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ORCIDSho Endo
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- affiliation: Tohoku University, Sendai, Japan
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2010 – 2019
- 2015
[j6]Sho Endo, Naofumi Homma, Yu-ichi Hayashi, Junko Takahashi, Hitoshi Fuji, Takafumi Aoki:
An Adaptive Multiple-Fault Injection Attack on Microcontrollers and a Countermeasure. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 98-A(1): 171-181 (2015)- [j5]Hajime Uno, Sho Endo, Naofumi Homma, Yu-ichi Hayashi, Takafumi Aoki:
Electromagnetic Analysis against Public-Key Cryptographic Software on Embedded OS. IEICE Trans. Commun. 98-B(7): 1242-1249 (2015) - [j4]Sho Endo, Yang Li, Naofumi Homma, Kazuo Sakiyama, Kazuo Ohta, Daisuke Fujimoto, Makoto Nagata
, Toshihiro Katashita, Jean-Luc Danger, Takafumi Aoki:
A Silicon-Level Countermeasure Against Fault Sensitivity Analysis and Its Evaluation. IEEE Trans. Very Large Scale Integr. Syst. 23(8): 1429-1438 (2015) - 2014
- [c3]Sho Endo, Naofumi Homma, Yu-ichi Hayashi, Junko Takahashi, Hitoshi Fuji, Takafumi Aoki:
A Multiple-Fault Injection Attack by Adaptive Timing Control Under Black-Box Conditions and a Countermeasure. COSADE 2014: 214-228 - 2013
- [c2]Yang Li, Sho Endo, Nicolas Debande, Naofumi Homma, Takafumi Aoki, Thanh-Ha Le, Jean-Luc Danger, Kazuo Ohta, Kazuo Sakiyama:
Exploring the Relations between Fault Sensitivity and Power Consumption. COSADE 2013: 137-153 - 2012
- [j3]Sho Endo, Takeshi Sugawara, Naofumi Homma, Takafumi Aoki, Akashi Satoh:
A Configurable On-Chip Glitchy-Clock Generator for Fault Injection Experiments. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 95-A(1): 263-266 (2012) - [c1]Sho Endo, Yang Li, Naofumi Homma, Kazuo Sakiyama, Kazuo Ohta, Takafumi Aoki:
An Efficient Countermeasure against Fault Sensitivity Analysis Using Configurable Delay Blocks. FDTC 2012: 95-102 - 2011
- [j2]Sho Endo, Jun Sonoda, Motoyuki Sato, Takafumi Aoki:
Acceleration of FDTD Method Using a Novel Algorithm on the Cell B.E. IEICE Trans. Inf. Syst. 94-D(12): 2338-2344 (2011) - [j1]Sho Endo, Takeshi Sugawara, Naofumi Homma, Takafumi Aoki, Akashi Satoh:
An on-chip glitchy-clock generator for testing fault injection attacks. J. Cryptogr. Eng. 1(4): 265-270 (2011)
Coauthor Index
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