A physical approach on SCOBIC investigation in VLSI - Thomas Beauchêne; Dean Lewis; Felix Beaudoin; Vincent Pouget; Philippe Perdu; Pascal Fouillat; Yves Danto (Microelectron. Reliab., 2003)

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization - Thomas Beauchêne; Dean Lewis; Felix Beaudoin; Vincent Pouget; Romain Desplats; Pascal Fouillat; Philippe Perdu; Marise Bafleur; David Trémouilles (Microelectron. Reliab., 2003)

Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS) - Thomas Beauchêne; David Trémouilles; Dean Lewis; Philippe Perdu; Pascal Fouillat (Microelectron. Reliab., 2003)

Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased - Felix Beaudoin; Gérald Haller; Philippe Perdu; Romain Desplats; Thomas Beauchêne; Dean Lewis (Microelectron. Reliab., 2002)

Front Side and Backside OBIT Mappings applied to Single Event Transient Testing - Dean Lewis; Vincent Pouget; Thomas Beauchêne; Hervé Lapuyade; Pascal Fouillat; André Touboul; Felix Beaudoin; Philippe Perdu (Microelectron. Reliab., 2001)