default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDBrady Benware
Person information
Refine list
refinements active!
zoomed in on ?? of ?? records
view refined list in
export refined list as
2010 – 2019
- 2018
[c30]Naixing Wang, Irith Pomeranz, Brady Benware, M. Enamul Amyeen, Srikanth Venkataraman:
Improving the Resolution of Multiple Defect Diagnosis by Removing and Selecting Tests. DFT 2018: 1-6- 2017
- [c29]Wu-Tung Cheng, Randy Klingenberg, Brady Benware, Wu Yang, Manish Sharma, Geir Eide, Yue Tian, Sudhakar M. Reddy, Yan Pan, Sherwin Fernandes, Atul Chittora:
Automatic Identification of Yield Limiting Layout Patterns Using Root Cause Deconvolution on Volume Scan Diagnosis Data. ATS 2017: 219-224 - [c28]Yu Huang, Brady Benware, Randy Klingenberg, Huaxing Tang, Jayant Dsouza, Wu-Tung Cheng:
Scan Chain Diagnosis Based on Unsupervised Machine Learning. ATS 2017: 225-230 - 2015
- [c27]Huaxing Tang, Ting-Pu Tai, Wu-Tung Cheng, Brady Benware, Friedrich Hapke:
Diagnosing timing related cell internal defects for FinFET technology. VLSI-DAT 2015: 1-4 - 2014
- [c26]Huaxing Tang, Brady Benware, Michael Reese, Joseph Caroselli, Thomas Herrmann, Friedrich Hapke, Robert Tao, Wu-Tung Cheng, Manish Sharma:
Diagnosing Cell Internal Defects Using Analog Simulation-Based Fault Models. ATS 2014: 318-323 - [c25]Yen-Tzu Lin, Brady Benware, Brian Stine, Azeez Bhavnagarwala:
Innovative practices session 2C: Advanced in yield learning. VTS 2014: 1 - 2013
- [c24]Yu Huang, Xiaoxin Fan, Huaxing Tang, Manish Sharma, Wu-Tung Cheng, Brady Benware, Sudhakar M. Reddy:
Distributed dynamic partitioning based diagnosis of scan chain. VTS 2013: 1-6 - 2012
- [j6]Brady Benware, Chris Schuermyer, Manish Sharma, Thomas Herrmann:
Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results. IEEE Des. Test Comput. 29(1): 8-18 (2012) - [c23]Xiaoxin Fan, Huaxing Tang, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Brady Benware:
Improved volume diagnosis throughput using dynamic design partitioning. ITC 2012: 1-10 - 2011
- [j5]Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer:
Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs. J. Electron. Test. 27(5): 599-609 (2011) - [c22]Xiaoxin Fan, Huaxing Tang, Sudhakar M. Reddy, Wu-Tung Cheng, Brady Benware:
On Using Design Partitioning to Reduce Diagnosis Memory Footprint. Asian Test Symposium 2011: 219-225 - [c21]Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer:
Diagnosis of Failing Scan Cells through Orthogonal Response Compaction. ETS 2011: 1-6 - [c20]Manish Sharma, Avijit Dutta, Wu-Tung Cheng, Brady Benware, Mark Kassab:
A novel Test Access Mechanism for failure diagnosis of multiple isolated identical cores. ITC 2011: 1-9 - 2010
- [j4]Manish Sharma, Chris Schuermyer, Brady Benware:
Determination of Dominant-Yield-Loss Mechanism with Volume Diagnosis. IEEE Des. Test Comput. 27(3): 54-61 (2010) - [c19]Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer:
Diagnosis of failing scan cells through orthogonal response compaction. ETS 2010: 221-226 - [c18]Yu Huang, Brady Benware, Wu-Tung Cheng, Ting-Pu Tai, Feng-Ming Kuo, Yuan-Shih Chen:
Case study of scan chain diagnosis and PFA on a low yield wafer. ITC 2010: 818
2000 – 2009
- 2009
- [c17]Ritesh P. Turakhia, Mark Ward, Sandeep Kumar Goel, Brady Benware:
Bridging DFM Analysis and Volume Diagnostics for Yield Learning - A Case Study. VTS 2009: 167-172 - 2008
- [c16]Wu-Tung Cheng, Brady Benware, Ruifeng Guo
, Kun-Han Tsai, Takeo Kobayashi, Kazuyuki Maruo, Michinobu Nakao, Yoshiaki Fukui, Hideyuki Otake:
Enhancing Transition Fault Model for Delay Defect Diagnosis. ATS 2008: 179-184 - [c15]Manish Sharma, Brady Benware, Lei Ling, David Abercrombie, Lincoln Lee, Martin Keim, Huaxing Tang, Wu-Tung Cheng, Ting-Pu Tai, Yi-Jung Chang, Reinhart Lin, Albert Mann:
Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data. ITC 2008: 1-9 - 2007
- [c14]Huaxing Tang, Manish Sharma, Janusz Rajski, Martin Keim, Brady Benware:
Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement. ETS 2007: 145-150 - [c13]Chris Schuermyer, Jewel Pangilinan, Jay Jahangiri, Martin Keim, Janusz Rajski, Brady Benware:
Silicon Evaluation of Static Alternative Fault Models. VTS 2007: 265-270 - 2006
- [j3]Ritesh P. Turakhia, W. Robert Daasch, Joel Lurkins, Brady Benware:
Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers. IEEE Des. Test Comput. 23(2): 100-109 (2006) - [j2]Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R. D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer:
