Foundries, EDA vendors, and designers: who shoulders the blame when a design doesn't work in the nano-scale and wireless era? - Jamil Kawa; Yuhua Cheng; Hiroshi Iwai; Richard Goering; Michael Campbell; Raul Camposano; Jon Fields; Patrick Lin; Steve Lloyd; Joseph Sawicki; Ed Wan (Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, CICC 2005, DoubleTree Hotel, San Jose, California, USA, September 18-21, 2005, 2005)

Keynote Address - Jon Fields (21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA, 2003)