Low distortion sine wave generator with simple harmonics cancellation circuit and filter for analog device testing - Shogo Katayama; Takayuki Nakatani; Daisuke Iimori; Misaki Takagi; Yujie Zhao; Anna Kuwana; Keno Sato; Takashi Ishida; Toshiyuki Okamoto; Tamotsu Ichikawa; Kentaroh Katoh; Kazumi Hatayama; et al. (IEICE Electron. Express, 2023)

Low Distortion Sinusoidal Signal Generator with Harmonics Cancellation Using Two Types of Digital Predistortion - Keno Sato; Takayuki Nakatani; Takashi Ishida; Toshiyuki Okamoto; Tamotsu Ichikawa; Shogo Katayama; Daisuke Iimori; Misaki Takagi; Yujie Zhao; Shuhei Yamamoto; Anna Kuwana; Kentaroh Katoh; et al. (IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023, 2023)

A Physically Unclonable Function Using Time-to-Digital Converter with Linearity Self-Calibration and its FPGA Implementation - Kentaroh Katoh; Shuhei Yamamoto; Zheming Zhao; Yujie Zhao; Shogo Katayama; Anna Kuwana; Takayuki Nakatani; Kazumi Hatayama; Haruo Kobayashi; Keno Sato; Takashi Ishida; Toshiyuki Okamoto; et al. (IEEE International Test Conference in Asia, ITC-Asia 2023, Matsue, Japan, September 12-14, 2023, 2023)

Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies - Yujie Zhao; Kentaroh Katoh; Anna Kuwana; Shogo Katayama; Jianglin Wei; Haruo Kobayashi; Takayuki Nakatani; Kazumi Hatayama; Keno Sato; Takashi Ishida; Toshiyuki Okamoto; Tamotsu Ichikawa (J. Electron. Test., 2022)

High Precision Voltage Measurement System Utilizing Low-End ATE Resource and BOST - Keno Sato; Takayuki Nakatani; Shogo Katayama; Daisuke Iimori; Gaku Ogihara; Takashi Ishida; Toshiyuki Okamoto; Tamotsu Ichikawa; Yujie Zhao; Kentaroh Katoh; Anna Kuwana; Kazumi Hatayama; et al. (IEEE 31st Asian Test Symposium, ATS 2022, Taichung City, Taiwan, November 21-24, 2022, 2022)

Innovative Practices Track: Innovative Analog Circuit Testing Technologies - Chris Mangelsdorf; Manasa Madhvaraj; Salvador Mir; Manuel J. Barragán; Daisuke Iimori; Takayuki Nakatani; Shogo Katayama; Gaku Ogihara; Yujie Zhao; Jianglin Wei; Anna Kuwana; Kentaroh Katoh; et al. (40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022, 2022)

High Precision Measurement of Sub-Nano Ampere Current in ATE Environment - Keno Sato; Takayuki Nakatani; Takashi Ishida; Toshiyuki Okamoto; Tamotsu Ichikawa; Shogo Katayama; Gaku Ogihara; Daisuke Iimori; Yujie Zhao; Jianglin Wei; Anna Kuwana; Kazumi Hatayama; et al. (30th IEEE Asian Test Symposium, ATS 2021, Matsuyama, Ehime, Japan, November 22-25, 2021, 2021)

Evaluation of High-Precision Nano-Ampere Current Measurement Method for Mass Production - Gaku Ogihara; Takayuki Nakatani; Daisuke Iimori; Shogo Katayama; Anna Kuwana; Keno Sato; Takashi Ishida; Toshiyuki Okamoto; Tamotsu Ichikawa; Yujie Zhao; Jianglin Wei; Kazumi Hatayama; et al. (28th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2021, Dubai, United Arab Emirates, November 28 - Dec. 1, 2021, 2021)

Metallic Ratio Equivalent-Time Sampling: A Highly Efficient Waveform Acquisition Method - Shuhei Yamamoto; Yuto Sasaki; Yujie Zhao; Jianglin Wei; Anna Kuwana; Keno Sato; Takashi Ishida; Toshiyuki Okamoto; Tamotsu Ichikawa; Takayuki Nakatani; Minh Tri Tran; Shogo Katayama; et al. (27th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2021, Torino, Italy, June 28-30, 2021, 2021)