Extracting Defect Density and Size Distributions from Product ICs. IEEE Des. Test Comput. 23(5): 390-400 (2006) - [c12]Martin Keim, Nagesh Tamarapalli, Huaxing Tang, Manish Sharma, Janusz Rajski, Chris Schuermyer, Brady Benware:
A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis. ITC 2006: 1-10 - 2005
- [c11]Joel Lurkins, DeAnna Hill, Brady Benware:
Case study: effectiveness of high-speed scan based feed forward voltage testing in reducing DPPM on a high volume ASIC. ITC 2005: 7 - [c10]Chris Schuermyer, Kevin Cota, Robert Madge, Brady Benware:
Identification of systematic yield limiters in complex ASICS through volume structural test fail data visualization and analysis. ITC 2005: 9 - [c9]Robert Madge, Brady Benware, Mark Ward, W. Robert Daasch:
The value of statistical testing for quality, yield and test cost improvement. ITC 2005: 10 - [c8]Ritesh P. Turakhia, Brady Benware, Robert Madge, Thaddeus T. Shannon, W. Robert Daasch:
Defect Screening Using Independent Component Analysis on I_DDQ. VTS 2005: 427-432 - 2004
- [c7]Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler:
In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. ITC 2004: 203-212 - [c6]Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski:
Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. ITC 2004: 1285-1294 - [c5]Brady Benware:
Achieving Sub 100 DPPM Defect Levels on VDSM and Nanometer ASICs. ITC 2004: 1418 - [c4]Ethan Long, W. Robert Daasch, Robert Madge, Brady Benware:
Detection of Temperature Sensitive Defects Using ZTC. VTS 2004: 185-192 - 2003
- [j1]Robert Madge, Brady Benware, W. Robert Daasch:
Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs. IEEE Des. Test Comput. 20(5): 46-53 (2003) - [c3]Chris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning:
Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ. ITC 2003: 565-573 - [c2]Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski:
Impact of Multiple-Detect Test Patterns on Product Quality. ITC 2003: 1031-1040 - [c1]Brady Benware, Robert Madge, Cam Lu, W. Robert Daasch:
Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs. VTS 2003: 39-46
Coauthor Index
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
Unpaywalled article links
Add open access links from 
to the list of external document links (if available).
Privacy notice: By enabling the option above, your browser will contact the API of unpaywall.org to load hyperlinks to open access articles. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Unpaywall privacy policy.
Archived links via Wayback Machine
For web page which are no longer available, try to retrieve content from the 
of the Internet Archive (if available).
Privacy notice: By enabling the option above, your browser will contact the API of archive.org to check for archived content of web pages that are no longer available. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Internet Archive privacy policy.
Reference lists
Add a list of references from 
, 
, and 
to record detail pages.
load references from crossref.org and opencitations.net
Privacy notice: By enabling the option above, your browser will contact the APIs of crossref.org, opencitations.net, and semanticscholar.org to load article reference information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the Crossref privacy policy and the OpenCitations privacy policy, as well as the AI2 Privacy Policy covering Semantic Scholar.
Citation data
Add a list of citing articles from and to record detail pages.
load citations from opencitations.net
Privacy notice: By enabling the option above, your browser will contact the API of opencitations.net and semanticscholar.org to load citation information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the OpenCitations privacy policy as well as the AI2 Privacy Policy covering Semantic Scholar.
OpenAlex data
Load additional information about publications from 
.
Privacy notice: By enabling the option above, your browser will contact the API of openalex.org to load additional information. Although we do not have any reason to believe that your call will be tracked, we do not have any control over how the remote server uses your data. So please proceed with care and consider checking the information given by OpenAlex.
last updated on 2024-08-05 20:20 CEST by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
