praveen Vishakantaiah, Derek Feltham, Adrian Carbine:
DPDAT: data path direct access testing. ITC 2001: 188-195
1990 – 1999
- 1995
- [j1]Kee Sup Kim, Charles R. Kime:
Partial scan flip-flop selection by use of empirical testability. J. Electron. Test. 7(1-2): 47-59 (1995) - 1994
- [c3]Kee Sup Kim, Len Schultz:
Multi-Frequency, Multi-Phase Scan Chain. ITC 1994: 323-330 - 1993
- [c2]Kee Sup Kim, Charles R. Kime:
Partial Scan Using Reverse Direction Empirical Testability. ITC 1993: 498-506 - 1990
- [c1]Kee Sup Kim, Charles R. Kime:
Partial Scan by Use of Empirical Testability. ICCAD 1990: 314-317
Coauthor Index
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