Revisit to Accurate ADC Testing with Incoherent Sampling Using Proper Sinusoidal Signal and Sampling Frequencies - Keno Sato; Takashi Ishida; Toshiyuki Okamoto; Tamotsu Ichikawa; Jianglin Wei; Takayuki Nakatani; Yujie Zhao; Shogo Katayama; Shuhei Yamamoto; Anna Kuwana; Kazumi Hatayama; Haruo Kobayashi (IEEE International Test Conference, ITC 2021, Anaheim, CA, USA, October 10-15, 2021, 2021)

Summing Node and False Summing Node Methods: Accurate Operational Amplifier AC Characteristics Testing without Audio Analyzer - Daisuke Iimori; Takayuki Nakatani; Shogo Katayama; Gaku Ogihara; Akemi Hatta; Anna Kuwana; Keno Sato; Takashi Ishida; Toshiyuki Okamoto; Tamotsu Ichikawa; Jianglin Wei; Yujie Zhao; et al. (IEEE International Test Conference, ITC 2021, Anaheim, CA, USA, October 10-15, 2021, 2021)

Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing of Multiple Operational Amplifiers - Gaku Ogihara; Takayuki Nakatani; Akemi Hatta; Keno Sato; Takashi Ishida; Toshiyuki Okamoto; Tamotsu Ichikawa; Anna Kuwana; Riho Aoki; Shogo Katayama; Jianglin Wei; Yujie Zhao; et al. (29th IEEE Asian Test Symposium, ATS 2020, Penang, Malaysia, November 23-26, 2020, 2020)

Accurate Testing of Precision Voltage Reference by DC-AC Conversion - Keno Sato; Takayuki Nakatani; Takashi Ishida; Toshiyuki Okamoto; Tamotsu Ichikawa; Anna Kuwana; Kazumi Hatayama; Haruo Kobayashi (29th IEEE Asian Test Symposium, ATS 2020, Penang, Malaysia, November 23-26, 2020, 2020)

Evaluation of Null Method for Operational Amplifier Short-Time Testing - Riho Aoki; Keno Sato; Takashi Ishida; Toshiyuki Okamoto; Tamotsu Ichikawa; Shogo Katayama; Yuto Sasaki; Kosuke Machida; Takayuki Nakatani; Jianlong Wang; Anna Kuwana; Kazumi Hatayama; et al. (13th IEEE International Conference on ASIC, ASICON 2019, Chongqing, China, October 29 - November 1, 2019, 2019)

High-Resolution Low-Sampling-Rate \(Δ\)\(\) ADC Linearity Short-Time Testing Algorithm - Jiang-Lin Wei; Takashi Ishida; Toshiyuki Okamoto; Tamotsu Ichikawa; Nene Kushita; Takahiro Arai; Lei Sha; Anna Kuwana; Haruo Kobayashi; Takayuki Nakatani; Kazumi Hatayama; Keno Sato (13th IEEE International Conference on ASIC, ASICON 2019, Chongqing, China, October 29 - November 1, 2019, 2019)

Accurate and Fast Testing Technique of Operational Amplifier DC Offset Voltage in \(μ\)V-Order by DC-AC Conversion - Yuto Sasaki; Kosuke Machida; Riho Aoki; Shogo Katayama; Takayuki Nakatani; Jianlong Wang; Keno Sato; Takashi Ishida; Toshiyuki Okamoto; Tamotsu Ichikawa; Anna Kuwana; Kazumi Hatayama; et al. (IEEE International Test Conference in Asia, ITC-Asia 2019, Tokyo, Japan, September 3-5, 2019, 2019)

Innovative Test Practices in Japan - Yusuke Asada; Takahiko Shimizu; Yuji Gendai; Keno Sato; Takashi Ishida; Toshiyuki Okamoto; Tamotsu Ichikawa; Jiang-Lin Wei; Nene Kushita; Hirotaka Arai; Anna Kuwana; Takayuki Nakatani; et al. (37th IEEE VLSI Test Symposium, VTS 2019, Monterey, CA, USA, April 23-25, 2019, 2019)

A stable high-order delta-sigma modulator with an FIR spectrum distributor - Toshiyuki Okamoto; Yuichi Maruyama; Akira Yukawa (IEEE J. Solid State Circuits, 1993)