BibTeX records: Thais Luana Vidal de Negreiros da Silva

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@inproceedings{DBLP:conf/dcis/SilvaLP18,
  author       = {Thais Luana Vidal de Negreiros da Silva and
                  Guo{-}Neng Lu and
                  Patrick Pittet},
  title        = {Breakdown Voltage Shift of {CMOS} Buried Quad Junction {(BQJ)} Detector},
  booktitle    = {Conference on Design of Circuits and Integrated Systems, {DCIS} 2018,
                  Lyon, France, November 14-16, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/DCIS.2018.8681493},
  doi          = {10.1109/DCIS.2018.8681493},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/dcis/SilvaLP18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}