Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution - Simon Van Beek; Siddharth Rao; Shreya Kundu; Woojin Kim; Barry J. O'Sullivan; Stefan Cosemans; Farrukh Yasin; Robert Carpenter; Sebastien Couet; Shamin H. Sharifi; Nico Jossart; Davide Crotti; et al. (IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021, 2021)

Understanding and empirical fitting the breakdown of MgO in end-of-line annealed MTJs - Simon Van Beek; Barry J. O'Sullivan; Sebastien Couet; Davide Crotti; Dimitri Linten; Gouri Sankar Kar (2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020, 2020)

Process, Circuit and System Co-optimization of Wafer Level Co-Integrated FinFET with Vertical Nanosheet Selector for STT-MRAM Applications - Trong Huynh Bao; Anabela Veloso; Sushil Sakhare; Philippe Matagne; Julien Ryckaert; Manu Perumkunnil; Davide Crotti; Farrukh Yasin; Alessio Spessot; Arnaud Furnémont; Gouri Sankar Kar; Anda Mocuta (Proceedings of the 56th Annual Design Automation Conference 2019, DAC 2019, Las Vegas, NV, USA, June 02-06, 2019, 2019)