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Daniel Kraak
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- affiliation: Delft University of Technology, Netherlands
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2020 – today
- 2022
- [c9]Cemil Cem Gürsoy, Daniel Kraak, Foisal Ahmed, Mottaqiallah Taouil, Maksim Jenihhin, Said Hamdioui:
On BTI Aging Rejuvenation in Memory Address Decoders. LATS 2022: 1-6 - [i1]Cemil Cem Gürsoy, Daniel Kraak, Foisal Ahmed, Mottaqiallah Taouil, Maksim Jenihhin, Said Hamdioui:
On BTI Aging Rejuvenation in Memory Address Decoders. CoRR abs/2212.09356 (2022) - 2020
- [c8]Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor:
Mitigation of Sense Amplifier Degradation Using Skewed Design. DATE 2020: 1614-1617 - [c7]Daniël Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor:
eSRAM Reliability: Why is it still not optimally solved? DTIS 2020: 1-6
2010 – 2019
- 2019
- [j4]Daniel Kraak, Mottaqiallah Taouil, Innocent Agbo, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor:
Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM. IEEE Trans. Very Large Scale Integr. Syst. 27(6): 1308-1321 (2019) - [c6]Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor:
Methodology for Application-Dependent Degradation Analysis of Memory Timing. DATE 2019: 162-167 - [c5]Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor:
Hardware-Based Aging Mitigation Scheme for Memory Address Decoder. ETS 2019: 1-6 - [c4]Daniel H. P. Kraak, Cemil Cem Gürsoy, Innocent O. Agbo, Mottaqiallah Taouil, Maksim Jenihhin, Jaan Raik, Said Hamdioui:
Software-Based Mitigation for Memory Address Decoder Aging. LATS 2019: 1-6 - 2018
- [j3]Innocent Agbo, Mottaqiallah Taouil, Daniel Kraak, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene:
Impact and mitigation of SRAM read path aging. Microelectron. Reliab. 87: 158-167 (2018) - [c3]Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor:
Degradation analysis of high performance 14nm FinFET SRAM. DATE 2018: 201-206 - [c2]Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Francky Catthoor, Abhijit Chatterjee, Adit D. Singh, Hans-Joachim Wunderlich, Naghmeh Karimi:
Device aging: A reliability and security concern. ETS 2018: 1-10 - 2017
- [j2]Innocent Agbo, Mottaqiallah Taouil, Daniel Kraak, Said Hamdioui, Halil Kukner, Pieter Weckx, Praveen Raghavan, Francky Catthoor:
Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier. IEEE Trans. Very Large Scale Integr. Syst. 25(4): 1444-1454 (2017) - [j1]Daniel Kraak, Mottaqiallah Taouil, Innocent Agbo, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor:
Impact and Mitigation of Sense Amplifier Aging Degradation Using Realistic Workloads. IEEE Trans. Very Large Scale Integr. Syst. 25(12): 3464-3472 (2017) - [c1]Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene:
Mitigation of sense amplifier degradation using input switching. DATE 2017: 858-863
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