Shichang Zou

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Mengying Zhang

> Home > Persons > Shichang Zou

Publications

2019
[j27]
- view
  - electronic edition via DOI (open access)
  - details & citations
  authority control:
- export record
  dblp key:
  - journals/ieiceee/XieZZBHZZ19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ieiceee/XieZZBHZZ19
Xin Xie, Huilong Zhu, Mengying Zhang, Dawei Bi, Zhiyuan Hu, Zhengxuan Zhang, Shichang Zou:
Radiation-enhanced channel length modulation induced by trapped charges in buried oxide layer. IEICE Electron. Express 16(21): 20190454 (2019)
2018
[j24]
- view
  - electronic edition via DOI (open access)
  - details & citations
  authority control:
- export record
  dblp key:
  - journals/ieiceee/LinXLZDZLXJZZZ18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ieiceee/LinXLZDZLXJZZZ18
Dianpeng Lin, Yiran Xu, Xiaonian Liu, Wenyi Zhu, Lihua Dai, Mengying Zhang, Xiaoyun Li, Xin Xie, Jianwei Jiang, Huilong Zhu, Zhengxuan Zhang, Shichang Zou:
A novel highly reliable and low-power radiation hardened SRAM bit-cell design. IEICE Electron. Express 15(3): 20171129 (2018)
2017
[j14]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/SongHZLDZZ17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/SongHZLDZZ17
Lei Song, Zhiyuan Hu, Mengying Zhang, Xiaonian Liu, Lihua Dai, Zhengxuan Zhang, Shichang Zou:
Influences of silicon-rich shallow trench isolation on total ionizing dose hardening and gate oxide integrity in a 130 nm partially depleted SOI CMOS technology. Microelectron. Reliab. 74: 1-8 (2017)
[j13]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/DaiLZZHBZZ17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/DaiLZZHBZZ17
Lihua Dai, Xiaonian Liu, Mengying Zhang, Leqing Zhang, Zhiyuan Hu, Dawei Bi, Zhengxuan Zhang, Shichang Zou:
Degradation induced by TID radiation and hot-carrier stress in 130-nm short channel PDSOI NMOSFETs. Microelectron. Reliab. 74: 74-80 (2017)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.