Recovery of Intrinsic Heterojunction Bipolar Transistors Profiles by Neural Networks. - Caron, Grégoire; Juditsky, Anatoli B.; Guitard, Nicolas; Céli, Didier (2022)

Smart Way to Adjust Schottky Barrier Height in 130 nm BiCMOS Process for sub-THz Applications. - Gidel, Vincent; Gianesello, Frédéric; Chevalier, Pascal; Avenier, Grégory; Guitard, Nicolas; Buczko, Michel; Luxey, Cyril; Ducournau, Guillaume (2020)

Simulation, characterization and implementation of a new SCR-based device with a turn-off capability for EOS-immune ESD power supply clamps in advanced CMOS technology nodes. - Loayza, Jorge; Guitard, Nicolas; Allard, Bruno; Phung, Luong-Viêt; Jacquier, Blaise; Galy, Philippe (Microelectron. Reliab., 2018)

Symmetrical ESD trigger and pull-up using BIMOS transistor in advanced CMOS technology. - Galy, Philippe; Bourgeat, Johan; Jimenez, Jean; Guitard, Nicolas; Dray, Alexandre; Troussier, Ghislain; Jacquier, Blaise; Marin-Cudraz, David (Microelectron. Reliab., 2012)

BIMOS transistor and its applications in ESD protection in advanced CMOS technology. - Galy, Philippe; Jimenez, Jean; Bourgeat, Johan; Dray, A.; Troussier, Ghislain; Heitz, Boris; Guitard, Nicolas; Marin-Cudraz, David; Beckrich-Ros, H. (2012)

Identification of the physical signatures of CDM induced latent defects into a DC-DC converter using low frequency noise measurements. - Gao, Yuan; Guitard, Nicolas; Salamero, Christophe; Bafleur, Marise; Bary, Laurent; Escotte, Laurent; Gueulle, Patrick; Lescouzères, Lionel (Microelectron. Reliab., 2007)

Application of various optical techniques for ESD defect localization. - Essely, Fabien; Darracq, Frédéric; Pouget, Vincent; Remmach, Mustapha; Beaudoin, Felix; Guitard, Nicolas; Bafleur, Marise; Perdu, Philippe; Touboul, André; Lewis, Dean (Microelectron. Reliab., 2006)

Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure. - Guitard, Nicolas; Essely, Fabien; Trémouilles, David; Bafleur, Marise; Nolhier, Nicolas; Perdu, Philippe; Touboul, André; Pouget, Vincent; Lewis, Dean (Microelectron. Reliab., 2005)

Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications. - Guitard, Nicolas; Trémouilles, David; Bafleur, Marise; Escotte, Laurent; Bary, Laurent; Perdu, Philippe; Sarrabayrouse, Gérard; Nolhier, Nicolas; Reyna-Rojas, Roberto (Microelectron. Reliab., 2004)

Study of the ESD defects impact on ICs reliability. - Essely, Fabien; Bestory, Corinne; Guitard, Nicolas; Bafleur, Marise; Wislez, A.; Doche, E.; Perdu, Philippe; Touboul, André; Lewis, Dean (Microelectron. Reliab., 2004)

TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology. - Trémouilles, David; Bertrand, Géraldine; Bafleur, Marise; Beaudoin, Felix; Perdu, Philippe; Guitard, Nicolas; Lescouzères, Lionel (Microelectron. Reliab., 2003)