Zbigniew T. Kalbarczyk

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Keun Soo Yim

> Home > Persons > Zbigniew T. Kalbarczyk

Publications

2013
[c78]
- view
  authority control:
- export record
  dblp key:
  - conf/ipps/YimKI13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ipps/YimKI13
Keun Soo Yim, Zbigniew Kalbarczyk, Ravishankar K. Iyer:
Pluggable Watchdog: Transparent Failure Detection for MPI Programs. IPDPS 2013: 489-500
2011
[c67]
- view
  authority control:
- export record
  dblp key:
  - conf/ipps/YimPSKI11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ipps/YimPSKI11
Keun Soo Yim, Cuong Manh Pham, Mushfiq Saleheen, Zbigniew Kalbarczyk, Ravishankar K. Iyer:
Hauberk: Lightweight Silent Data Corruption Error Detector for GPGPU. IPDPS 2011: 287-300
2010
[c64]
- view
  authority control:
- export record
  dblp key:
  - conf/dsn/YimKI10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/dsn/YimKI10
Keun Soo Yim, Zbigniew Kalbarczyk, Ravishankar K. Iyer:
Measurement-based analysis of fault and error sensitivities of dynamic memory. DSN 2010: 431-436
2009
[c56]
- view
  authority control:
- export record
  dblp key:
  - conf/prdc/YimKI09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/prdc/YimKI09
Keun Soo Yim, Zbigniew Kalbarczyk, Ravishankar K. Iyer:
Quantitative Analysis of Long-Latency Failures in System Software. PRDC 2009: 23-30

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.