BibTeX records: Nico Jossart

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@inproceedings{DBLP:conf/imw2/KimPJYWCR24,
  author       = {W. Kim and
                  Valerio Pica and
                  N. Jossart and
                  Farrukh Yasin and
                  Kurt Wostyn and
                  S. Couet and
                  Sidharth Rao},
  title        = {A novel test and analysis scheme to elucidate tail bit characteristics
                  in {STT-MRAM} arrays},
  booktitle    = {{IEEE} International Memory Workshop, {IMW} 2024, Seoul, Republic
                  of Korea, May 12-15, 2024},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2024},
  url          = {https://doi.org/10.1109/IMW59701.2024.10536950},
  doi          = {10.1109/IMW59701.2024.10536950},
  timestamp    = {Tue, 12 Nov 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/imw2/KimPJYWCR24.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/irps/BeekCFTTJRCC23,
  author       = {Simon Van Beek and
                  Kaiming Cai and
                  Kaiquan Fan and
                  Giacomo Talmelli and
                  Anna Trovato and
                  Nico Jossart and
                  Siddharth Rao and
                  Adrian Vaisman Chasin and
                  Sebastien Couet},
  title        = {{MTJ} degradation in multi-pillar {SOT-MRAM} with selective writing},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
                  CA, USA, March 26-30, 2023},
  pages        = {1--7},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/IRPS48203.2023.10117917},
  doi          = {10.1109/IRPS48203.2023.10117917},
  timestamp    = {Mon, 03 Mar 2025 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/BeekCFTTJRCC23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/irps/BeekCRJCJCK22,
  author       = {Simon Van Beek and
                  Kaiming Cai and
                  Siddharth Rao and
                  Ganesh Jayakumar and
                  Sebastien Couet and
                  Nico Jossart and
                  Adrian Vaisman Chasin and
                  Gouri Sankar Kar},
  title        = {{MTJ} degradation in {SOT-MRAM} by self-heating-induced diffusion},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
                  TX, USA, March 27-31, 2022},
  pages        = {4},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/IRPS48227.2022.9764459},
  doi          = {10.1109/IRPS48227.2022.9764459},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/BeekCRJCJCK22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/imw2/RaoKBKPCYCCOSJS21,
  author       = {Sidharth Rao and
                  Woojin Kim and
                  Simon Van Beek and
                  Shreya Kundu and
                  Manu Perumkunnil and
                  Stefan Cosemans and
                  Farrukh Yasin and
                  Sebastien Couet and
                  Robert Carpenter and
                  Barry J. O'Sullivan and
                  Shamin H. Sharifi and
                  N. Jossart and
                  Laurent Souriau and
                  Ludovic Goux and
                  Dimitri Crotti and
                  Gouri Sankar Kar},
  title        = {{STT-MRAM} array performance improvement through optimization of Ion
                  Beam Etch and {MTJ} for Last-Level Cache application},
  booktitle    = {{IEEE} International Memory Workshop, {IMW} 2021, Dresden, Germany,
                  May 16-19, 2021},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/IMW51353.2021.9439592},
  doi          = {10.1109/IMW51353.2021.9439592},
  timestamp    = {Sun, 06 Oct 2024 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/imw2/RaoKBKPCYCCOSJS21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/irps/BeekRKKOCYCCSJC21,
  author       = {Simon Van Beek and
                  Siddharth Rao and
                  Shreya Kundu and
                  Woojin Kim and
                  Barry J. O'Sullivan and
                  Stefan Cosemans and
                  Farrukh Yasin and
                  Robert Carpenter and
                  Sebastien Couet and
                  Shamin H. Sharifi and
                  Nico Jossart and
                  Davide Crotti and
                  Gouri Sankar Kar},
  title        = {Edge-induced reliability {\&} performance degradation in {STT-MRAM:}
                  an etch engineering solution},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
                  CA, USA, March 21-25, 2021},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/IRPS46558.2021.9405209},
  doi          = {10.1109/IRPS46558.2021.9405209},
  timestamp    = {Sun, 06 Oct 2024 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/BeekRKKOCYCCSJC21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vlsic/GarelloYHCSSSCR19,
  author       = {Kevin Garello and
                  Farrukh Yasin and
                  Hubert Hody and
                  S. Couet and
                  Laurent Souriau and
                  Shamin H. Sharifi and
                  Johan Swerts and
                  Robert Carpenter and
                  Sidharth Rao and
                  Wonsub Kim and
                  J. Wu and
                  K. K. V. Sethu and
                  M. Pak and
                  N. Jossart and
                  D. Crotti and
                  Arnaud Furn{\'{e}}mont and
                  Gouri Sankar Kar},
  title        = {Manufacturable 300mm platform solution for Field-Free Switching {SOT-MRAM}},
  booktitle    = {2019 Symposium on {VLSI} Circuits, Kyoto, Japan, June 9-14, 2019},
  pages        = {194},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.23919/VLSIC.2019.8778100},
  doi          = {10.23919/VLSIC.2019.8778100},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/vlsic/GarelloYHCSSSCR19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/vlsic/GarelloYCSSRBKL18,
  author       = {Kevin Garello and
                  Kevin Garello Yasin and
                  S. Couet and
                  Laurent Souriau and
                  Johan Swerts and
                  Sidharth Rao and
                  Simon Van Beek and
                  Wonsub Kim and
                  Enlong Liu and
                  Shreya Kundu and
                  Diana Tsvetanova and
                  Kris Croes and
                  N. Jossart and
                  E. Grimaldi and
                  M. Baumgartner and
                  D. Crotti and
                  Arnaud Fumemont and
                  Pietro Gambardella and
                  Gouri Sankar Kar},
  title        = {{SOT-MRAM} 300MM Integration for Low Power and Ultrafast Embedded
                  Memories},
  booktitle    = {2018 {IEEE} Symposium on {VLSI} Circuits, Honolulu, HI, USA, June
                  18-22, 2018},
  pages        = {81--82},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/VLSIC.2018.8502269},
  doi          = {10.1109/VLSIC.2018.8502269},
  timestamp    = {Sun, 19 Jan 2025 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsic/GarelloYCSSRBKL18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/corr/abs-1810-10356,
  author       = {Kevin Garello and
                  Farrukh Yasin and
                  S. Couet and
                  Laurent Souriau and
                  Johan Swerts and
                  Sidharth Rao and
                  Simon Van Beek and
                  Wonsub Kim and
                  Enlong Liu and
                  Shreya Kundu and
                  Diana Tsvetanova and
                  N. Jossart and
                  Kris Croes and
                  E. Grimaldi and
                  M. Baumgartner and
                  D. Crotti and
                  Arnaud Furn{\'{e}}mont and
                  Pietro Gambardella and
                  Gouri Sankar Kar},
  title        = {{SOT-MRAM} 300mm integration for low power and ultrafast embedded
                  memories},
  journal      = {CoRR},
  volume       = {abs/1810.10356},
  year         = {2018},
  url          = {http://arxiv.org/abs/1810.10356},
  eprinttype    = {arXiv},
  eprint       = {1810.10356},
  timestamp    = {Wed, 07 Jun 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/corr/abs-1810-10356.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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