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Victor Martin Agostinelli Jr.

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1990 – 1999

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1993
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Victor Martin Agostinelli Jr., Gregory Munson Yeric, A. F. Tasch Jr.:
Universal MOSFET hole mobility degradation models for circuit simulation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 12(3): 439-445 (1993)
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C. Patrick Yue, Victor Martin Agostinelli Jr., Gregory Munson Yeric, A. F. Tasch Jr.:
Improved universal MOSFET electron mobility degradation models for circuit simulation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 12(10): 1542-1546 (1993)

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