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Jens Ruffler

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2000 – 2009

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2004
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Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler:
In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost. ITC 2004: 203-212
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Chris Schuermyer, Jens Ruffler, W. Robert Daasch:
Minimum Testing Requirements to Screen Temperature Dependent Defects. ITC 2004: 300-308

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