Impact of Gate Metal Work Function on 1/f Noise in RMG MOSFETs - R. Asanovski; Hiroaki Arimura; J. Ganguly; Pierpaolo Palestri; Alexander Grill; Ben Kaczer; Naoto Horiguchi; Luca Selmi; Jacopo Franco (IEEE International Reliability Physics Symposium, IRPS 2025, Monterey, CA, USA, March 30 - April 3, 2025, 2025)

Investigation of Cryogenic Aging in 28 nm CMOS: Suppression of BTI and HCD in Circuits and SRAM - Javier Diaz-Fortuny; Mahdi Benkhelifa; Alexander Grill; Erik Bury; Robin Degraeve; Ben Kaczer; Hussam Amrouch (IEEE International Reliability Physics Symposium, IRPS 2025, Monterey, CA, USA, March 30 - April 3, 2025, 2025)

Advanced RTN Analysis on 3D NAND Trench Devices Using Physics-Informed Machine Learning Framework - Yusuke Higashi; Anirudh Varanasi; Philippe J. Roussel; Pablo Saraza-Canflanca; J. P. Bastos; Alexander Grill; E. Catapano; R. Asanovski; Jacopo Franco; Ben Kaczer; Adrian Chasin; Devin Verreck; et al. (IEEE International Reliability Physics Symposium, IRPS 2025, Monterey, CA, USA, March 30 - April 3, 2025, 2025)

CV Characterization of Si/SiGe Heterostructures at Cryo Temperatures - F. Stampfl; Clement Godfrin; Stefan Kubicek; S. Baudot; B. Raes; Kristiaan De Greve; Alexander Grill; M. Waltl (IEEE International Reliability Physics Symposium, IRPS 2025, Monterey, CA, USA, March 30 - April 3, 2025, 2025)

Insight into Latchup Risk in 28nm Planar Bulk Technology for Quantum Computing Applications - Kateryna Serbulova; Zi-En Qiu; Shih-Hung Chen; Alexander Grill; Kuo-Hsing Kao; Jo De Boeck; Guido Groeseneken (IEEE International Reliability Physics Symposium, IRPS 2024, Grapevine, TX, USA, April 14-18, 2024, 2024)

Study of Transistor Metrics for Room-Temperature Screening of Single Electron Transistors for Silicon Spin Qubit Applications - Francesco Lorenzelli; Asser Elsayed; Clement Godfrin; Alexander Grill; Stefan Kubicek; Ruoyu Li; Michele Stucchi; Danny Wan; Kristiaan De Greve; Erik Jan Marinissen; Georges G. E. Gielen (IEEE European Test Symposium, ETS 2023, Venezia, Italy, May 22-26, 2023, 2023)

Wafer-Scale Electrical Characterization of Silicon Quantum Dots from Room to Low Temperatures - Francesco Lorenzelli; Asser Elsayed; Clement Godfrin; Alexander Grill; Stefan Kubicek; Ruoyu Li; Michele Stucchi; Danny Wan; Kristiaan De Greve; Erik Jan Marinissen; Georges G. E. Gielen (IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, 2023)

Modelling ultra-fast threshold voltage instabilities in Hf-based ferroelectrics - Barry J. O'Sullivan; Brecht Truijen; Vamsi Putcha; Alexander Grill; Adrian Vaisman Chasin; Geert Van den Bosch; Ben Kaczer; Md Nur K. Alam; Jan Van Houdt (IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022, 2022)

Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors - Stanislav Tyaginov; Alexander Makarov; Al-Moatasem Bellah El-Sayed; Adrian Vaisman Chasin; Erik Bury; Markus Jech; Michiel Vandemaele; Alexander Grill; An De Keersgieter; Mikhail I. Vexler; Geert Eneman; Ben Kaczer (IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022, 2022)

Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors - Alexander Grill; V. John; Jakob Michl; A. Beckers; Erik Bury; Stanislav Tyaginov; Bertrand Parvais; Adrian Vaisman Chasin; Tibor Grasser; Michael Waltl; Ben Kaczer; Bogdan Govoreanu (IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022, 2022)

Significant Enhancement of HCD and TDDB in CMOS FETs by Mechanical Stress - Kookjin Lee; Ben Kaczer; Anastasiia Kruv; Mario Gonzalez; Geert Eneman; Oguzhan O. Okudur; Alexander Grill; Jacopo Franco; Andrea Vici; Robin Degraeve; Ingrid De Wolf (IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022, 2022)

On Superior Hot Carrier Robustness of Dynamically-Doped Field-Effect-Transistors - Stanislav Tyaginov; Aryan Afzalian; Alexander Makarov; Alexander Grill; Michiel Vandemaele; Maksim Cherenev; Mikhail I. Vexler; Geert Hellings; Ben Kaczer (IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022, 2022)

Scalable 1.4 \(μ\)W cryo-CMOS SP4T multiplexer operating at 10 mK for high-fidelity superconducting qubit measurements - Rohith Acharya; Anton Potocnik; Steven Brebels; Alexander Grill; Jeroen Verjauw; Tsvetan Ivanov; Daniel Perez Lozano; Danny Wan; Fahd A. Mohiyaddin; Jacques Van Damme; A. M. Vadiraj; Massimo Mongillo; et al. (IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), Honolulu, HI, USA, June 12-17, 2022, 2022)

Solid state qubits: how learning from CMOS fabrication can speed-up progress in Quantum Computing - Iuliana P. Radu; Roy Li; Anton Potocnik; Tsvetan Ivanov; Danny Wan; Stefan Kubicek; Nard I. Dumoulin Stuyck; Jeroen Verjauw; Julien Jussot; Yann Canvel; Clement Godfrin; Massimo Mongillo; et al. (2021 Symposium on VLSI Circuits, Kyoto, Japan, June 13-19, 2021, 2021)

Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures - Alexander Grill; Erik Bury; Jakob Michl; Stanislav Tyaginov; Dimitri Linten; Tibor Grasser; Bertrand Parvais; Ben Kaczer; Michael Waltl; Iuliana P. Radu (2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020, 2020)

On the impact of mechanical stress on gate oxide trapping - Anastasiia Kruv; Ben Kaczer; Alexander Grill; Mario Gonzalez; Jacopo Franco; Dimitri Linten; Wolfgang Goes; Tibor Grasser; Ingrid De Wolf (2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020, 2020)

Quantum Mechanical Charge Trap Modeling to Explain BTI at Cryogenic Temperatures - Jakob Michl; Alexander Grill; Dieter Claes; Gerhard Rzepa; Ben Kaczer; Dimitri Linten; Iuliana P. Radu; Tibor Grasser; Michael Waltl (2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020, 2020)

A Compact Physics Analytical Model for Hot-Carrier Degradation - Stanislav Tyaginov; Alexander Grill; Michiel Vandemaele; Tibor Grasser; Geert Hellings; Alexander Makarov; Markus Jech; Dimitri Linten; Ben Kaczer (2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020, 2020)

Modeling the Effect of Random Dopants on Hot-Carrier Degradation in FinFETs - Alexander Makarov; Ben Kaczer; Philippe Roussel; Adrian Vaisman Chasin; Alexander Grill; Michiel Vandemaele; Geert Hellings; Al-Moatasem El-Sayed; Tibor Grasser; Dimitri Linten; Stanislav Tyaginov (IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019, 2019)