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Karthik Keni Yerriswamy

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2023
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Shayesteh Masoumian, Roel Maes, Rui Wang, Karthik Keni Yerriswamy, Geert Jan Schrijen, Said Hamdioui, Mottaqiallah Taouil:
Modeling and Analysis of SRAM PUF Bias Patterns in 14nm and 7nm FinFET Technology Nodes. VLSI-SoC 2023: 1-6

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