BibTeX records: Souhir Mhira

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@inproceedings{DBLP:conf/irps/HuardJMJMLZBACB22,
  author       = {Vincent Huard and
                  Francois Jacquet and
                  Souhir Mhira and
                  Lionel Jure and
                  Olivier Montfort and
                  Mathieu Louvat and
                  L. Zaia and
                  F. Bertrand and
                  E. Acacia and
                  O. Caffin and
                  H. Belhadj and
                  O. Durand and
                  Nils Exibard and
                  Vincent Bonnet and
                  A. Charvier and
                  Paolo Bernardi and
                  Riccardo Cantoro},
  title        = {Runtime Test Solution for Adaptive Aging Compensation and Fail Operational
                  Safety mode},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
                  TX, USA, March 27-31, 2022},
  pages        = {8},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/IRPS48227.2022.9764590},
  doi          = {10.1109/IRPS48227.2022.9764590},
  timestamp    = {Mon, 04 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/HuardJMJMLZBACB22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/rws/WaneDTBFDGSLLHM22,
  author       = {Sidina Wane and
                  T. V. Dinh and
                  Q. H. Tran and
                  Damienne Bajon and
                  F. Ferrero and
                  Lionel Duvillaret and
                  Gwena{\"{e}}l Gaborit and
                  Jacques Sombrin and
                  E. de L{\'{e}}dinghen and
                  P. Laban and
                  Vincent Huard and
                  Souhir Mhira and
                  L. Tombakdjian and
                  Philippe Ratajczak and
                  A. Bousseksou},
  title        = {Correlation Technologies for {OTA} Testing of mmWave Mobile Devices
                  Using Energy Metrics},
  booktitle    = {2022 {IEEE} Radio and Wireless Symposium, {RWS} 2022, Las Vegas, NV,
                  USA, January 16-19, 2022},
  pages        = {68--71},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/RWS53089.2022.9719895},
  doi          = {10.1109/RWS53089.2022.9719895},
  timestamp    = {Mon, 13 Nov 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/rws/WaneDTBFDGSLLHM22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/irps/HuardMBLRCB18,
  author       = {Vincent Huard and
                  Souhir Mhira and
                  A. Barclais and
                  X. Lecocq and
                  F. Raugi and
                  M. Cantournet and
                  Alain Bravaix},
  title        = {Managing electrical reliability in consumer systems for improved energy
                  efficiency},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {3},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353561},
  doi          = {10.1109/IRPS.2018.8353561},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/HuardMBLRCB18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/irps/MhiraHAFB18,
  author       = {Souhir Mhira and
                  Vincent Huard and
                  D. Arora and
                  Philippe Flatresse and
                  Alain Bravaix},
  title        = {Resilient automotive products through process, temperature and aging
                  compensation schemes},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {3},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353568},
  doi          = {10.1109/IRPS.2018.8353568},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/MhiraHAFB18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/irps/HuardNAPFMMB18,
  author       = {Vincent Huard and
                  Cheikh Ndiaye and
                  M. Arabi and
                  Narendra Parihar and
                  X. Federspiel and
                  Souhir Mhira and
                  S. Mahapatra and
                  Alain Bravaix},
  title        = {Key parameters driving transistor degradation in advanced strained
                  SiGe channels},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {4--1},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353699},
  doi          = {10.1109/IRPS.2018.8353699},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/HuardNAPFMMB18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/irps/ShahCHMAAKBSA18,
  author       = {Riddhi Jitendrakumar Shah and
                  Florian Cacho and
                  Vincent Huard and
                  Souhir Mhira and
                  D. Arora and
                  Pankaj Agarwal and
                  Shubham Kumar and
                  S. Balaraman and
                  Bijoy Kumar Singh and
                  Lorena Anghel},
  title        = {Investigation of speed sensors accuracy for process and aging compensation},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {5},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353617},
  doi          = {10.1109/IRPS.2018.8353617},
  timestamp    = {Wed, 17 Apr 2024 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/ShahCHMAAKBSA18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/HuardMCB17,
  author       = {Vincent Huard and
                  Souhir Mhira and
                  Florian Cacho and
                  Alain Bravaix},
  title        = {Enabling robust automotive electronic components in advanced {CMOS}
                  nodes},
  journal      = {Microelectron. Reliab.},
  volume       = {76-77},
  pages        = {13--24},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.07.064},
  doi          = {10.1016/J.MICROREL.2017.07.064},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/HuardMCB17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/date/SivadasanNHMMCA17,
  author       = {Ajith Sivadasan and
                  Armelle Notin and
                  Vincent Huard and
                  Etienne Maurin and
                  Souhir Mhira and
                  Florian Cacho and
                  Lorena Anghel},
  editor       = {David Atienza and
                  Giorgio Di Natale},
  title        = {Workload dependent reliability timing analysis flow},
  booktitle    = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
                  {DATE} 2017, Lausanne, Switzerland, March 27-31, 2017},
