Embedded Deterministic Test Points - Cesar Acero; Derek Feltham; Yingdi Liu; Elham K. Moghaddam; Nilanjan Mukherjee; Marek Patyra; Janusz Rajski; Sudhakar M. Reddy; Jerzy Tyszer; Justyna Zawada (IEEE Trans. Very Large Scale Integr. Syst., 2017)

On New Test Points for Compact Cell-Aware Tests - Cesar Acero; Derek Feltham; Marek Patyra; Friedrich Hapke; Elham K. Moghaddam; Nilanjan Mukherjee; Vidya Neerkundar; Janusz Rajski; Jerzy Tyszer; Justyna Zawada (IEEE Des. Test, 2016)

Embedded deterministic test points for compact cell-aware tests - Cesar Acero; Derek Feltham; Friedrich Hapke; Elham K. Moghaddam; Nilanjan Mukherjee; Vidya Neerkundar; Marek Patyra; Janusz Rajski; Jerzy Tyszer; Justyna Zawada (2015 IEEE International Test Conference, ITC 2015, Anaheim, CA, USA, October 6-8, 2015, 2015)

DPDAT: data path direct access testing - Kee Sup Kim; Rathish Jayabharathi; Craig Carstens; Praveen Vishakantaiah; Derek Feltham; Adrian Carbine (Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001, 2001)

Pentium Pro Processor Design for Test and Debug - Adrian Carbine; Derek Feltham (IEEE Des. Test Comput., 1998)

Pentium\(^®\) Pro Processor Design for Test and Debug - Adrian Carbine; Derek Feltham (Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997, 1997)