Electrical characterization of HfO\(_2\) films obtained by UV assisted injection MOCVD - J. M. Decams; H. Guillon; Carmen Jiménez; M. Audier; J. P. Sénateur; C. Dubourdieu; O. Cadix; Barry J. O'Sullivan; Mircea Modreanu; Paul K. Hurley (Microelectron. Reliab., 2005)

Characterization of crystalline MOCVD SrTiO\(_3\) films on SiO\(_2\)/Si(100) - A. Sibai; S. Lhostis; Yoann Rozier; O. Salicio; S. Amtablian; C. Dubois; J. Legrand; J. P. Sénateur; M. Audier; L. Hubert-Pfalzgraff (Microelectron. Reliab., 2005)