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BibTeX records: Ping-Yi Hsieh
@inproceedings{DBLP:conf/ofc/HsiehTOASPSYKCW25, author = {Ping{-}Yi Hsieh and Artemisia Tsiara and Barry J. O'Sullivan and Sara El Akel and Huseyin Sar and Debi Prasad Panda and Peter Swekis and Didit Yudistira and Bernardette Kunert and Joris Van Campenhout and Ingrid De Wolf}, title = {Lifetime Model for Enabling Reliable InGaAs/GaAs Nano-Ridge Lasers Monolithically Integrated on 300 mm Silicon}, booktitle = {Optical Fiber Communications Conference and Exhibition, {OFC} 2025, San Francisco, CA, USA, March 30 - April 3, 2025}, pages = {1--3}, publisher = {{IEEE}}, year = {2025}, url = {https://ieeexplore.ieee.org/document/11047176}, timestamp = {Mon, 21 Jul 2025 09:42:58 +0200}, biburl = {https://dblp.org/rec/conf/ofc/HsiehTOASPSYKCW25.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/HsiehDTOYKCW24, author = {Ping{-}Yi Hsieh and Ameni Ben Driss and Artemisia Tsiara and Barry J. O'Sullivan and Didit Yudistira and Bernardette Kunert and Joris Van Campenhout and Ingrid De Wolf}, title = {Modeling Dark Current Degradation of Monolithic InGaAs/GaAs-On-Si Nano-Ridge Photodetectors}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2024, Grapevine, TX, USA, April 14-18, 2024}, pages = {2}, publisher = {{IEEE}}, year = {2024}, url = {https://doi.org/10.1109/IRPS48228.2024.10529459}, doi = {10.1109/IRPS48228.2024.10529459}, timestamp = {Mon, 03 Mar 2025 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/irps/HsiehDTOYKCW24.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/HsiehTOYBGKPCW22, author = {Ping{-}Yi Hsieh and Artemisia Tsiara and Barry J. O'Sullivan and Didit Yudistira and Marina Baryshnikova and Guido Groeseneken and Bernardette Kunert and Marianna Pantouvaki and Joris Van Campenhout and Ingrid De Wolf}, title = {Wafer-Level Aging of InGaAs/GaAs Nano-Ridge p-i-n Diodes Monolithically Integrated on Silicon}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas, TX, USA, March 27-31, 2022}, pages = {9}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/IRPS48227.2022.9764597}, doi = {10.1109/IRPS48227.2022.9764597}, timestamp = {Mon, 03 Mar 2025 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/irps/HsiehTOYBGKPCW22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }

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