Recovery of Intrinsic Heterojunction Bipolar Transistors Profiles by Neural Networks - Grégoire Caron; Anatoli B. Juditsky; Nicolas Guitard; Didier Céli (2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, BCICTS 2022, Phoenix, AZ, USA, October 16-19, 2022, 2022)

Smart Way to Adjust Schottky Barrier Height in 130 nm BiCMOS Process for sub-THz Applications - Vincent Gidel; Frédéric Gianesello; Pascal Chevalier; Grégory Avenier; Nicolas Guitard; Michel Buczko; Cyril Luxey; Guillaume Ducournau (2020 IEEE Radio and Wireless Symposium, RWS 2020, San Antonio, TX, USA, January 26-29, 2020, 2020)

Simulation, characterization and implementation of a new SCR-based device with a turn-off capability for EOS-immune ESD power supply clamps in advanced CMOS technology nodes - Jorge Loayza; Nicolas Guitard; Bruno Allard; Luong-Viêt Phung; Blaise Jacquier; Philippe Galy (Microelectron. Reliab., 2018)

Symmetrical ESD trigger and pull-up using BIMOS transistor in advanced CMOS technology - Philippe Galy; Johan Bourgeat; Jean Jimenez; Nicolas Guitard; Alexandre Dray; Ghislain Troussier; Blaise Jacquier; David Marin-Cudraz (Microelectron. Reliab., 2012)

BIMOS transistor and its applications in ESD protection in advanced CMOS technology - Philippe Galy; Jean Jimenez; Johan Bourgeat; A. Dray; Ghislain Troussier; Boris Heitz; Nicolas Guitard; David Marin-Cudraz; H. Beckrich-Ros (IEEE International Conference on IC Design & Technology, ICICDT 2012, Austin, TX, USA, May 30 - June 1, 2012, 2012)

Identification of the physical signatures of CDM induced latent defects into a DC-DC converter using low frequency noise measurements - Yuan Gao; Nicolas Guitard; Christophe Salamero; Marise Bafleur; Laurent Bary; Laurent Escotte; Patrick Gueulle; Lionel Lescouzères (Microelectron. Reliab., 2007)

Application of various optical techniques for ESD defect localization - Fabien Essely; Frédéric Darracq; Vincent Pouget; Mustapha Remmach; Felix Beaudoin; Nicolas Guitard; Marise Bafleur; Philippe Perdu; André Touboul; Dean Lewis (Microelectron. Reliab., 2006)

Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure - Nicolas Guitard; Fabien Essely; David Trémouilles; Marise Bafleur; Nicolas Nolhier; Philippe Perdu; André Touboul; Vincent Pouget; Dean Lewis (Microelectron. Reliab., 2005)

Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications - Nicolas Guitard; David Trémouilles; Marise Bafleur; Laurent Escotte; Laurent Bary; Philippe Perdu; Gérard Sarrabayrouse; Nicolas Nolhier; Roberto Reyna-Rojas (Microelectron. Reliab., 2004)

Study of the ESD defects impact on ICs reliability - Fabien Essely; Corinne Bestory; Nicolas Guitard; Marise Bafleur; A. Wislez; E. Doche; Philippe Perdu; André Touboul; Dean Lewis (Microelectron. Reliab., 2004)

TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology - David Trémouilles; Géraldine Bertrand; Marise Bafleur; Felix Beaudoin; Philippe Perdu; Nicolas Guitard; Lionel Lescouzères (Microelectron. Reliab., 2003)