  pages        = {736--737},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.23919/DATE.2017.7927086},
  doi          = {10.23919/DATE.2017.7927086},
  timestamp    = {Mon, 30 Sep 2024 15:20:52 +0200},
  biburl       = {https://dblp.org/rec/conf/date/SivadasanNHMMCA17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/iolts/MhiraHBCNJPB17,
  author       = {Souhir Mhira and
                  Vincent Huard and
                  Ahmed Benhassain and
                  Florian Cacho and
                  Sylvie Naudet and
                  Abhishek Jain and
                  C. R. Parthasarathy and
                  Alain Bravaix},
  title        = {Dynamic aging compensation and Safety measures in Automotive environment},
  booktitle    = {23rd {IEEE} International Symposium on On-Line Testing and Robust
                  System Design, {IOLTS} 2017, Thessaloniki, Greece, July 3-5, 2017},
  pages        = {106--112},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/IOLTS.2017.8046204},
  doi          = {10.1109/IOLTS.2017.8046204},
  timestamp    = {Fri, 06 Oct 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/MhiraHBCNJPB17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/iolts/CachoBSMHA17,
  author       = {Florian Cacho and
                  Ahmed Benhassain and
                  Riddhi Jitendrakumar Shah and
                  Souhir Mhira and
                  Vincent Huard and
                  Lorena Anghel},
  title        = {Investigation of critical path selection for in-situ monitors insertion},
  booktitle    = {23rd {IEEE} International Symposium on On-Line Testing and Robust
                  System Design, {IOLTS} 2017, Thessaloniki, Greece, July 3-5, 2017},
  pages        = {247--252},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/IOLTS.2017.8046229},
  doi          = {10.1109/IOLTS.2017.8046229},
  timestamp    = {Tue, 12 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/CachoBSMHA17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/MhiraHBCMNJPB17,
  author       = {Souhir Mhira and
                  Vincent Huard and
                  Ahmed Benhassain and
                  Florian Cacho and
                  David Meyer and
                  Sylvie Naudet and
                  Abhishek Jain and
                  C. R. Parthasarathy and
                  Alain Bravaix},
  title        = {Cognitive approach to support dynamic aging compensation},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
                  USA, October 31 - Nov. 2, 2017},
  pages        = {1--7},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/TEST.2017.8242042},
  doi          = {10.1109/TEST.2017.8242042},
  timestamp    = {Fri, 06 Oct 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/MhiraHBCMNJPB17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/BravaixCFNMH16,
  author       = {Alain Bravaix and
                  Florian Cacho and
                  X. Federspiel and
                  Cheikh Ndiaye and
                  Souhir Mhira and
                  Vincent Huard},
  title        = {Potentiality of healing techniques in hot-carrier damaged 28 nm {FDSOI}
                  {CMOS} nodes},
  journal      = {Microelectron. Reliab.},
  volume       = {64},
  pages        = {163--167},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.07.092},
  doi          = {10.1016/J.MICROREL.2016.07.092},
  timestamp    = {Wed, 23 Mar 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BravaixCFNMH16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/iolts/BravaixSCFNMKPH16,
  author       = {Alain Bravaix and
                  M. Saliva and
                  Florian Cacho and
                  X. Federspiel and
                  Cheikh Ndiaye and
                  Souhir Mhira and
                  Edith Kussener and
                  E. Pauly and
                  Vincent Huard},
  title        = {Hot-carrier and {BTI} damage distinction for high performance digital
                  application in 28nm {FDSOI} and 28nm {LP} {CMOS} nodes},
  booktitle    = {22nd {IEEE} International Symposium on On-Line Testing and Robust
                  System Design, {IOLTS} 2016, Sant Feliu de Guixols, Spain, July 4-6,
                  2016},
  pages        = {43--46},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/IOLTS.2016.7604669},
  doi          = {10.1109/IOLTS.2016.7604669},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/BravaixSCFNMKPH16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/iolts/CachoBMSHCKJPA16,
  author       = {Florian Cacho and
                  Ahmed Benhassain and
                  Souhir Mhira and
                  Ajith Sivadasan and
                  Vincent Huard and
                  P. Cathelin and
                  Vincent Knopik and
                  Abhishek Jain and
                  C. R. Parthasarathy and
                  Lorena Anghel},
  title        = {Activity profiling: Review of different solutions to develop reliable
                  and performant design},
  booktitle    = {22nd {IEEE} International Symposium on On-Line Testing and Robust
                  System Design, {IOLTS} 2016, Sant Feliu de Guixols, Spain, July 4-6,
                  2016},
  pages        = {47--50},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/IOLTS.2016.7604670},
  doi          = {10.1109/IOLTS.2016.7604670},
  timestamp    = {Fri, 06 Oct 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/CachoBMSHCKJPA16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ivsw/BenhassainMCHA16,
  author       = {Ahmed Benhassain and
                  Souhir Mhira and
                  Florian Cacho and
                  Vincent Huard and
                  Lorena Anghel},
  title        = {In-situ slack monitors: taking up the challenge of on-die monitoring
                  of variability and reliability},
  booktitle    = {1st {IEEE} International Verification and Security Workshop, {IVSW}
                  2016, Sant Feliu de Guixols, Spain, July 4-6, 2016},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/IVSW.2016.7566606},
  doi          = {10.1109/IVSW.2016.7566606},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/ivsw/BenhassainMCHA16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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